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Results 1 to 25 of 769

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INTERNAL REFLECTION FROM AN AMPLIFYING LAYER.CALLARY PR; CARNIGLIA CK.1976; J. OPT. SOC. AMER.; U.S.A.; DA. 1976; VOL. 66; NO 8; PP. 775-779; BIBL. 6 REF.Article

UTILISATION D'ONDES EVANESCENTES POUR L'ENREGISTREMENT HOLOGRAPHIQUE D'OBJETS TRIDIMENSIONNELSSYJNOV S KH; MAZAKOVA M YU.1982; Z. NAUCN. PRIKL. FOTOGR. KINEMATOGR.; ISSN 0044-4561; SUN; DA. 1982; VOL. 27; NO 2; PP. 96-99; BIBL. 9 REF.Article

INTERNAL REFLECTION FROM AN EXPONENTIAL AMPLIFYING REGION.CYBULSKI RF JR; CARNIGLIA CK.1977; J. OPT. SOC. AMER.; U.S.A.; DA. 1977; VOL. 67; NO 12; PP. 1620-1627; BIBL. 10 REF.Article

AN ANGULAR SPECTRUM REPRESENTATION APPROACH TO THE GOOS-HAENCHEN SHIFT.MCGUIRK M; CARNIGLIA CK.1977; J. OPT. SOC. AMER.; U.S.A.; DA. 1977; VOL. 67; NO 1; PP. 103-107; BIBL. 14 REF.Article

ON THE PROBLEM OF PHASE JUMPS AT TOTAL INTERNAL REFLECTION OF X-RAYS.BEZIRGANIAN PA; TSERUNIAN MA.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 35; NO 2; PP. K181-K182; BIBL. 3 REF.Article

ETUDE D'UN RESONATEUR OUVERT AVEC PRISME A REFLEXION TOTALE INTERNEVERTIJ AA; POPENKO NA; TARAPOV SI et al.1982; IZV. VYSS. UCEBN. ZAVED., RADIOFIZ.; ISSN 0021-3462; SUN; DA. 1982; VOL. 25; NO 6; PP. 684-687; ABS. ENG; BIBL. 7 REF.Article

COEFFICIENT DE REFLEXION TOTALE INTERNE PERTURBE DE LA LUMIERE PAR UN CONTINUUM ANISOTROPE AVEC UNE COUCHE ANISOTROPE AU VOISINAGE DE LA SURFACEKOSOBUKIN VA.1979; ZH. PRIKL. SPEKTROSK.; BYS; DA. 1979; VOL. 30; NO 3; PP. 521-526; ABS. ENG; BIBL. 11 REF.Article

A TOTAL INTERNAL REFLECTION MODULATOR USING SMALL GLANCING LIGHT ANGLESGAVRILIDIS C; PALMER AW.1978; J. PHYS. D; GBR; DA. 1978; VOL. 11; NO 10; PP. 1441-1444; BIBL. 4 REF.Article

SUR L'ERREUR DES REFRACTOMETRES A ENREGISTREMENT PAR L'OBJECTIF DE LA LIMITE DU CONTRASTE LUMINEUXSHAKARYAN EH S; SHMULEVICH MI.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 1; PP. 56-58; BIBL. 5 REF.Article

TOTAL INTERNAL REFLECTION FLUORESCENT MICROSCOPYAXELFORD D; THOMPSON NL; BURGHARDT TP et al.1983; JOURNAL OF MICROSCOPY (OXFORD); ISSN 0022-2720; GBR; DA. 1983; VOL. 129; NO 1; PP. 19-28; BIBL. 20 REF.Article

IN-LINE DISPERSION PRISMMURTY MVRK; SHUKLA RP.1980; OPT. ENG.; ISSN 0091-3286; USA; DA. 1980; VOL. 19; NO 4; PP. 621-622; BIBL. 2 REF.Article

ENHANCED TOTAL REFLECTION WITH SURFACE PLASMONSPLOTZ GA; SIMON HJ; TUCCIARONE JM et al.1979; J. OPT. SOC. AMER.; USA; DA. 1979; VOL. 69; NO 3; PP. 419-422; BIBL. 14 REF.Article

FORMATION D'UNE IMAGE DE STRUCTURE FINE PAR DES REFLECTEURS A ANGLES, UTILISANT UN PHENOMENE DE REFLEXION TOTALE INTERNEDENISYUK GV; KORNEEV VJ.1982; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1982; NO 9; PP. 1-3; BIBL. 12 REF.Article

POYNTING VECTOR THEORY OF SHIFTS OF LIGHT BEAMS DUE TO TOTAL INTERNAL REFLECTIONASHBY N; MILLER SC.1980; OPTIK; DEU; DA. 1980; VOL. 56; NO 1; PP. 59-74; ABS. GER; BIBL. 17 REF.Article

RESONATEURS DIELECTRIQUES A HAUT RENDEMENTBRAGINSKIJ VB; VYATCHANIN SP.1980; DOKL. AKAD. NAUK SSSR; ISSN 0002-3264; SUN; DA. 1980; VOL. 252; NO 3; PP. 584-585; BIBL. 4 REF.Article

SUR LA REFRACTOMETRIE DES MILIEUX ABSORBANTSSHAKARYAN EH S; SHMULEVICH MI; ABDULLAEVA AG et al.1978; ZAVODSK. LAB.; S.S.S.R.; DA. 1978; VOL. 44; NO 4; PP. 450-452; BIBL. 3 REF.Article

A REFRACTOMETER FOR USE AT LOW TEMPERATURES.SINNOCK AC.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 7; PP. 676-678; BIBL. 12 REF.Article

ELEMENT A REFLEXION TOTALE INTERNE ATTENUEE ACCORDABLE EN FONCTION DE L'ANGLE D'INCIDENCE DES FAISCEAUX LUMINEUX FORTEMENT COLLIMATESMOLOCHNIKOV BI; VASIL'EVA IS; GUBEL NN et al.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 11; PP. 26-28; BIBL. 4 REF.Article

MEASUREMENT OF THE GOSS-HAENCHEN SHIFT AT GRAZING INCIDENCE USING LLOYD'S MIRROR.RHODES GJ; CARNIGLIA CK.1977; J. OPT. SOC. AMER.; U.S.A.; DA. 1977; VOL. 67; NO 5; PP. 679-683; BIBL. 18 REF.Article

Electrokinetic characterization of individual nanoparticles in nanofluidic channelsWYNNE, Thomas M; DIXON, Alexander H; PENNATHUR, Sumita et al.Microfluidics and nanofluidics (Print). 2012, Vol 12, Num 1-4, pp 411-421, issn 1613-4982, 11 p.Article

The study of genomic DNA adsorption and subsequent interactions using total internal reflection ellipsometryNABOK, Alexei; TSARGORODSKAYA, Anna; DAVIS, Frank et al.Biosensors & bioelectronics. 2007, Vol 23, Num 3, pp 377-383, issn 0956-5663, 7 p.Article

A novel nanolayer biosensor principleJENNISSEN, H. P; ZUMBRINK, T.Biosensors & bioelectronics. 2004, Vol 19, Num 9, pp 987-997, issn 0956-5663, 11 p.Article

Backlight unit with double-surface light emission using a single micro-structured lightguide plateKÄLÄNTÄR, Kälil; MATSUMOTO, Shingo; KATOH, Tatsuya et al.Journal of the Society for Information Display. 2004, Vol 12, Num 4, pp 379-387, issn 1071-0922, 9 p.Conference Paper

Slow-light total-internal-reflection switch with bending angle of 30 degFUCHIDA, Ayumi; MATSUTANI, Akihiro; KOYAMA, Fumio et al.Optics letters. 2011, Vol 36, Num 14, pp 2644-2646, issn 0146-9592, 3 p.Article

Temporal delay of a pulse undergoing frustrated total internal reflectionAJOY GHATAK; SWAGATA BANERJEE.Applied optics. 1989, Vol 28, Num 11, pp 1960-1961, issn 0003-6935Article

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