Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("TOTAL REFLECTION")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 1133

  • Page / 46
Export

Selection :

  • and

DEPLACEMENT D'UN RAYON LUMINEUX LORS DE LA REFLEXION SUR DES MILIEUX ISOTROPESFEDOROV FI.1977; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1977; VOL. 27; NO 4; PP. 580-588; BIBL. 13 REF.Article

PRINCIPES DU RAYONNEMENT ET REFLEXION DES ONDES PAR DES MILIEUX AMPLIFICATEURSVINOKUROV GN.1983; OPTIKA I SPEKTROSKOPIJA; ISSN 0030-4034; SUN; DA. 1983; VOL. 54; NO 3; PP. 517-524; BIBL. 18 REF.Article

IMAGE D'UNE FENTE VUE EN REFLEXION TOTALECANALS FRAU D.1980; J. OPT.; FRA; DA. 1980; VOL. 11; NO 4; PP. 219-223; ABS. ENG; BIBL. 4 REF.Article

THE TOTAL REFLECTION OF A SOUND PULSE OF ARBITRARY FORMCHAMBERS LG.1980; WAVE MOTION; NLD; DA. 1980; VOL. 2; NO 3; PP. 247-253; BIBL. 6 REF.Article

ETUDE GENERALE DES DEPLACEMENTS A LA REFLEXION TOTALE.HUGONIN JP; PETIT R.1977; J. OPT.; FR.; DA. 1977; VOL. 8; NO 2; PP. 73-87; ABS. ANGL.; BIBL. 22 REF.Article

TOTAL REFLECTION RAMAN SPECTROSCOPY (TRRS) OF POLYSTYRENECARIUS W; SCHROETER O.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 59; NO 1; PP. K115-K118; BIBL. 7 REF.Article

SPECTRES DE REFLEXION INTERNE TOTALE PERTURBEE DE SURFACES D'UN CRISTAL DE LIFKLIENTOV YU N; GORODINSKIJ GM; ZOLOTAREV VM et al.1976; OPT. I SPEKTROSK.; S.S.S.R.; DA. 1976; VOL. 41; NO 1; PP. 77-81; BIBL. 11 REF.Article

SURFACE POLARITON DISPERSION MEASUREMENT BY RAMAN SCATTERING EXCITED IN TOTAL REFLECTION CONDITIONMATTEI G; PAGANNONE M; FORNARI B et al.1982; SOLID STATE COMMUNICATIONS; ISSN 0038-1098; USA; DA. 1982; VOL. 44; NO 11; PP. 1495-1498; BIBL. 16 REF.Article

ION FOCUSING EFFECTS ON TOTAL REFLECTION COEFFICIENT NEAR THE SEMICHANNEL DIRECTIONYAMAMURA Y; TAKEUCHI W.1980; RAD. EFFECTS; GBR; DA. 1980; VOL. 49; NO 4; PP. 251-254; BIBL. 8 REF.Article

HIGH-EFFICIENCY FREQUENCY-MODULATION NON-REDUNDANT SCANNING OF A LIGHT BEAM IN A HALF SPACEWIRGIN A.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 26; NO 2; PP. 153-157; BIBL. 2 REF.Article

EFFECTS OF MECHANICAL POLISHING DAMAGE ON THE IRREFLECTANCE AND ATTENUATED TOTAL REFLECTION SPECTRA OF N-TYPE GAAS.HOLM RT; PALIK ED.1976; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1976; VOL. 13; NO 4; PP. 889-893; BIBL. 24 REF.; (PHYS. COMPD. SEMICOND. INTERFACES. ANNU. CONF. 3. PROC.; SAN DIEGO, CALIF.; 1976)Conference Paper

MECHANICAL INTERPRETATION OF SHIFTS IN TOTAL REFLECTION OF SPINNING PARTICLES.COSTA DE BEAUREGARD O.1976; NUOVO CIMENTO, B; ITAL.; DA. 1976; VOL. 36; NO 2; PP. 119-130; ABS. ITAL. RUSSE; BIBL. 19 REF.Article

AN ON-LINE COMPUTER-BASED SYSTEM FOR PERFORMING TIME DOMAIN SPECTROSCOPY. III: PRESENTATION OF RESULTS FOR TOTAL REFLECTION TDSDAWKIIVS AWJ; GRANT EH; SHEPPARD RJ et al.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 12; PP. 1429-1434; BIBL. 12 REF.Article

TOTAL REFLECTION RESONATOR WITH HOLE COUPLINGLIOU JY; CHEN CJ; CHEN JW et al.1980; APPL. OPT.; ISSN 0003-6935; USA; DA. 1980; VOL. 19; NO 5; PP. 653; BIBL. 2 REF.Article

AN X-RAY RESONATOR BASED ON SUCCESSIVE REFLECTIONS OF A SURFACE WAVEBREMER J; KAIHOLA L.1980; APPL. PHYS. LETTERS; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 4; PP. 360-362; BIBL. 15 REF.Article

STRUCTURE DE L'ONDE LATERALE LORS DE LA REFLEXION D'UN FAISCEAU PAR UN MILIEU ACTIFKOLOKOLOV AA.1978; OPT. I SPEKTROSK.; SUN; DA. 1978; VOL. 44; NO 5; PP. 969-973; BIBL. 11 REF.Article

THEORIE DU PHENOMENE DE REFLEXION ET REFRACTION HYSTERETIQUES A LA LIMITE D'UN MILIEU NON LINEAIREKAPLAN AE.1977; ZH. EKSPER. TEOR. FIZ.; S.S.S.R.; DA. 1977; VOL. 72; NO 5; PP. 1710-1726; ABS. ANGL.; BIBL. 37 REF.Article

ETUDE RELATIVISTE DE LA REFLEXION ET DE LA REFRACTION SUR UN DIOPTRE MOBILE, CAS DE LA REFLEXION TOTALECHEMALY NOEL KALLAS.1978; ; FRA; DA. 1978; 726; 68-(2) F.; 30 CM; BIBL. 19 REF.; TH. 3E CYCLE: PHYS. THEORIQUE/LYON 1/1978Thesis

ATMOSFERA GIOVIANA E RIFLESSIONE TOTALE = ATMOSPHERE DE JUPITER ET REFLEXION TOTALELEONE S.1977; MEM. SOC. ASTR. ITAL.; ITA; DA. 1977; VOL. 48; NO 4; PP. 821-827; ABS. ENG; BIBL. 10 REF.Article

Surface structure of In/Si(111) studied by reflection high-energy positron diffractionHASHIMOTO, M; FUKAYA, Y; KAWASUSO, A et al.Surface science. 2007, Vol 601, Num 22, pp 5192-5194, issn 0039-6028, 3 p.Conference Paper

Determination of silicone components contained in paper materials with release propertiesSUMAN, Mlchele.International journal of polymeric materials (Print). 2003, Vol 52, Num 1, pp 1-7, issn 0091-4037, 7 p.Article

Investigation of the influence of photobleaching process on the thermo-optic coefficient of disperse red 1/poly(methl methacrylate) filmKAISHENG CHEN; XIAOXU DENG; XIANG LI et al.Optics and lasers in engineering. 2009, Vol 47, Num 6, pp 708-711, issn 0143-8166, 4 p.Article

Physical origin of large positive and negative lateral optical beam shifts in prism-waveguide coupling systemXIANGMIN LIU; QINGFEN YANG; ZHI QIAO et al.Optics communications. 2010, Vol 283, Num 13, pp 2681-2685, issn 0030-4018, 5 p.Article

Precise determination of surface Debye-temperature of Si(11 1)-7 x 7 surface by reflection high-energy positron diffractionFUKAYA, Y; KAWASUSO, A; HAYASHI, K et al.Applied surface science. 2004, Vol 237, Num 1-4, pp 29-33, issn 0169-4332, 5 p.Conference Paper

Attenuated total reflection of the rubidium D2 line in optically dense vaporTOJO, Satoshi; MURAKAMI, Yuuki; HASUO, Masahiro et al.Journal of the Physical Society of Japan. 2003, Vol 72, Num 5, pp 1069-1072, issn 0031-9015, 4 p.Article

  • Page / 46