Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD)DIATTA, M; BOUYSSOU, E; TREMOUILLES, D et al.Microelectronics and reliability. 2009, Vol 49, Num 9-11, pp 1103-1106, issn 0026-2714, 4 p.Conference Paper

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Transient voltage overshoot in TLP testing : Real or artifact?TREMOUILLES, D; THIJS, S; ROUSSEL, Ph et al.Microelectronics and reliability. 2007, Vol 47, Num 7, pp 1016-1024, issn 0026-2714, 9 p.Conference Paper

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ESD defect localization and analysis using pulsed OBIC techniquesBEAUCHENE, T; LEWIS, D; TREMOUILLES, D et al.Proceedings - Electrochemical Society. 2003, pp 156-165, issn 0161-6374, isbn 1-56677-389-X, 10 p.Conference Paper