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GE PHOTOCAPACITIVE MIS INFRARED DETECTORSBINARI SC; MILLER WE; SHER A et al.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 12; PP. 7883-7886; BIBL. 7 REF.Article

IMPROVED CHARACTERIZATION OF THE SI-SIO2 INTERFACESU P; SHER A; TSUO YH et al.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 12; PP. 991-993; BIBL. 9 REF.Article

SI AND GAAS PHOTOCAPACITIVE MIS INFRARED DETECTORSSHER A; TSUO YH; MORIARTY JA et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 4; PP. 2137-2148; BIBL. 20 REF.Article

DIELECTRIC, PYROELECTRIC, AND THERMAL PROPERTIES OF LINH4SO4 AND LIND4SO4LOIACONO GM; DELFINO M; SMITH WA et al.1980; FERROELECTRICS; GBR; DA. 1980; VOL. 23; NO 1-2; PP. 89-95; BIBL. 15 REF.Article

THERMAL AND DIELECTRIC PROPERTIES OF LIKSO4 AND LICSSO4DELFINO M; LOIACONO GM; SMITH WA et al.1980; J. SOLID STATE CHEM.; GBR; DA. 1980; VOL. 31; NO 1; PP. 131-134; BIBL. 10 REF.Article

LA F3 INSULATORS FOR MIS STRUCTURESSHER A; MILLER WE; TSUO YH et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 11; PP. 799-801; BIBL. 9 REF.Article

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