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Comparison of different SOI technologies: assets and liabilitiesJASTRZEBSKI, L.RCA review. 1983, Vol 44, Num 2, pp 250-269, issn 0033-6831Article

A utility-based integrated system for process simulationSCHECKLER, E. W; WONG, A. S; WANG, R. H et al.IEEE transactions on computer-aided design of integrated circuits and systems. 1992, Vol 11, Num 7, pp 911-920, issn 0278-0070Article

MOS AND BIPOLAR ICS IN CONSUMER APPLICATIONS.PENNEY JD.1974; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1974; VOL. 13; NO 5; PP. 379-386; (SEMINEX SEMIN., LONDON; 1974)Conference Paper

A controlled approach to cheese technology = Une approche contrôlée de la technologie fromagèreLAWRENCE, R. C; HEAP, H. A; GILLES, J et al.Journal of dairy science. 1984, Vol 67, Num 8, pp 1632-1645, issn 0022-0302Article

Les techniques électroniques de pointe au Canada et au QuébecAMESSE, F; LAMY, P; TAHMI, E et al.Recherches sociographiques. 1989, Vol 30, Num 3, pp 375-385, issn 0034-1282Article

A prototype Semantic Web-based digital content exchange for schools in SingaporeSHABAJEE, Paul; MCBRIDE, Brian; STEER, Damian et al.British journal of educational technology. 2006, Vol 37, Num 3, pp 461-477, issn 0007-1013, 17 p.Article

Le développement de la technique avancéeMILLER, R.Recherches sociographiques. 1989, Vol 30, Num 3, pp 387-402, issn 0034-1282Article

Food engineering and dairy technology = Génie industriel alimentaire et technologie laitièreKESSLER, H. G.1981, 671 p.Book

LOCMOS LENDS ITSELF TO FULL SCALE INTEGRATION.BEER A.1977; NEW ELECTRON; G.B.; DA. 1977; VOL. 10; NO 3; PP. 28-32 (3P.)Article

EVALUATION DES DIFFERENTES TECHNOLOGIES MOS.LACOUR J.1974; COMMISSAR. ENERG. ATOM., BULL. INFORM. SCI. TECH.; FR.; DA. 1974; NO 194; PP. 53-61; ABS. ANGLArticle

DIGITAL INTEGRATED CIRCUITS WITH LOW DISSIPATION.DE TROYE NC.1975; PHILIPS TECH. REV.; NETHERL.; DA. 1975; VOL. 35; NO 7-8; PP. 212-220; BIBL. 18 REF.Article

CMOS logic circuit optimum design for radiation toleranceHATANO, H; SHIBUYA, M.Electronics Letters. 1983, Vol 19, Num 23, pp 977-979, issn 0013-5194Article

Failure mechanisms in advanced BCD technology during reliability qualificationVAN HASSEL, J. G; BOCK, G. A. D; VAN DEN BERG, G et al.Microelectronics and reliability. 2011, Vol 51, Num 9-11, pp 1697-1700, issn 0026-2714, 4 p.Conference Paper

Increased current gain and suppression of peripheral base currents in silicided self-aligned narrow width polysilicon-emitter transistors of an advanced BiCMOS technologyEL-DIWANY, M. H; BRASSINGTON, M. P; TUNTASOOD, P et al.IEEE electron device letters. 1988, Vol 9, Num 5, pp 247-249, issn 0741-3106Article

Digest of technical papers/Symposium on VLSI technology, Maui, September 13-15, 1983Symposium on VLSI technology. 1983, 118 p., isbn 4-930813-05-0Conference Proceedings

THE METAL OXIDE SEMICONDUCTOR INTEGRATED CIRCUIT TECHNOLOGYGRANNEMANN WW; SOUTHWARD HD; ERTEZA A et al.1972; J. SCI. INDUSTR. RES.; INDIA; DA. 1972; VOL. 31; NO 6; PP. 299-311; BIBL. 24 REF.Serial Issue

People and technology : Matching technology to peopleSETON, J; HOLLIER, M. P; STENTIFORD, F. W et al.BT technology journal. 1999, Vol 17, Num 1, pp 11-14, issn 1358-3948Article

CAD needs with respect to fault modellingCOURTOIS, B.Rapport de recherche - IMAG. 1983, Num 415, issn 0750-7380, 25 p.Report

LIC TECHNOLOGY.DOYLE N.1974; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1974; VOL. 13; NO 5; PP. 315-324; H.T. 3; (SEMINEX SEMIN.; LONDON; 1974)Conference Paper

Vernieuwing in de civielo techniek in verleden en heden = Innovations dans le génie civil depuis la dernière guerre mondiale = Innovations in civil engineering since the last world warVANDEPITTE, D.Het ingenieursblad. 1989, Vol 58, Num 4, pp 35-39, issn 0020-1235Article

Designing effective Internet assignments in introductory technical communication courses = Utilisation de l'Internet dans les cours d'initiation à la communication techniqueGOUBIL-GAMBRELL, P.IEEE transactions on professional communication. 1996, Vol 39, Num 4, pp 224-231, issn 0361-1434Article

Rapport sur l'état de la technique. La révolution de l'intelligenceGAUDIN, T; BAYEN, M; PORTNOFF, A.-Y et al.1983, Num 97-98, pp 3-142Serial Issue

Two-dimensional analysis of a merged BiPMOS deviceKUO, J. B; ROSSEEL, G. P; DUTTON, R. W et al.IEEE transactions on computer-aided design of integrated circuits and systems. 1989, Vol 8, Num 8, pp 929-932, issn 0278-0070Article

Differential split-level CMOS logic for subnanosecond speedsPFENNINGS, L. C. M. G; MOL, W. G. J; BASTIAENS, J. J. J et al.IEEE journal of solid-state circuits. 1985, Vol 20, Num 5, pp 1050-1055, issn 0018-9200Article

Forum nouvelles Technologies et Handicap1999, 52 p., isbn 2-913-15709-2Book

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