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Results 1 to 25 of 90438

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Homogeneous films by inverse pulsed laser depositionEGERHAZI, L; GERETOVSZKY, Zs; SZÖRENYI, T et al.Applied surface science. 2011, Vol 257, Num 12, pp 5324-5327, issn 0169-4332, 4 p.Conference Paper

COMMENT DÉTERMINER L'INEXACTITUDE DE MESURE EN MESURAGE DE L'ÉPAISSEUR PAR ULTRASONS ?CHAUVEAU, Daniel; BLETTNER, Alexis.Soudage et techniques connexes. 2013, Vol 67, Num 9-10, pp 42-45, issn 0246-0963, 4 p.Article

Thickness uniformity and surface morphology of Fe, Ti, and Hf films produced by filtered pulsed cathodic arc depositionLI, L. H; LU, Q. Y; FU, Ricky K. Y et al.Surface & coatings technology. 2008, Vol 203, Num 5-7, pp 887-892, issn 0257-8972, 6 p.Conference Paper

Magnetic-state tuning of the rhombohedral graphite film by interlayer spacing and thicknessCUONG, Nguyen Thanh; OTANI, Minoru; OKADA, Susumu et al.Surface science. 2012, Vol 606, Num 3-4, pp 253-257, issn 0039-6028, 5 p.Article

Dickenmessung an Walzerzeugnissen = Thickness measurement at rolled productsAluminium (Düsseldorf). 1984, Vol 60, Num 8, pp 574-575, issn 0002-6689Article

Thickness effect of hematite nanostructures prepared by hydrothermal method for solar water splittingAIWU PU; JIUJUN DENG; YUANYUAN HAO et al.Applied surface science. 2014, Vol 320, pp 213-217, issn 0169-4332, 5 p.Article

Domain size and thickness control of thin film photonic crystalsMCLACHLAN, M. A; JOHNSON, N. P; DE LA RUE, R. M et al.Journal of material chemistry. 2005, Vol 15, Num 3, pp 369-371, issn 0959-9428, 3 p.Article

Appareil pour le traitement statistique rapide de l'information obtenue par une jauge d'épaisseur à radioisotopesBONDARENKO, N. L; DRABKIN, L. A; KOZHEVNIKOV, V. I et al.Defektoskopiâ. 1984, Num 1, pp 23-26, issn 0130-3082Article

Les mesures d'épaisseurs : Contrôle et mesureBOOMS, Alexandre.Traitements & matériaux. 2010, Vol 402, pp 21-25, issn 2108-2804, 5 p.Article

Interplay between parameter variation and oxide structure of a modified PAA processSCHNEIDER, M; KREMMER, K; WEIDMANN, S. K et al.Surface and interface analysis. 2013, Vol 45, Num 10, pp 1503-1509, issn 0142-2421, 7 p.Conference Paper

Transmission electron microscopy study of amorphous Ge2Sb2Te5 films induced by an ultraviolet single-pulse laserZHAO, J. J; LIU, F. R; HAN, X. X et al.Applied surface science. 2014, Vol 311, pp 83-88, issn 0169-4332, 6 p.Article

Detection of changes of scar thickness under mechanical loading using ultrasonic measurementLI, J. Q; LI-TSANG, C. W. P; HUANG, Y. P et al.Burns. 2013, Vol 39, Num 1, pp 89-97, issn 0305-4179, 9 p.Article

Perceived thickness and creaminess modulates the short-term satiating effects of high-protein drinksBERTENSHAW, Emma J; LLUCH, Anne; YEOMANS, Martin R et al.British journal of nutrition. 2013, Vol 110, Num 3, pp 578-586, issn 0007-1145, 9 p.Article

Blood rheological characterization using the thickness-shear mode resonatorBANDEY, Helen L; CERNOSEK, Richard W; LEE, William E et al.Biosensors & bioelectronics. 2004, Vol 19, Num 12, pp 1657-1665, issn 0956-5663, 9 p.Article

Virtual substrate model for in situ thin film thickness determinationNAVARRO, M; FANDINO, J.Surface engineering. 2000, Vol 16, Num 1, pp 70-72, issn 0267-0844Article

Infrared thickness sensor of paint filmHAMADA, S; AWAI, K; YAMAMOTO, K et al.Tetsu-to-hagané. 1984, Vol 70, Num 16, pp 2289-2293, issn 0021-1575Article

Analysis of single spray beads prepared using low-pressure cold sprayingKOIVULUOTO, Heli; VUORISTO, Petri.Surface engineering. 2014, Vol 30, Num 6, pp 451-454, issn 0267-0844, 4 p.Article

Grafting densely-packed poly(n-butyl methacrylate) chains from an iron substrate by aryl diazonium surface-initiated ATRP: XPS monitoringMATRAB, Tarik; SAVE, Maud; CHARLEUX, Bernadette et al.Surface science. 2007, Vol 601, Num 11, pp 2357-2366, issn 0039-6028, 10 p.Article

Intraobserver and interobserver reproducibility in the evaluation of ultrasonic pachymetry measurements of central corneal thicknessMIGLIOR, S; ALBE, E; GUARESCHI, M et al.British journal of ophthalmology. 2004, Vol 88, Num 2, pp 174-177, issn 0007-1161, 4 p.Article

System for measuring the thickness of strip on the four-stand rolling mill 1700SHERSHELYUK, V.P; RYNNOV, N.I; EGOROV, I.V et al.Metallurg. 1985, Vol 7, pp 33-35, issn 0026-0827Article

Thickness dependent thermal rearrangement of an ortho-functional polyimideHUAN WANG; CHUNG, Tai-Shung; PAUL, D. R et al.Journal of membrane science (Print). 2014, Vol 450, pp 308-312, issn 0376-7388, 5 p.Article

Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substratesBAAKE, O; ÖKSÜZOGLU, R. M; FLEGE, S et al.Materials characterization. 2006, Vol 57, Num 1, pp 12-16, issn 1044-5803, 5 p.Article

Effects of Cr buffer layer thickness on the microstructure and the properties of Ni thin films deposited on polyimide substrateJUN XU; TIANMIN SHAO.Applied surface science. 2011, Vol 258, Num 4, pp 1565-1571, issn 0169-4332, 7 p.Article

Ultra low energy SIMS depth profiling of sub-1.5 nm silicon oxynitride filmsMULCAHY, C. P. A; BOCK, B; EBBLEWHITE, P. A et al.Applied surface science. 2006, Vol 252, Num 19, pp 7198-7200, issn 0169-4332, 3 p.Conference Paper

Measuring dry film thickness using electromagnetic and Eddy current gaugesCUNNINGHAM, T.Materials performance. 1995, Vol 34, Num 5, pp 39-41, issn 0094-1492Article

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