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Light emission excited by hot electrons in MgF2 thin-film devicesSHU, Q. Q; ZU, Z. R; LU, J. W et al.Journal of applied physics. 1989, Vol 66, Num 12, pp 6193-6195, issn 0021-8979, 3 p.Article

ELECTRON-VELOCITY SATURATION AT A BJT COLLECTOR JUNCTION UNDER LOW-LEVEL CONDITIONSWARNER RM JR; DONG HYUK JU; GRUNG BL et al.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 230-236; BIBL. 26 REF.Article

INTRINSIC RESPONSE TIME MEASUREMENTS IN UNIFORM AND NONUNIFORM FIELD AVALANCHE REGIONS IN GAASPERDOMO J; LEE CA.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 217-223; BIBL. 16 REF.Article

A computationally simple model for hysteretic thin-film electroluminescent devicesJAREM, J. M; SINGH, V. P.I.E.E.E. transactions on electron devices. 1988, Vol 35, Num 11, pp 1834-1841, issn 0018-9383, 1Article

Percolating cermet thin-film thermistors between 50 mk-300 K and 0-20 TGERSHENFELD, N. A; VANCLEVE, J. E; WEBB, W. W et al.Journal of applied physics. 1988, Vol 64, Num 9, pp 4760-4762, issn 0021-8979Article

Effect of surface states of WO3 on the operating characteristics of thin film electrochromic devicesYOSHIMURA, T; WATANABE, M; KOIKE, Y et al.Thin solid films. 1983, Vol 101, Num 2, pp 141-151, issn 0040-6090Article

NONRECIPROCAL HF SIGNAL TRANSMISSION BY SURFACE HELIUMRUIBYS G; TOLUTIS R.1983; ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1983; VOL. 19; NO 8; PP. 273; BIBL. 3 REF.Article

Broad band emission behaviors in ZnS thin film electroluminescent devicesNAKANO, R; MATSUMOTO, H; ENDO, T et al.Japanese journal of applied physics. 1988, Vol 27, Num 11, pp L2103-L2104, issn 0021-4922, part 2Article

Tunnel junctions with yttrium oxide barrier and various ferromagnetic electrodesDIMOPOULOS, Theodoros; GIERES, Günter; COLIS, Silviu et al.IEEE transactions on magnetics. 2004, Vol 40, Num 4, pp 2296-2298, issn 0018-9464, 3 p., 2Conference Paper

Ferromagnetic ultra-small tunnel junction devices fabricated by scanning probe microscope (SPM) local oxidationSHIRAKASHI, Jun-Ichi; TAKEMURA, Yasushi.IEEE transactions on magnetics. 2004, Vol 40, Num 4, pp 2640-2642, issn 0018-9464, 3 p., 2Conference Paper

ELECTRON-BEAM FABRICATION OF 80-A METAL STRUCTURES.BROERS AN; MOLZEN WW; CUOMO JJ et al.1976; APPL. PHYS. LETTERS; U.S.A.; DA. 1976; VOL. 29; NO 9; PP. 596-598; BIBL. 17 REF.Article

SEMIAUTOMATIC MEASUREMENTS OF THIN-FILM BREAKDOWN VOLTAGESGAEBLER W; CONRAD R; BRAEUNIG D et al.1979; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1979; VOL. 50; NO 10; PP. 1218-1222; BIBL. 5 REF.Article

EMRS 2012 Symposium LSPIGA, Sabina; MULLER, Christophe; COWBURN, Russell et al.Thin solid films. 2013, Vol 533, issn 0040-6090, 100 p.Conference Proceedings

Le diamant, composant electronique du XXIe siecle ? = The diamond, electronic component for the XXI century ?DORIGNAC, D.Ingénieurs de l'automobile (Paris). 1998, Num 720, pp 46-53, issn 0020-1200Conference Paper

Excitation efficiency in thin-film electroluminescent devices : proble layer measurementsBENOIT, J; BARTHOU, C; BENALLOUL, P et al.Journal of applied physics. 1993, Vol 73, Num 3, pp 1435-1442, issn 0021-8979Article

The measurement of the efficiency of electron impact excited luminescence in thin film devicesMÜLLER, G. O; MACH, R; SCHULZ, G et al.Experimentelle Technik der Physik. 1983, Vol 31, Num 5, pp 391-396, issn 0014-4924Article

On the storage and detection of multiple flux quantum states in thin film double SQUIDsSCHMIDT, W. D; HEINEMANN, S.Physica status solidi. A. Applied research. 1983, Vol 80, Num 1, pp 141-146, issn 0031-8965Article

Electroluminescence in Li-codoped ZnS: TmF3 thin-film devicesSOHN, S. H; HYUN, D. G; YAMADA, A et al.Applied physics letters. 1993, Vol 62, Num 9, pp 991-993, issn 0003-6951Article

On the excitatory efficiency in ZnS:Mn thin-film electroluminescent devicesZEINERT, A; BENALLOUL, P; BENOIT, J et al.Journal of applied physics. 1992, Vol 71, Num 6, pp 2855-2862, issn 0021-8979Article

Detection of 9.4 GHz ultrasonic waves using a thin-film CdS bolometerRAMPTON, V. W; NEWTON, M. I.Journal of physics. D, Applied physics (Print). 1988, Vol 21, Num 11, pp 1572-1575, issn 0022-3727Article

On the resonance behaviour of a thin film DC-SQUIDSCHMIDT, W.-D; SEIDEL, P; HEINEMANN, S et al.Physica status solidi. A. Applied research. 1985, Vol 91, Num 2, pp K155-K157, issn 0031-8965Article

Electrochromism in a thin-film device using Li2WO4 as an Li-electrolyteYOSHIMURA, T; WATANABE, M; KOIKE, Y et al.Japanese journal of applied physics. 1983, Vol 22, Num 1, pp 152-156, issn 0021-4922Article

Erasing characteristics of a thin-film electroluminescent ZnS:Mn faceplateSAHNI, O.Proceedings of the society for information display. 1983, Vol 24, Num 2, pp 123-128, issn 0734-1768Article

Mechanism of thin-film electroluminescenceBERNARD, J. E; MARTENS, M. F; MORTON, D. C et al.Proceedings of the society for information display. 1983, Vol 24, Num 2, pp 108-112, issn 0734-1768Article

Thin-film electroluminescent devices: influence of Mn-doping method and degradation phenomenaMENN, R; TUETA, R. J; IZRAEL, A et al.Proceedings of the society for information display. 1983, Vol 24, Num 2, pp 120-123, issn 0734-1768Article

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