Tip-induced surface polarization : a new mechanism for contrast in the scanning tunnelling microscopeNESS, H; FISHER, A. J; BRIGGS, G. A. D et al.Surface science. 1997, Vol 380, Num 1, pp L479-L484, issn 0039-6028Article

Nanoscale modification of conducting lines with a scanning force microscopeRANK, R; BRÜCKL, H; KRETZ, J et al.Vacuum. 1997, Vol 48, Num 5, pp 467-472, issn 0042-207XArticle

How does a tip tap ?BURNHAM, N. A; BEHREND, O. P; OULEVEY, F et al.Nanotechnology (Bristol. Print). 1997, Vol 8, Num 2, pp 67-75, issn 0957-4484Article

Mechanical properties studied at the nanoscale using Scanning Local-Acceleration Microscopy (SLAM)OULEVEY, F; BURNHAM, N. A; KULIK, A. J et al.Journal de physique. IV. 1996, Vol 6, Num 8, pp C8.731-C8.734, issn 1155-4339Conference Paper

Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopyMIURA, N; ISHII, H; SHIRAKASHI, J.-I et al.Applied surface science. 1997, Vol 113114, pp 269-273, issn 0169-4332Conference Paper

Constraining new forces in the casimir regime using the isoelectronic techniqueDECCA, R. S; LOPEZ, D; CHAN, H. B et al.Physical review letters. 2005, Vol 94, Num 24, pp 240401.1-240401.4, issn 0031-9007Article

Imaging magnetic charges with magnetic force microscopyHUBERT, A; RAVE, W; TOMLINSON, S. L et al.Physica status solidi. B. Basic research. 1997, Vol 204, Num 2, pp 817-828, issn 0370-1972Article

Controlling the dynamics of a single atom in lateral atom manipulationSTROSCIO, Joseph A; CELOTTA, Robert J.Science (Washington, D.C.). 2004, Vol 306, Num 5694, pp 242-247, issn 0036-8075, 6 p.Article

Energy dissipation rate of a sample-induced thermal fluctuating field in the tip of a probe microscopeDOROFEYEV, I. A.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 6, pp 600-601, issn 0022-3727Article

New AFM imaging for observing a high aspect structureHOSAKA, Sumio; MORIMOTO, Takafumi; KURODA, Hiroshi et al.Applied surface science. 2002, Vol 188, Num 3-4, pp 467-473, issn 0169-4332Conference Paper

Imaging using tip-surface distance variations vs. voltage in scanning tunneling microscopySEINE, G; CORATGER, R; CARLADOUS, A et al.Surface science. 2000, Vol 465, Num 3, pp 219-226, issn 0039-6028Article

AC thermal microscopy: a probe-sample thermal coupling modelDEPASSE, F; GOMES, S; TRANNOY, N et al.Journal of physics. D, Applied physics (Print). 1997, Vol 30, Num 24, pp 3279-3285, issn 0022-3727Article

Hamaker theory for atom-tip interactions of non-reactive surface in non-contact AFMXIE, H.-Y; SUN, X; NING, G.-L et al.Applied surface science. 2005, Vol 239, Num 2, pp 129-131, issn 0169-4332, 3 p.Article

Sensing molecular density of monolayers from fluoroalkyltrichlorosilane using atomic force microscope having a tip modified with fluoroalkyltrichlorosilane moleculesNAKAGAWA, T.Japanese journal of applied physics. 1997, Vol 36, Num 2A, pp L162-L165, issn 0021-4922, 2Article

Microscopie et spectroscopie locale dans le domaine infrarouge: étude et mise au point d'un microscope optique en champ proche = Microscopy and local spectroscopy in the infrared frange: study and development of a near field optical microscopePiednoir, Agnès; Creuzet, F.1994, 180 p.Thesis

Dynamic scanning force microscopy investigation of nanostructured spiral-like domains in Langmuir-Blodgett monolayersPIGNATARO, Bruno; SARDONE, Laura; MARIETTA, Giovanni et al.Nanotechnology (Bristol. Print). 2003, Vol 14, Num 2, pp 245-249, issn 0957-4484, 5 p.Conference Paper

Scanning force microscopy three-dimensional modes applied to the study of the dielectric response of adsorbed DNA moleculesGOMEZ-NAVARRO, C; GIL, A; ALVAREZ, M et al.Nanotechnology (Bristol. Print). 2002, Vol 13, Num 3, pp 314-317, issn 0957-4484, 4 p.Conference Paper

Nanoscale phosphorus atom arrays created using STM for the fabrication of a silicon based quantum computerO'BRIEN, J. L; SCHOFIELD, S. R; SIMMONS, M. Y et al.SPIE proceedings series. 2001, pp 299-309, isbn 0-8194-4320-4Conference Paper

AFM force-distance curve methods for measuring the kinetics of silicon chemical etching and reactions between silylating agents and a silicon surfaceGRINEVICH, O; MEJIRITSKI, A; NECKERS, D. C et al.Langmuir. 1999, Vol 15, Num 6, pp 2077-2079, issn 0743-7463Article

A tip evaluation system for atomic force microscopyHEATON, M. G; MOSLEY, J. J.American laboratory (Fairfield). 1998, Vol 30, Num 19, issn 0044-7749, p. 8Article

Dimer formation and surface alloying: a STM study of lead on Cu(211)BARTELS, L; ZÖPHEL, S; MEYER, G et al.Surface science. 1997, Vol 372, Num 1-3, pp L261-L265, issn 0039-6028Article

Modification of thin film structures based on polycyclic organic compounds by voltage pulses in a scanning tunneling microscopeGURIN, V. S; IVASHKEVICH, O. A.Applied surface science. 1997, Vol 108, Num 1, pp 65-69, issn 0169-4332Article

A model for STM tip-surface interaction in the organic conductor TTF-TCQNARA-KATO, N; SOKOLOFF, J. P; HARA, M et al.Synthetic metals. 1997, Vol 86, Num 1-3, pp 1863-1864, issn 0379-6779Conference Paper

An accurate reconstruction algorithm for tomography experiments that involve complex probe-sample interactionsSAKELLARIOU, A; CHOLEWA, M; SAINT, A et al.Measurement science & technology (Print). 1997, Vol 8, Num 7, pp 746-758, issn 0957-0233Article

Electrochemistry in nano-hole formation on gold surface with a scanning tunnelling microscopeLEBRETON, C; WANG, Z. Z.Surface science. 1997, Vol 382, Num 1-3, pp 193-200, issn 0039-6028Article