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Constraining new forces in the casimir regime using the isoelectronic techniqueDECCA, R. S; LOPEZ, D; CHAN, H. B et al.Physical review letters. 2005, Vol 94, Num 24, pp 240401.1-240401.4, issn 0031-9007Article

Imaging magnetic charges with magnetic force microscopyHUBERT, A; RAVE, W; TOMLINSON, S. L et al.Physica status solidi. B. Basic research. 1997, Vol 204, Num 2, pp 817-828, issn 0370-1972Article

Controlling the dynamics of a single atom in lateral atom manipulationSTROSCIO, Joseph A; CELOTTA, Robert J.Science (Washington, D.C.). 2004, Vol 306, Num 5694, pp 242-247, issn 0036-8075, 6 p.Article

Energy dissipation rate of a sample-induced thermal fluctuating field in the tip of a probe microscopeDOROFEYEV, I. A.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 6, pp 600-601, issn 0022-3727Article

New AFM imaging for observing a high aspect structureHOSAKA, Sumio; MORIMOTO, Takafumi; KURODA, Hiroshi et al.Applied surface science. 2002, Vol 188, Num 3-4, pp 467-473, issn 0169-4332Conference Paper

Imaging using tip-surface distance variations vs. voltage in scanning tunneling microscopySEINE, G; CORATGER, R; CARLADOUS, A et al.Surface science. 2000, Vol 465, Num 3, pp 219-226, issn 0039-6028Article

AC thermal microscopy: a probe-sample thermal coupling modelDEPASSE, F; GOMES, S; TRANNOY, N et al.Journal of physics. D, Applied physics (Print). 1997, Vol 30, Num 24, pp 3279-3285, issn 0022-3727Article

Conductance through a C60 moleculePAULSSON, M; STAFSTRÖM, S.Synthetic metals. 1999, Vol 101, Num 1-3, pp 469-470, issn 0379-6779Conference Paper

Hamaker theory for atom-tip interactions of non-reactive surface in non-contact AFMXIE, H.-Y; SUN, X; NING, G.-L et al.Applied surface science. 2005, Vol 239, Num 2, pp 129-131, issn 0169-4332, 3 p.Article

Fabrication of a nano-magnet on a piezo-driven tip in a TEM sample holderTAKEGUCHI, M; SHIMOJO, M; CHE, R et al.Journal of materials science. 2006, Vol 41, Num 9, pp 2627-2630, issn 0022-2461, 4 p.Article

Tip-induced nanostructuring of alloy surfaces with an electrochemical scanning tunneling microscopeMAUPAI, S; DAKKOURI, A. S; SCHMUKI, P et al.Surface science. 2005, Vol 597, Num 1-3, pp 20-25, issn 0039-6028, 6 p.Conference Paper

The role of shear forces in scanning force microscopy : a comparison between the jumping mode and tapping modeMORENO-HERRERO, F; DE PABLO, P. J; COLCHERO, J et al.Surface science. 2000, Vol 453, Num 1-3, pp 152-158, issn 0039-6028Article

Dynamics of vibrating atomic force microscopyVAN DE WATER, W; MOLENAAR, J.Nanotechnology (Bristol. Print). 2000, Vol 11, Num 3, pp 192-199, issn 0957-4484Article

Quantum coherence effects in the scanning tunneling microscope : a simple interpretation of contact resistance experimentsBISCARINI, F; KENKRE, V. M.Surface science. 1999, Vol 426, Num 3, pp 336-344, issn 0039-6028Article

Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM-AFMARAI, T; TOMITORI, M.Applied surface science. 1999, Vol 144-45, pp 501-504, issn 0169-4332Conference Paper

Structuring of mica surfaces with a vibrating AFM tipPOPP, V; KLADNY, R; SCHIMMEL, T et al.Surface science. 1998, Vol 401, Num 1, pp 105-111, issn 0039-6028Article

Scanning tunneling microscopy fabrication of an Si atom chainHUANG, D. H; AONO, M.Surface science. 1997, Vol 386, Num 1-3, pp 166-168, issn 0039-6028Conference Paper

The Force Needed to Move an Atom on a SurfaceTERNES, Markus; LUTZ, Christopher P; HIRJIBEHEDIN, Cyrus F et al.Science (Washington, D.C.). 2008, Vol 319, Num 5866, pp 1066-1069, issn 0036-8075, 4 p.Article

Inverse calculation of the tip-sample interaction force in atomic force microscopy by the conjugate gradient methodCHANG, Win-Jin; HSU, Jung-Chang; LAI, Tien-Hsing et al.Journal of physics. D, Applied physics (Print). 2004, Vol 37, Num 7, pp 1123-1126, issn 0022-3727, 4 p.Article

Nanoalignment mask fabricated directly on Si by AFMWENHAO HUANG; XUEMING DANG; QIAO HU et al.Surface and interface analysis. 2001, Vol 32, Num 1, pp 130-132, issn 0142-2421Conference Paper

Carbon nanotubes as tips in non-contact SFMBARWICH, V; BAMMERLIN, M; BONARD, J.-M et al.Applied surface science. 2000, Vol 157, Num 4, pp 269-273, issn 0169-4332Conference Paper

Force calibration in lateral force microscopyCAIN, R. G; BIGGS, S; PAGE, N. W et al.Journal of colloid and interface science. 2000, Vol 227, Num 1, pp 55-65, issn 0021-9797Article

Method for increasing sensitivity of shear-force distance control for scanning near-field microscopyKANTOR, R; LESNAK, M; BERDUNOV, N et al.Applied surface science. 1999, Vol 144-45, pp 510-513, issn 0169-4332Conference Paper

Amplitude controlled oscillator for lateral force microscopy. High sensitivity and cheap and compact design without the use of lock-in detection systemsFERRARA, Marco.Nanotechnology (Bristol. Print). 2003, Vol 14, Num 4, pp 427-432, issn 0957-4484, 6 p.Article

STM-assisted nanostructure formation: field-induced excitation and diffusion of precursor moleculesLYUBINETSKY, I; MEZHENNY, S; CHOYKE, W. J et al.Surface science. 2000, Vol 459, Num 1-2, pp L451-L456, issn 0039-6028Article

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