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Standardless Atom Counting in Scanning Transmission Electron MicroscopyLEBEAU, James M; FINDLAY, Scott D; ALLEN, Leslie J et al.Nano letters (Print). 2010, Vol 10, Num 11, pp 4405-4408, issn 1530-6984, 4 p.Article

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Autocorrelation function analysis of phase formation in the initial stage of interfacial reactions of multilayered titanium-silicon thin filmsYANG, T. H; CHENG, S. L; CHEN, L. J et al.Thin solid films. 2004, Vol 469-70, pp 513-517, issn 0040-6090, 5 p.Conference Paper

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Smart flexible microrobots for scanning electron microscope (SEM) applicationsSCHMOECKEL, Ferdinand; FATIKOW, Sergej.SPIE proceedings series. 2000, pp 142-151, isbn 0-8194-3603-8Conference Paper

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Approach to CD SEM metrology utilizing the full waveform signalMCINTOSH, J. M; KANE, B. C; BINDELL, J. B et al.SPIE proceedings series. 1998, pp 51-60, isbn 0-8194-2777-2Conference Paper

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Microscopie électronique à balayage = Scanning electron microscopyLE GRESSUS, Claude.Techniques de l'ingénieur. Analyse et caractérisation. 1995, Vol P1, Num P865, pp P865.1-P865.22, issn 1762-8717Article

Analytical transmission electron microscopy in materials researchBAUER, H.-D; THOMAS, J; WETZIG, K et al.Physica status solidi. A. Applied research. 1995, Vol 150, Num 1, pp 141-152, issn 0031-8965Article

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