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Graphene oxide monolayers as supporting films for high resolution transmission electron microscopyBING YUAN; ZEXIN ZHANG; KUN ZHOU et al.Applied surface science. 2011, Vol 257, Num 13, pp 5754-5758, issn 0169-4332, 5 p.Article

Characterization of compositional oscillations in InGaAs films induced by MBE cell configuration and substrate rotationSAMEY, W. L; SVENSSON, S. P.Materials characterization. 2007, Vol 58, Num 3, pp 284-288, issn 1044-5803, 5 p.Article

TEM analysis of Gd5Si1.85Ge2.15 alloyDU, Z. W; LIU, A. S; SHAO, B. L et al.Materials characterization. 2008, Vol 59, Num 9, pp 1241-1244, issn 1044-5803, 4 p.Article

Mechanical response of wall-patterned GaAs surfaceLE BOURHIS, E; PATRIARCHE, G.Acta materialia. 2005, Vol 53, Num 7, pp 1907-1912, issn 1359-6454, 6 p.Article

Electron tomography of dislocation structuresLIU, G. S; HOUSE, S. D; KACHER, J et al.Materials characterization. 2014, Vol 87, pp 1-11, issn 1044-5803, 11 p.Article

A transmission electron microscopy study of the A-site disordered perovskite Na0.5Bi0.5TiO3DORCET, V; TROLLIARD, G.Acta materialia. 2008, Vol 56, Num 8, pp 1753-1761, issn 1359-6454, 9 p.Article

Twinning in ultrathin silicon nanowiresJINHUA ZHAN; BANDO, Yoshio; JUNQING HU et al.International journal of materials research. 2006, Vol 97, Num 5, pp 513-516, issn 1862-5282, 4 p.Article

A simple and inclusive method to determine the habit plane in transmission electron microscope based on accurate measurement of foil thicknessDONG QIU; MINGXING ZHANG.Materials characterization. 2014, Vol 94, pp 1-6, issn 1044-5803, 6 p.Article

Automated crystal orientation and phase mapping in TEMRAUCH, E. F; VERON, M.Materials characterization. 2014, Vol 98, pp 1-9, issn 1044-5803, 9 p.Article

Observation of thermally etched grain boundaries with the FIB/TEM techniquePALIZDAR, Y; SAN MARTIN, D; WARD, M et al.Materials characterization. 2013, Vol 84, pp 28-33, issn 1044-5803, 6 p.Article

Investigations on structural and optical properties of Zn1―xGdxS nanoparticlesDIVYA, A; SIVA KUMAR, K; SREEDHARA REDDY, P et al.Applied surface science. 2011, Vol 258, Num 2, pp 839-842, issn 0169-4332, 4 p.Article

In-situ micro and near-field photo-excitation under transmission electron microscopyOHNO, Y; YONENAGA, I.Applied surface science. 2014, Vol 302, pp 29-31, issn 0169-4332, 3 p.Conference Paper

TEM characterization of Au-based alloys to join YSZ to steel for SOFC applicationsLIN, Kun-Lin; SINGH, Mrityunjay; ASTHANO, Rajiu et al.Materials characterization. 2012, Vol 63, pp 105-111, issn 1044-5803, 7 p.Article

Microstructural evolution upon annealing in Ar-implanted SiLI, B. S; ZHANG, C. H; YANG, Y. T et al.Applied surface science. 2011, Vol 257, Num 21, pp 9183-9187, issn 0169-4332, 5 p.Article

Transmission electron microscopy observations of CNT morphology before and after heating in vacuumMARTIN, G. L; SCHWOEBEL, P. R.Surface science. 2007, Vol 601, Num 7, pp 1705-1708, issn 0039-6028, 4 p.Article

Bonding mechanisms of thermally softened metallic powder particles and substrates impacted at high velocityKIM, Keehyun; WATANABE, Makoto; KURODA, Seiji et al.Surface & coatings technology. 2010, Vol 204, Num 14, pp 2175-2180, issn 0257-8972, 6 p.Article

Microstructure and mechanical properties of spray-deposited Mg―12.55Al―3.33Zn―0.58Ca―1Nd alloyBAI PUCUN; DONG TAISHANG; HOU XIAOHU et al.Materials characterization. 2010, Vol 61, Num 7, pp 756-760, issn 1044-5803, 5 p.Article

TEM investigation of interfaces during cuprous island growthZHOU, G. W.Acta materialia. 2009, Vol 57, Num 15, pp 4432-4439, issn 1359-6454, 8 p.Article

Microstructural evaluation of oxide layers formed on Fe―22Cr―6Al metallic foam by pre-oxidizationJAE YOUNG LEE; HYUNG GIUN KIM; MI RI CHOI et al.Applied surface science. 2014, Vol 293, pp 255-258, issn 0169-4332, 4 p.Article

Electroextraction of boron from boron carbide scrapJAIN, Ashish; ANTHONYSAMY, S; GHOSH, C et al.Materials characterization. 2013, Vol 84, pp 134-141, issn 1044-5803, 8 p.Article

Synthesis of carbon nanocapsules containing Fe, Ni or Co by arc discharge in aqueous solutionBINGSHE XU; JUNJIE GUO; XIAOMIN WANG et al.Carbon (New York, NY). 2006, Vol 44, Num 13, pp 2631-2634, issn 0008-6223, 4 p.Article

Photoluminescence of Ge nano-crystallites embedded in silicon oxideTORCHYNSKA, T. V; POLUPAN, G; PALACIOS GOMEZ, J et al.Microelectronics journal. 2003, Vol 34, Num 5-8, pp 541-543, issn 0959-8324, 3 p.Conference Paper

A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant SubstratesTAYLOR, A. A; CORDILL, M. J; MOSER, G et al.Praktische Metallographie. 2011, Vol 48, Num 8, pp 408-413, issn 0032-678X, 6 p.Article

Analytical TEM of i-phase in an Al94Mn2Be2Cu2 alloyROZMAN, Niko; BONCINA, Tonica; ZUPANIC, Franc et al.Praktische Metallographie. 2010, Vol 47, Num 7, pp 388-391, issn 0032-678X, 4 p.Article

In Situ Transmission Electron MicroscopyFERREIRA, P. J; MITSUISHI, K; STACH, E. A et al.MRS bulletin. 2008, Vol 33, Num 2, issn 0883-7694, 49 p.Serial Issue

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