DESIGN OF MAGNETIC SPECTROMETERS WITH SECOND-ORDER ABERRATIONS CORRECTED. I; THEORYPARKER NW; UTLAUT M; ISAACSON MS et al.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 4; PP. 333-351; ABS. GER; BIBL. 9 REF.Article

OBSERVATION OF NONHEXAGONAL SUPERLATTICES IN HIGH-STAGE CESIUM INTERCALATED GRAPHITEHWANG DM; PARKER NW; UTLAUT M et al.1983; PHYSICAL REVIEW. B: CONDENSED MATTER; ISSN 0163-1829; USA; DA. 1983; VOL. 27; NO 2; PP. 1458-1461; BIBL. 16 REF.Article

CONTAMINATION AS A PSYCHOLOGICAL PROBLEMISAACSON M; KOPF D; OHTSUKI M et al.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 1; PP. 97-99; BIBL. 5 REF.Article

ATOMIC IMAGING USING THE DARK-FIELD ANNULAR DETECTOR IN THE STEMISAACSON M; KOPF D; OHTSUKI M et al.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 1; PP. 101-104; BIBL. 5 REF.Article

A review of Ga⁺ FIB/SIMSGIANNUZZI, Lucille A; UTLAUT, M.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 475-478, issn 0142-2421, 4 p.Conference Paper

Performance of the focused-ion-striped transistor (FIST): a new MESFET structure produced by focused-ion-beam implantationRENSCH, D. B; MATTHEWS, D. S; UTLAUT, M. W et al.I.E.E.E. transactions on electron devices. 1987, Vol 34, Num 11, pp 2232-2237, issn 0018-9383Article