A novel STM-assisted microwave microscope with capacitance and loss imaging capabilityIMTIAZ, Atif; ANLAGE, Steven M.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 209-216, issn 0304-3991, 8 p.Article

Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscopeHUNTINGTON, S. T; HARTLEY, P. G; KATSIFOLIS, J et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 283-291, issn 0304-3991, 9 p.Article

Atomic force microscopy study of chromosome surface structure changed by protein extractionXINQI LIU; SUGIYAMA, Shigeru; QINGYI XU et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 217-223, issn 0304-3991, 7 p.Article

Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layersMERLI, P. G; MORANDI, V; CORTICELLI, F et al.Ultramicroscopy. 2003, Vol 94, Num 2, pp 89-98, issn 0304-3991, 10 p.Article

Computer simulation of Lorentz electron micrographs of thin magnetic particlesHAUG, Thomas; OTTO, Stephan; SCHNEIDER, Markus et al.Ultramicroscopy. 2003, Vol 96, Num 2, pp 201-206, issn 0304-3991, 6 p.Article

Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beamMCBRIDE, W; COCKAYNE, D. J. H; TSUDA, K et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 305-308, issn 0304-3991, 4 p.Article

Defining the parameters of a cantilever tip AFM by reference structureBYKOV, V. A; NOVIKOV, Yu. A; RAKOV, A. V et al.Ultramicroscopy. 2003, Vol 96, Num 2, pp 175-180, issn 0304-3991, 6 p.Article

Evaluation of a hybrid pixel detector for electron microscopyFARUQI, A. R; CATTERMOLE, D. M; HENDERSON, R et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 263-276, issn 0304-3991, 14 p.Article

Holographic voltage profiling on 75 nm gate architecture CMOS devicesTHESEN, Alexander E; FROST, Bernhard G; JOY, David C et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 277-281, issn 0304-3991, 5 p.Article

Lattice parameters from direct-space images at two tiltsQIN, W; FRAUNDORF, P.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 245-262, issn 0304-3991, 18 p.Article

Measuring the PSF from aperture images of arbitrary shape: an algorithmNAKASHIMA, P. N. H; JOHNSON, A. W. S.Ultramicroscopy. 2003, Vol 94, Num 2, pp 135-148, issn 0304-3991, 14 p.Article

Reconstruction of composite in-line electron holograms using a small emission coneHOLENSTEIN, Roman; ROTHWELL, Timothy A; SHEGELSKI, Mark R. A et al.Ultramicroscopy. 2003, Vol 94, Num 2, pp 99-107, issn 0304-3991, 9 p.Article

Retrieving modulation parameters from HRTEM images of modulated structuresHÖCHE, Thomas; NEUMANN, Wolfgang.Ultramicroscopy. 2003, Vol 96, Num 2, pp 181-190, issn 0304-3991, 10 p.Article

Thermal behaviour modelling of tapered optical fibres for scanning near-field microscopyTHIERY, L; MARINI, N.Ultramicroscopy. 2003, Vol 94, Num 1, pp 49-69, issn 0304-3991, 21 p.Article

Rattling modes and the intrinsic vibrational spectrum of beetle-type scanning tunneling microscopesMIWA, J. A; MACLEOD, J. M; MOFFAT, Antje et al.Ultramicroscopy. 2003, Vol 98, Num 1, pp 43-49, issn 0304-3991, 7 p.Article

Field emission 2001: proceedings of the 47th international field emission symposium, Berlin, Germany, 29 July-3 August, 2001 - IFES 2001WANDERKA, Nelia; DANOIX, Frederic; FORBES, Richard G et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, issn 0304-3991, 253 p.Conference Proceedings

Field electron and ion emission from charged surfaces: a strategic historical review of theoretical conceptsFORBES, Richard G.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 1-18, issn 0304-3991, 18 p.Conference Paper

Fowler-Nordheim theory for a spherical emitting surfaceEDGCOMBE, C. J.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 49-56, issn 0304-3991, 8 p.Conference Paper

Field emission from individual multiwalled carbon nanotubes prepared in an electron microscopeDE JONGE, N; VAN DRUTEN, N. J.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 85-91, issn 0304-3991, 7 p.Conference Paper

Effect of carbon nanotube structural parameters on field emission propertiesFENG, Y. T; DENG, S. Z; CHEN, J et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 93-97, issn 0304-3991, 5 p.Conference Paper

A high power density submicron electron beam sourcePTITSIN, V. E; TREGUBOV, V. F.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 131-138, issn 0304-3991, 8 p.Conference Paper

A new step towards the lattice reconstruction in 3DAPVURPILLOT, F; RENAUD, L; BLAVETTE, D et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 223-229, issn 0304-3991, 7 p.Conference Paper

Improvement of the mass resolution of the atom probe using a dual counter-electrodeDECONIHOUT, B; SAINT-MARTIN, R; JARNOT, C et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 239-249, issn 0304-3991, 11 p.Conference Paper

SPM 2002: Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Las Vegas, Nevada, USA, May 26-29, 2002ALLISON, David P; HÖRBER, J. K. Heinrich.Ultramicroscopy. 2003, Vol 97, Num 1-4, issn 0304-3991, 537 p.Conference Proceedings

AFM and STM study of β-amyloid aggregation on graphiteZHIGANG WANG; CHUNQING ZHOU; CHEN WANG et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 73-79, issn 0304-3991, 7 p.Conference Paper