Electronic structure of the trimetal nitride fullerene Dy₃N@C₈₀SHIOZAWA, H; RAUF, H; BATCHELOR, D et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 19, pp 195409.1-195409.5, issn 1098-0121Article

Ultraviolet photoelectron spectra of (YC)₂ @ C₈₂ and Y₂ @ C₈₂HINO, Shojun; WANITA, Norihiko; IWASAKI, Kentaro et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 19, pp 195424.1-195424.5, issn 1098-0121Article

Study on the interface between the organic and inorganic semiconductorsDAN JIN; WEI WANG; RAHMAN, Ateeq et al.Applied surface science. 2011, Vol 257, Num 11, pp 4994-4999, issn 0169-4332, 6 p.Article

Ultraviolet photoelectron spectroscopy on new heterocyclic materials for multilayer organic light emitting diodesCASU, M. B; IMPERIA, P; SCHRADER, S et al.Synthetic metals. 2001, Vol 124, Num 1, pp 79-81, issn 0379-6779Conference Paper

The influence of the counterion on the electronic structure in doped phenylene-based materialsKOCH, N; RAJAGOPAL, A; ZOJER, E et al.Surface science. 2000, Vol 454-56, pp 1000-1004, issn 0039-6028Conference Paper

Investigation of a traditional catalyst by contemporary methods: Parallel electron spectroscopic and catalytic studies on Pt blackPAAL, Zoltan; SCHLÖGL, Robert.Surface science. 2009, Vol 603, Num 10-12, pp 1793-1801, issn 0039-6028, 9 p.Article

Proceedings of the 5th International School and Symposium on Synchroton Radiation in Natural Science, June 12-17, 2000, Ustroń-Jaszowiec, PolandKAPUSTA, C; KWIATEK, W. M; KONIOR, J et al.Journal of alloys and compounds. 2001, Vol 328, Num 1-2, issn 0925-8388, 304 p.Conference Proceedings

The effect of oxygen exposure on pentacene electronic structureVOLLMER, A; JÜRCHESCU, O. D; ARFAOUI, I et al.The European physical journal. E, Soft matter (Print). 2005, Vol 17, Num 3, pp 339-343, issn 1292-8941, 5 p.Article

Dimensionality in the alloy-de-alloy phase transition of Ag/Cu( 110)KIZILKAYA, O; HITE, D. A; ZHAO, W et al.Surface science. 2005, Vol 596, Num 1-3, pp 242-252, issn 0039-6028, 11 p.Article

UPS of multilayer nitrogen-bearing compounds on the Si(100) surfaceBUSH, B; CRAIG, J. H; ROOS, K. R et al.Surface and interface analysis. 2008, Vol 40, Num 5, pp 927-930, issn 0142-2421, 4 p.Article

Ultraviolet photoelectron spectroscopy investigation of interface formation in an indium-tin oxide/fluorocarbon/organic semiconductor contactTONG, S. W; LAU, K. M; SUN, H. Y et al.Applied surface science. 2006, Vol 252, Num 10, pp 3806-3811, issn 0169-4332, 6 p.Article

Electron interaction between encapsulated atoms and π-electrons in a fullerene cageHINO, Shojun.Journal of low temperature physics. 2006, Vol 142, Num 3-4, pp 127-132, issn 0022-2291, 6 p.Conference Paper

XPS and UPS study of Na deposition on thin film V₂O₅WU, Qi-Hui; THISSEN, A; JAEGERMANN, W et al.Applied surface science. 2005, Vol 252, Num 5, pp 1801-1805, issn 0169-4332, 5 p.Article

Interaction of Pd electron states with adsorbed hydrogenSOLOV'EV, S. M; PETTENKOFER, C; PRONIN, I. I et al.Surface science. 2013, Vol 608, pp 165-172, issn 0039-6028, 8 p.Article

XPS and ToF-SIMS investigation of nanocrystalline diamond oxidized surfacesTORRENGO, S; CANTERI, R; DELL'ANNA, R et al.Applied surface science. 2013, Vol 276, pp 101-111, issn 0169-4332, 11 p.Article

A comparative analysis of electron spectroscopy and first-principles studies on Cu(Pd) adsorption on MgOKRISCHOK, S; STRACKE, P; HÖFFT, O et al.Surface science. 2006, Vol 600, Num 18, pp 3815-3820, issn 0039-6028, 6 p.Conference Paper

Electronic and vibrational properties of ultrathin SiO₂ films grown on Mo(112)WENDT, S; OZENSOY, E; WEI, T et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 11, pp 115409.1-115409.9, issn 1098-0121Article

High-energy spectroscopic studies of the electronic structures of organic systems formed from carbon and fluorine by UPS, vacuum-UV optical spectroscopy, and NEXAFS: Poly(hexafluoro-1,3-butadiene) [C(CF₃) = C(CF₃)]_n, fluorinated graphites (CF, C₂F, and C₆F), perfluoroalkanes n-C_nF_2n+2, poly(tetrafluoroethylene) (CF₂)_n, and fluorinated fullerenes (C₆₀F_x and C₇₀F_x)SEKI, Kazuhiko; MITSUMOTO, Ryuichi; NISHIMURA, Shin et al.Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals. 2001, Vol 355, pp 247-274, issn 1058-725XArticle

Study by static SIMS, XPS and UPS of the adsorption of cyanogen on (100) Ni surfacesGOUTTEBARON, R; BOURGEOIS, S; PERDEREAU, M et al.Surface science. 2000, Vol 458, Num 1-3, pp 239-246, issn 0039-6028Article

Anomalous behavior of LEED beam intensity during annealingFU, Tsu-Yi; LIU, T. F; SU, C. W et al.Surface science. 2000, Vol 464, Num 2-3, pp 211-216, issn 0039-6028Article

Ultraviolet photoelectron spectra of potassium dosed higher fullerenesIWASAKI, Kentaro; UMISHITA, Kazunori; HINO, Shojun et al.Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals. 2000, Vol 340, pp 623-628, issn 1058-725XConference Paper

Degradation of the CaF₂( 111) surface by air exposureREICHLING, M; HUISINGA, M; GOGOLL, S et al.Surface science. 1999, Vol 439, Num 1-3, pp 181-190, issn 0039-6028Article

Electronic properties of a pseudomorphic Cu-layer on Ni(111)KOSCHEL, H; HELD, G; TRISCHBERGER, P et al.Applied surface science. 1999, Vol 142, Num 1-4, pp 18-22, issn 0169-4332Conference Paper

Ultraviolet photoelectron spectroscopy of nano In clusters Schottky barriers on sputtered InPKUMAR, Shailendra; MUKHERJEE, C; DIXIT, V. K et al.Applied surface science. 2011, Vol 258, Num 1, pp 143-146, issn 0169-4332, 4 p.Article

Pitfalls in measuring work function using photoelectron spectroscopyHELANDER, M. G; GREINER, M. T; WANG, Z. B et al.Applied surface science. 2010, Vol 256, Num 8, pp 2602-2605, issn 0169-4332, 4 p.Article