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COMPARISON OF EXPERIMENTAL AND CALCULATED RELATIVE SENSITIVITY COEFFICIENTS FOR SPARK-SOURCE MASS-SPECTROMETRY OF METALSVAN HOYE E; ADAMS F; GIJBELS R et al.1979; TALANTA; GBR; DA. 1979; VOL. 26; NO 4; PP. 285-289; BIBL. 23 REF.Article

MASS-SPECTROMETRIC MULTIELEMENT ANALYSIS OF COPPER AND COPPER-BASE ALLOYS, WITH ELECTRICAL DETECTION.VAN HOYE E; GIJBELS R; ADAMS F et al.1977; TALANTA; G.B.; DA. 1977; VOL. 24; NO 10; PP. 625-631; BIBL. 9 REF.Article

COMPARISON OF SENSITIVITY COEFFICIENTS FOR SPARK-SOURCE MASS SPECTROMETRY DETERMINED WITH PHOTOGRAPHIC AND ELECTRICAL DETECTIONVAN HOYE E; GIJBELS R; ADAMS F et al.1980; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1980; VOL. 115; PP. 239-248; BIBL. 18 REF.Article

INFLUENCE OF SPARKING CONDITIONS AND OF ELECTRODE TEMPERATURE ON THE RELATIVE ELEMENTAL SENSITIVITY IN SPARK-SOURCE MASS SPECTROMETRYVAN HOYE E; ADAMS F; GIJBELS R et al.1979; INTERNATION. J. MASS SPECTROM. ION PHYS.; NLD; DA. 1979; VOL. 30; NO 1; PP. 75-81; BIBL. 10 REF.Article

CRITICAL EVALUATION OF AN AUTOMATIC PHOTOPLATE PROCESSING SYSTEM FOR SPARK SOURCE MASS SPECTRA.VAN HOYE E; ADAMS F; GIJBELS R et al.1975; BULL. SOC. CHIM. BELGES; BELG.; DA. 1975; VOL. 84; NO 6; PP. 595-615; BIBL. 1 P. 1/2; (RECENT TRENDS INORG. ANAL. IST. SYMP. BULL. SOC. CHIM. BELG.)Conference Paper

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