au.\*:("VAN MEER, H")
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Investigation of charge control related performances in double-gate SOI MOSFETsKILCHYTSKA, V; CHUNG, T. M; VAN MEER, H et al.Proceedings - Electrochemical Society. 2003, pp 225-230, issn 0161-6374, isbn 1-56677-375-X, 6 p.Conference Paper
On the origin of the 1/f1.7 noise in deep submicron partially depleted SOI transistorsLUKYANCHIKOVA, N; PETRICHUK, M; GARBAR, N et al.ESSCIRC 2002 : European solid-state circuits conferenceEuropean solid-state device research conference. 2002, pp 75-78, isbn 88-900847-8-2, 4 p.Conference Paper
