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DETERMINATION OF THE AMORPHOUS CONTENT OF SUPERCONDUCTING FILMS BY X-RAY DIFFRACTION AND ITS RELATION TO TRANSITION TEMPERATUREVANDER I; CADIEU FJ.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 3; PP. 1481-1483; BIBL. 6 REF.Article

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