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DIRECT OBSERVATION OF LASER SPECKLES FOR REAL-TIME ANALYSIS OF LATERAL MOTIONSVIKRAM CS; VEDAM K.1981; OPT. LETT.; ISSN 0146-9592; USA; DA. 1981; VOL. 6; NO 11; PP. 511-513; BIBL. 8 REF.Article

STRESS-OPTIC COEFFICIENT OF ZNSE AT 10.6 MU MMARINER GR; VEDAM K.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 17; PP. 2878-2879; BIBL. 9 REF.Article

OPTICAL INTERFEROMETRY IN LIQUIDS AT HIGH PRESSURES TO 14 KILOBARS.VEDAM K; LIMSUWAN P.1977; REV. SCI. INSTRUM.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 245-246; BIBL. 7 REF.Article

EXAMINATION OF IMPERFECT MUSCOVITE CRISTALS BY X-RAY DIFFRACTION METHODS.CASLAVSKY JL; VEDAM K.1970; J. APPL. PHYS.; USA; 1970(1), VOL. 41, NUM. 0001, P. 50 A 53Miscellaneous

PIEZO- AND ELASTO-OPTIC PROPERTIES OF LIQUIDS UNDER HIGH PRESSURE. III: RESULTS ON TWELVE MORE LIQUIDSCHEN CC; VEDAM K.1980; J. CHEM. PHYS.; ISSN 0021-9606; USA; DA. 1980; VOL. 73; NO 9; PP. 4577-4584; BIBL. 30 REF.Article

PIEZO- AND THERMO-OPTICAL PROPERTIES OF BI12GEO20. III: THE DISPERSION THEORIES AND MODELSHENNESSEY P; VEDAM K.1979; J. OPT. SOC. AMER.; USA; DA. 1979; VOL. 69; NO 2; PP. 352-356; BIBL. 21 REF.Article

TESTING THE TRUENESS OF CIRCULAR SURFACES BY LASER SPECKLE PHOTOGRAPHYVIKRAM CS; VEDAM K.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 14; PP. 2351-2353; BIBL. 3 REF.Article

A CRITICAL EVALUATION OF EQUATIONS OF STATE BY PIEZO-OPTIC MEASUREMENTSVEDAM K; UMSUWAN P.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 3 PART. 1; PP. 1328-1333; BIBL. 47 REF.Article

MUSCOVITES WITH ISOTROPIC AND ANISTROPIC ELASTICITY IN THE BASAL PLANE.CASLAVSKY JL; VEDAM K.1970; AMER. MINERALOGIST; USA; 1970, VOL. 55, NUM. 0009-0010, P. 1633 A 1638Miscellaneous

COMPLETE 3-D DEFORMATION ANALYSIS IN THE WHITE LIGHT SPECKLE METHODVIKRAM CS; VEDAM K.1983; APPLIED OPTICS; ISSN 0003-6935; USA; DA. 1983; VOL. 22; NO 2; PP. 213-214; BIBL. 12 REF.Article

REAL-TIME LONGITUDINAL DISPLACEMENT ANALYSIS OF ROUGH SURFACES BY OBSERVING FRINGES WITHIN OBJECTIVE LASER SPECKLESVIKRAM CS; VEDAM K.1983; OPTIK (STUTTGART); ISSN 0030-4026; DEU; DA. 1983; VOL. 64; NO 2; PP. 171-175; ABS. GER; BIBL. 19 REF.Article

EFFECT OF MODULATION ERRORS IN LINEARIZED SUBFRINGE HOLOGRAPHIC INTERFEROMETRYVIKRAM CS; VEDAM K.1980; OPTIK; DEU; DA. 1980; VOL. 56; NO 1; PP. 51-58; ABS. GER; BIBL. 17 REF.Article

UNIFIED APPROACH FOR TIME-AVERAGE HOLOGRAPHY OF SEPARABLE FINE MOTIONSVIKRAM CS; VEDAM K.1980; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1980; VOL. 57; NO 3; PP. 385-389; ABS. GER; BIBL. 9 REF.Article

ORDINARY PAPER FOR POSITION DETERMINATION OF INTENSE LASER PULSEVIKRAM CS; VEDAM K.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 24; PP. 4063Article

PIEZO- AND ELASTO-OPTIC PROPERTIES OF LIQUIDS UNDER HIGH PRESSURE. II: REFRACTIVE INDEX VS DENSITYVEDAM K; LIMSUWAN P.1978; J. CHEM. PHYS.; USA; DA. 1978; VOL. 69; NO 11; PP. 4772-4778; BIBL. 67 REF.Article

PIEZO- AND THERMO-OPTICAL PROPERTIES OF BI12GEO20, I. OPTICAL ROTATORY DISPERSION.HENNESSEY P; VEDAM K.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 4; PP. 436-441; BIBL. 30 REF.Article

PIEZO-OPTIC BEHAVIOR OF WATER AND CARBON TETRACHLORIDE UNDER HIGH PRESSURE.VEDAM K; LIMSUWAN P.1975; PHYS. REV. LETTERS; U.S.A.; DA. 1975; VOL. 35; NO 15; PP. 1014-1016; BIBL. 11 REF.Article

PROCESSING SPECKLE PHOTOGRAPHY DATA: CIRCULAR IMAGING APERTUREVIKRAM CS; VEDAM K.1983; APPLIED OPTICS; ISSN 0003-6935; USA; DA. 1983; VOL. 22; NO 5; PP. 653-654; BIBL. 13 REF.Article

PIEZO- AND ELASTO-OPTIC PROPERTIES OF DEUTERIUM OXIDE UNDER HIGH PRESSURECHEN CC; VEDAM K.1980; J. CHEM. PHYS.; ISSN 0021-9606; USA; DA. 1980; VOL. 72; NO 2; PP. 1410-1411; BIBL. 19 REF.Article

MEASUREMENT OF SUBSPECKLE-SIZE CHANGES BY LASER-SPECKLE PHOTOGRAPHYVIKRAM CS; VEDAM K.1979; OPT. LETTERS; USA; DA. 1979; VOL. 4; NO 12; PP. 406-407; BIBL. 4 REF.Article

TESTING THE TRUENESS OF CIRCULAR SURFACES: A SIMPLE HOLOGRAPHIC METHODVIKRAM CS; VEDAM K.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 5; PP. 627-630; BIBL. 3 REF.Article

RETROREFLECTION FROM SPHERICAL GLASS BEADS IN HIGHWAY PAVEMENT MARKINGS. I. SPECULAR REFLECTION.STOUDT MD; VEDAM K.1978; APPL. OPT.; USA; DA. 1978; VOL. 17; NO 12; PP. 1855-1858; BIBL. 7 REF.Article

IMPORTANCE OF USING EULERIAN REPRESENTATION OF STRAIN IN HIGH PRESSURE STUDIES ON LIQUIDSVEDAM K; CHEN CC.1982; J. CHEM. PHYS.; ISSN 0021-9606; USA; DA. 1982; VOL. 77; NO 3; PP. 1461-1463; BIBL. 14 REF.Article

HOLOGRAPHIC INTERFEROMETRY OF CORROSION = INTERFEROMETRIE HOLOGRAPHIQUE DE LA CORROSIONVIKRAM CS; VEDAM K.1980; OPTIK; DEU; DA. 1980; VOL. 55; NO 4; PP. 407-414; ABS. GER; BIBL. 4 REF.Article

LASER SPECKLE PHOTOGRAPHY FOR SUPERSENSITIVE DIAL GAUGEVIKRAM CS; VEDAM K.1980; OPT. LETTERS; USA; DA. 1980; VOL. 5; NO 10; PP. 441-442; BIBL. 5 REF.Article

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