Formation of epitaxial β-FeSi₂ films on Si(001) as studied by medium-energy ion scatteringKONUMA, K; VRIJMOETH, J; ZAGWIJN, P. M et al.Journal of applied physics. 1993, Vol 73, Num 3, pp 1104-1109, issn 0021-8979Article

Structure determination of the CoSi₂(111) surface using medium-energy ion scatteringVRIJMOETH, J; SCHINS, A. G; VAN DER VEEN, J. F et al.Physical review. B, Condensed matter. 1989, Vol 40, Num 5, pp 3121-3128, issn 0163-1829, 8 p.Article

Morphology of quaterthiophene thin films in organic field effect transistorsSCHOONVELD, W. A; STOK, R. W; WEIJTMANS, J. W et al.Synthetic metals. 1997, Vol 84, Num 1-3, pp 583-584, issn 0379-6779Conference Paper

Monolayer resolution in medium-energy ion-scattering experiments on the NiSi₂ (111) surfaceVRIJMOETH, J; ZAGWIJN, P. M; FRENKEN, J. W. M et al.Physical review letters. 1991, Vol 67, Num 9, pp 1134-1137, issn 0031-9007Article

Reversible place-exchange during film growth : a mechanism for surfactant transportMEYER, J. A; VAN DER VEGT, H. A; VRIJMOETH, J et al.Surface science. 1996, Vol 355, Num 1-3, pp L375-L380, issn 0039-6028Article

Structure determination of the NiSi₂(111) surface with medium-energy ion backscattering from individual monolayersVRIJMOETH, J; ZAGWIJN, P. M; VLIEG, E et al.Surface science. 1993, Vol 290, Num 3, pp 255-266, issn 0039-6028Article

CoSi₂/Si(111) interface : determination of the interfacial metal coordination numberVRIJMOETH, J; ZAIMA, S; VLIEG, E et al.Physical review. B, Condensed matter. 1992, Vol 45, Num 12, pp 6700-6708, issn 0163-1829Article

Determination of the coordination number of Co atoms at the CoSi₂ (A,B)/Si(111) interface by transmission electron microscopyBULLE-LIEUWMA, C. W. T; DE JONG, A. F; VAN OMMEN, A. H et al.Applied physics letters. 1989, Vol 55, Num 7, pp 648-650, issn 0003-6951, 3 p.Article

Growth mode and interface structure of Ag on the HF-treated Si(111) :H surfaceNISHIYAMA, A; TER HORST, G; ZAGWIJN, P. M et al.Surface science. 1996, Vol 350, Num 1-3, pp 229-238, issn 0039-6028Article

Formation of ironsilicide on Si(001)KONUMA, K; VRIJMOETH, J; ZAGWIJN, P. M et al.Applied surface science. 1993, Vol 70-71, Num 1-4, pp 564-568, issn 0169-4332, BConference Paper

Microscopic aspects of thin metal film epitaxial growth on metallic substratesGÜNTHER, C; GÜNTHER, S; KOPATZKI, E et al.Berichte der Bunsen-Gesellschaft. 1993, Vol 97, Num 3, pp 522-536, issn 0940-483XConference Paper

Medium-energy ion-scattering study of a possible relation between the Schottky-barrier height and the defect density at NiSi₂/Si(111) interfacesVRIJMOETH, J; VAN DER VEEN, J. F; HESLINGA, D. R et al.Physical review. B, Condensed matter. 1990, Vol 42, Num 15, pp 9598-9608, issn 0163-1829, 11 p.Article