In situ fabrication and regeneration of microtips for scanning tunnelling microscopyVU THIEN BINH.Journal of microscopy (Print). 1988, Vol 152, Num 2, pp 355-361, issn 0022-2720Article

Atomic metallic ion emission, field surface melting and scanning tunneling microscopy tipsVU THIEN BINH; GARCIA, N.Journal de physique 1, General physics, statistical physics, condensed matter, cross-disciplinary physics. 1991, Vol 1, Num 5, pp 605-612, 8 p.Article

Characterization of microtips for scanning tunneling microscopyVU THIEN BINH; MARIEN, J.Surface science. 1988, Vol 202, Num 1-2, pp L539-L549, issn 0039-6028Article

Size and shape of crystal faces on heated metal tips = Dimension et forme des faces cristallines sur des pointes métalliques chaufféesVU THIEN BINH; DRECHSLER, M.Journal de physique. Colloques. 1984, Vol 45, Num 9, pp 29-37, issn 0449-1947Article

Magnetic nanotips : the realisation of an atomic-scale beam-splitterVU THIEN BINH; GARCIA, N.Surface science. 1994, Vol 320, Num 3, pp L69-L75, issn 0039-6028Article

EVOLUTION DU PROFIL D'UN CRISTAL SOUS L'ACTION DE L'EVAPORATION ET DE LA DIFFUSION DE SURFACEVU THIEN BINH.1974; AO-CNRS-11276; FR.; DA. 1974; PP. 1-126; H.T. 33; BIBL. DISSEM.; (THESE DOCT. SCI. PHYS.; CLAUDE BERNARD LYON I)Thesis

Sources d'électrons de dimensions atomiques : nouveaux concepts et nouvelles applications = Electron sources of atomic dimensions : new concepts and applicationsVU THIEN BINH; PURCELL, S. T; SEMET, V et al.Le Vide (1995). 1996, Vol 52, Num 282, pp 447-462, issn 1266-0167Article

Struturally induced FEES from nanotips : implications for scanning tunneling spectroscopyGARCIA, N; VU THIEN BINH; PURCELL, S. T et al.Surface science. 1993, Vol 293, Num 3, pp L884-L886, issn 0039-6028Article

Nanometric observations at low energy by Fresnel projection microscopy: carbon and polymer fibresVU THIEN BINH; SEMET, V; GARCIA, N et al.Ultramicroscopy. 1995, Vol 58, Num 3-4, pp 307-317, issn 0304-3991Article

A mechanical nanosensor in the gigahertz range : where mechanics meets electronicsVU THIEN BINH; GARCIA, N; LEVANUYK, A. L et al.Surface science. 1994, Vol 301, Num 1-3, pp L224-L228, issn 0039-6028Article

Microscope à projection de Fresnel. Etude - Conception - Premiers résultats = Fresnel Projection Microscope. Design - realisation - first resultsSemet, Vincent; Vu Thien Binh.1995, 127 p.Thesis

UNE DETERMINATION DU COEFFICIENT D'AUTO-DIFFUSION DE SURFACE DU MOLYBDENE.VU THIEN BINH; UZAN R; DRECHSLER M et al.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 57; NO 1; PP. 118-124; ABS. ANGL.Article

A DETERMINATION OF THE RATE AND HEAT OF EVAPORATION BY MEASURING THE RADIUS VARIATIONS OF A METAL TIP.VU THIEN BINH; UZAN R; DRECHSLER M et al.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 60; NO 1; PP. 13-23; BIBL. 28 REF.Article

THE SURFACE DIFFUSION OF TUNGSTEN AT VERY HIGH TEMPERATURESVU THIEN BINH; UZAN R; DRECHSLER M et al.1978; J. PHYS., LETTERS; FRA; DA. 1978; VOL. 39; NO 21; PP. L385-L388; ABS. FRE; BIBL. 24 REF.Article

COMMENTS ON GRAIN BOUNDARY GROOVING UNDER THE INFLUENCE OF EVAPORATION (OR CORROSION) BY VU THIEN BINH ET AL.SRINIVASAN SR; VU THIEN BINH; UZAN R et al.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 91; NO 2-3; PP. L32-L39; BIBL. DISSEM.Article

Local heating of single-atom protrusion tips during field electron emissionVU THIEN BINH; PURCELL, S. T; GARDET, G et al.Surface science. 1992, Vol 279, Num 1-2, pp L197-L201, issn 0039-6028Article

Field-emission electron spectroscopy of single-atom tipsVU THIEN BINH; PURCELL, S. T; GARCIA, N et al.Physical review letters. 1992, Vol 69, Num 17, pp 2527-2530, issn 0031-9007Article

TEMPERATURE MEASUREMENT OF MICROCRYSTALS HEATED BY ELECTRON BOMBARDMENT: W TIPS FROM 2800 K TO 3650 KVU THIEN BINH; HEYDE P; DRECHSLER M et al.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 6; PP. 719-724; BIBL. 20 REF.Article

Interactions of low-energy coherent electron beams with nano-scale objects : a study by Fresnel projection microscopyVU THIEN BINH; SEMET, V.Ultramicroscopy. 1998, Vol 73, Num 1-4, pp 107-117, issn 0304-3991Conference Paper

Sensitivity of Fresnel projection microscopy for observations of magnetic nano-particlesPURCELL, S. T; VU THIEN BINH.Journal of magnetism and magnetic materials. 1999, Vol 198-99, pp 617-619, issn 0304-8853Conference Paper

Shaping electron field emission by ultrathin multilayered structure cathodesSEMET, V; VU THIEN BINH; TSU, R et al.Microelectronics journal. 2008, Vol 39, Num 3-4, pp 607-616, issn 0959-8324, 10 p.Conference Paper

Estimations of the characteristics of GHz range nanocantilevers : eigenfrequencies and quality factorsGARCIA, N; LEVANYUK, A. P; MINYUKOV, S. A et al.Surface science. 1995, Vol 328, Num 3, pp 337-342, issn 0039-6028Article

Scanning anode field emission microscopy for studies of planar cathodesSEMET, V; MOUTON, R; VU THIEN BINH et al.International Vacuum Nanoelectronics Conference. 2004, pp 150-151, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Mechanism for diffusion of nanostructures and mesoscopic objects on surfacesBITAR, L; SERENA, P. A; GARCIA-MOCHALES, P et al.Surface science. 1995, Vol 339, Num 1-2, pp 221-232, issn 0039-6028Article

On the electron and metallic ion emission from nanotips fabricated by field-surface-melting technique : experiments on W and Au tipsVU THIEN BINH; GARCIA, N.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 80-90, issn 0304-3991Conference Paper