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au.\*:("Valakh, Mikhail Ya")

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Optical diagnosis of materials and devices for opto-, micro-, and quantum electronics 1997 (Kiev, 13-15 May 1997)Svechnikov, Sergei V; Valakh, Mikhail Ya.SPIE proceedings series. 1998, isbn 0-8194-2808-6, XIII, 564 p, isbn 0-8194-2808-6Conference Proceedings

Diagnostic of non-crystalline films by use interference of raman signal in thin and superthin filmsMITSA, V.SPIE proceedings series. 1998, pp 389-392, isbn 0-8194-2808-6Conference Paper

Effect of lateral inhomogeneity of Barrier height on the photoresponse characteristics of Schottky junctionsHORVATH, Z. J; VO VAN TUYEN.SPIE proceedings series. 1998, pp 65-67, isbn 0-8194-2808-6Conference Paper

Optical properties and electron zone structure of AnXO4 single crystalsHIZHNII, Yu. A; NEDELKO, S. G.SPIE proceedings series. 1998, pp 84-89, isbn 0-8194-2808-6Conference Paper

Raman spectra and effects of electrical field and stress in DQW AlGaAs lasersSEMJONOW, A. J.SPIE proceedings series. 1998, pp 317-323, isbn 0-8194-2808-6Conference Paper

Visible luminescent Si nanocrystals : optical characterization and applicationSVECHNIKOV, S. V; KAGANOVICH, E. B.SPIE proceedings series. 1998, pp 172-181, isbn 0-8194-2808-6Conference Paper

Characterization of layered structures by photoacoustic piezoelectric techniqueSHENDELEVA, M. L.SPIE proceedings series. 1998, pp 484-489, isbn 0-8194-2808-6Conference Paper

Cryogenic spectrometric ellipsometer for studding solid state optical propertiesBELYAEVA, A. I; GREBENNIK, T. G.SPIE proceedings series. 1998, pp 401-407, isbn 0-8194-2808-6Conference Paper

A study of the optical properties of the layered systems by multiangle ellipsometryZABASHTA, L. A.SPIE proceedings series. 1998, pp 501-505, isbn 0-8194-2808-6Conference Paper

Controlling of the state of CoSi2 thin film by laser radiationKNITE, M; MEDVID', A.SPIE proceedings series. 1998, pp 467-470, isbn 0-8194-2808-6Conference Paper

Investigation of refractivity dispersion in glassy As2S5 for infrared opticsROSOLA, I; KIKINESHI, A.SPIE proceedings series. 1998, pp 101-105, isbn 0-8194-2808-6Conference Paper

Nonlinear carrier transport governed non-resonant optical non-linearity in A3B5 crystalsJARASIUNAS, K; SUBACIUS, L.SPIE proceedings series. 1998, pp 118-131, isbn 0-8194-2808-6Conference Paper

Oxygen concentration distribution determination in silicon wafers by semiconductor IR laser spectroscopyDARCHUK, S. D; SIZOV, F. F.SPIE proceedings series. 1998, pp 454-457, isbn 0-8194-2808-6Conference Paper

Random errors behavior for rotating-analyzer ellipsometersBORTCHAGOVSKY, E. G.SPIE proceedings series. 1998, pp 438-448, isbn 0-8194-2808-6Conference Paper

Complete diagnostics of pyroactive structures for smart systems of optoelectronicsBRAVINA, S. L; MOROZOVSKY, N. V.SPIE proceedings series. 1998, pp 420-427, isbn 0-8194-2808-6Conference Paper

Computer aided mode diagnostics and parameters optimization of a picosecond laser set-up on the base of modified sagnak interferometerBOLDOVSKII, D. N; TIKHONOV, E. A.SPIE proceedings series. 1998, pp 506-511, isbn 0-8194-2808-6Conference Paper

Luminescence method for the determination of the current injection component in red GaAs1-xPx light-emitting diodesGLINCHUK, K. D; SUKACH, G. A.SPIE proceedings series. 1998, pp 250-254, isbn 0-8194-2808-6Conference Paper

Optical properties and structure of porous siliconSTASHHUK, V. S; SHEVCHENKO, V. B.SPIE proceedings series. 1998, pp 45-48, isbn 0-8194-2808-6Conference Paper

Study of optical, photoelectrical and gas sensitive properties of porous siliconSMYNTYNA, V. A; VASHPANOV, Yu. A.SPIE proceedings series. 1998, pp 553-557, isbn 0-8194-2808-6Conference Paper

The bases of luminescent diagnostic of dislocation structure of SiC crystalsGORBAN, I. S; MISHINOVA, G. N.SPIE proceedings series. 1998, pp 187-196, isbn 0-8194-2808-6Conference Paper

Polarimetry of inhomogeneous slab of anisotropic mediumKOLISNYCHENKO, B. M; KURASHOV, V. N; MARIENKO, V. V et al.SPIE proceedings series. 1998, pp 458-466, isbn 0-8194-2808-6Conference Paper

Role of growth defects on carrier dynamics : Semiinsulating GaAsMIZEIKIS, V; JARASIUNAS, K; STORASTA, J et al.SPIE proceedings series. 1998, pp 163-170, isbn 0-8194-2808-6Conference Paper

Short-wave emission of Tb3+ as an optical indicator of TFELS matrix changesKHOMCHENKO, V. S; RODIONOV, V. E; TZIRKUNOV, Yu. A et al.SPIE proceedings series. 1998, pp 273-278, isbn 0-8194-2808-6Conference Paper

Influence of different types of surface treatment on photoelectric and optical properties of CdTe crystalsBAIDULLAEVA, A; MOZOL', P. E; VLASENKO, A. I et al.SPIE proceedings series. 1998, pp 53-55, isbn 0-8194-2808-6Conference Paper

Infrared spectroscopy of luminescent porous siliconMAKARA, V. A; STASHHUK, V. S; SHEVCHENKO, V. B et al.SPIE proceedings series. 1998, pp 75-78, isbn 0-8194-2808-6Conference Paper

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