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au.\*:("WALLS JM")

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THE APPLICATION OF SURFACE ANALYTICAL TECHNIQUES TO THIN FILMS AND SURFACE COATINGS = APPLICATION DES METHODES D'ANALYSE DE SURFACE A L'ANALYSE DE COUCHES MINCES ET DE REVETEMENTS SUPERFICIELSWALLS JM.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 80; NO 1-3; PP. 213-220; BIBL. 28 REF.Conference Paper

QUANTITATIVE ANALYSIS OF FIELD-ION MICROGRAPHS USING MOVIE TECHNIQUES.SOUTHWORTH HN; WALLS JM.1977; SURF. SCI.; NETHERL.; DA. 1977; VOL. 67; NO 1; PP. 299-316; BIBL. 14 REF.Article

MAGNIFICATION IN THE FIELD-ION MICROSCOPEWALLS JM; SOUTHWORTH HN.1979; J. PHYS. D; GBR; DA. 1979; VOL. 12; NO 5; PP. 657-667; H.T. 1; BIBL. 11 REF.Article

THE DEVELOPMENT OF A GENERAL THREE-DIMENSIONAL SURFACE UNDER ION BOMBARDMENTSMITH R; WALLS JM.1980; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1980; VOL. 42; NO 2; PP. 235-248; BIBL. 23 REF.Article

THE DEPTH OF SPUTTERING DAMAGE IN TUNGSTEN BY FIELD-ION MICROSCOPY = PROFONDEUR DU DOMMAGE DE PULVERISATION DANS LE TUNGSTENE ETUDIEE PAR MICROSCOPIE IONIQUE A EMISSION DE CHAMPWEBBER RD; WALLS JM.1979; RAD. EFFECTS; GBR; DA. 1979; VOL. 45; NO 1-2; PP. 111-118; BIBL. 39 REF.Article

ABSORPTION AND PHASE IN-LINE HOLOGRAMS: A COMPARISONDUNN P; WALLS JM.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 13; PP. 2171-2174; BIBL. 17 REF.Article

ION TRAJECTORIES IN THE FIELD-ION MICROSCOPE.SMITH R; WALLS JM.1978; J. PHYS. D; G.B.; DA. 1978; VOL. 11; NO 4; PP. 409-419; BIBL. 16 REF.Article

THE OPTIMUM ION SPECIES FOR SPUTTER-CLEANING OR ION PROFILING TUNGSTEN SURFACESWALLS JM; SOUTHWORTH HN.1976; SURF. TECHNOL.; SWITZ.; DA. 1976; VOL. 4; NO 3; PP. 255-268; BIBL. 31 REF.Article

THE PROJECTION GEOMETRY OF THE FIELD-ION IMAGE.SOUTHWORTH HN; WALLS JM.1978; SURF. SCI.; NLD; DA. 1978; VOL. 75; NO 1; PP. 129-140; BIBL. 13 REF.Article

THE MOIRE PATTERN FORMED ON SUPERPOSING A ZONE PLATE WITH A GRATING OR GRID.WALLS JM; SOUTHWORTH HN.1975; OPT. ACTA; G.B.; DA. 1975; VOL. 22; NO 7; PP. 591-601; ABS. FR. ALLEM.; BIBL. 22 REF.Article

A COMBINED FIM, AES AND LEED STUDY OF THE STRUCTURE AND COMPOSITION OF ION BOMBARDED TUNGSTEN SURFACESWALLS JM; MARTIN AD; SOUTHWORTH HN et al.1975; SURF. SCI.; NETHERL.; DA. 1975; VOL. 50; NO 2; PP. 360-378; BIBL. 1 P. 1/2Article

THE MOIRE PATTERN PRODUCED BY OVERLAPPING ZONE PLATESLEIFER I; WALLS JM; SOUTHWORTH HN et al.1973; OPT. ACTA; G.B.; DA. 1973; VOL. 20; NO 1; PP. 33-47; ABS. FR. ALLEM.; BIBL. 15 REF.Serial Issue

SPUTTER-DEPT PROFILING IN AES: DEPENDENCE OF DEPTH RESOLUTION ON ELECTRON AND ION BEAM GEOMETRYDUNCAN S; SMITH R; SYKES DE et al.1983; SURFACE AND INTERFACE ANALYSIS; ISSN 0142-2421; GBR; DA. 1983; VOL. 5; NO 2; PP. 71-76; BIBL. 18 REF.Article

FIELD-ION MICROSCOPE OBSERVATIONS OF HELIUM ION BOMBARDMENT DAMAGE IN TUNGSTEN.WALLS JM; BOOTHBY RM; SOUTHWORTH HN et al.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 61; NO 2; PP. 419-434; BIBL. 22 REF.Article

THE PREPARATION OF FIELD ELECTRON/FIELD-ION EMITTERS BY ION ETCHING.WALLS JM; SOUTHWORTH HN; RUSHTON GJ et al.1974; VACUUM; G.B.; DA. 1974; VOL. 24; NO 10; PP. 475-479; BIBL. 12 REF.; (CONF. LOW ENERGY ION-SURF. INTERACTIONS. PROC.)Conference Paper

THE DEVELOPMENT OF SURFACE TOPOGRAPHY USING TWO ION BEAMSMAKH SS; SMITH R; WALLS JM et al.1982; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1982; VOL. 17; NO 6; PP. 1689-1699; BIBL. 18 REF.Article

THE EROSION OF AMORPHOUS AND CRYSTALLINE SURFACES BY ION BOMBARDMENT = EROSION DE SURFACES AMORPHES ET CRISTALLINES PAR BOMBARDEMENT IONIQUESMITH R; VALKERING TP; WALLS JM et al.1981; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1981; VOL. 44; NO 4; PP. 879-893; BIBL. 15 REF.Article

THE DEVELOPMENT OF SURFACE SHAPE DURING SPUTTERDEPTH PROFILING IN AUGER ELECTRON SPECTROSCOPYMAKH SS; SMITH R; WALLS JM et al.1980; SURF. INTERFACE ANAL.; USA; DA. 1980; VOL. 2; NO 3; PP. 115-119; BIBL. 25 REF.Article

THE SHAPE OF FIELD-ION EMITTERSWEBBER RD; SMITH R; WALLS JM et al.1979; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1979; VOL. 12; NO 9; PP. 1589-1595; BIBL. 17 REF.Article

RING COUNTING IN FIELD-ION MICROGRAPHSWEBBER RD; WALLS JM; SMITH R et al.1978; J. MICR.; GBR; DA. 1978; VOL. 113; NO 3; PP. 291-299; BIBL. 10 REF.Article

IMPROVED SPUTTER-DEPTH PROFILES USING TWO ION GUNSSYKES DE; HALL DD; THURSTANS RE et al.1980; APPL. SURF. SCI.; NLD; DA. 1980; VOL. 5; NO 1; PP. 103-106; BIBL. 12 REF.Article

A MOIRE INTERPRETATION OF FIELD-ION MICROSCOPYWALLS JM; LEIFER I; SOUTHWORTH HN et al.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 4; PP. 915-927; BIBL. 13 REF.Serial Issue

COMPARISON OF WEAR BEHAVIOUR OF SINGLE- AND MULTILAYER COATED CARBIDE CUTTING TOOLSCHUBB JP; BILLINGHAM J; HALL DD et al.1980; MET. TECHNOL.; GBR; DA. 1980-07; VOL. 7; NO 7; PP. 293-299; BIBL. 15 REF.Article

COMPARISON OF WEAR BEHAVIOUR OF SINGLE- AND MULTILAYER COATED CARBIDE CUTTING TOOLS = COMPARAISON DU COMPORTEMENT A L'USURE DES OUTILS DE COUPE EN CARBURE AVEC UNE ET PLUSIEURS COUCHES DE REVETEMENTSCHUBB JP; BILLINGHAM J; HALL DD et al.1980; MET. TECHNOL.; ISSN 0307-1693; GBR; DA. 1980; VOL. 7; NO 7; PP. 293-299; ABS. GER/FRE; BIBL. 15 REF.Article

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