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Steering attosecond electron wave packets with lightKIENBERGER, R; HENTSCHEL, M; DRESCHER, M et al.Science (Washington, D.C.). 2002, Vol 297, Num 5584, pp 1144-1148, issn 0036-8075Article

Atomic transient recorderKIENBERGER, R; GOULIELMAKIS, E; DRESCHER, M et al.Nature (London). 2004, Vol 427, Num 6977, pp 817-821, issn 0028-0836, 5 p.Article

Time-resolved atomic inner-shell spectroscopyDRESCHER, M; HENTSCHEL, M; KIENBERGER, R et al.Nature (London). 2002, Vol 419, Num 6909, pp 803-807, issn 0028-0836Article

Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopyWONISCH, A; WESTERWALBESLOH, Th; HACHMANN, W et al.Thin solid films. 2004, Vol 464-65, pp 473-477, issn 0040-6090, 5 p.Conference Paper

Direct measurement of light wavesGOULIELMAKIS, E; UIBERACKER, M; KRAUSZ, F et al.Science (Washington, D.C.). 2004, Vol 305, Num 5688, pp 1267-1269, issn 0036-8075, 3 p.Article

Effect of substrate roughness on Mo/Si multilayer optics for EUVL produced by UHV-e-beam evaporation and ion polishingKLEINEBERG, U; WESTERWALBESLOH, Th; HACHMANN, W et al.Thin solid films. 2003, Vol 433, Num 1-2, pp 230-236, issn 0040-6090, 7 p.Conference Paper

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