EMPIRICAL FORMULA FOR THE CALCULATION OF SECONDARY ION YIELDS FROM OXIDIZED METAL SURFACES AND METAL OXIDES.PLOG C; WIEDMANN L; BENNINGHOVEN A et al.1977; SURF. SCI.; NETHERL.; DA. 1977; VOL. 67; NO 2; PP. 565-580; BIBL. 35 REF.Article

CONTAMINATION OF CLEAN METAL SURFACES ASSOCIATED WITH ELECTRON BOMBARDMENT IN CONVENTIONAL AES ANALYSIS.WIEDMANN L; GANSCHOW O; BENNINGHOVEN A et al.1978; J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1978; VOL. 13; NO 4; PP. 243-246; BIBL. 3 REF.Article

OXIDATION OF COBALT AT ROOM TEMPERATURE, STUDIED BY COMBINED STATIC SIMS, STATIC AES, XPS AND WORK FUNCTION INVESTIGATIONSNAI LI WANG; KAISER U; GANSCHOW O et al.1983; SURFACE SCIENCE; ISSN 0039-6028; NLD; DA. 1983; VOL. 124; NO 1; PP. 51-67; BIBL. 34 REF.Article

COMBINED SIMS, AES, AND XPS INVESTIGATIONS OF TANTALUM OXIDE LAYERSBISPINCK H; GANSCHOW O; WIEDMANN L et al.1979; APPL. PHYS.; DEU; DA. 1979; VOL. 18; NO 2; PP. 113-117; BIBL. 28 REF.Article

STATIC AES- THE ADEQUATE MODE OF AES FOR SURFACE REACTION AND SUBMONOLAYER ADSORPTION STUDIES.BENNINGHOVEN A; GANSCHOW O; STEFFENS P et al.1978; J. ELECTRON SPECTROSC RELAT. PHENOMENA; NLD; DA. 1978; VOL. 14; NO 1; PP. 19-25; BIBL. 15 REF.Article

Surface and in-depth analysis of hydrogenated carbon layers on silicon and germanium by mass and electron spectroscopySANDER, P; ALTEBOCKWINKEL, M; STORM, W et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1989, Vol 7, Num 3, pp 517-528, issn 0734-211X, 12 p.Article

Surface characterization of carbon-supported iron catalysts for carbon monoxide hydrogenation : influence of catalyst distribution and coal mineralsSCHWAR, J; JAHN, P. W; WIEDMANN, L et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1991, Vol 9, Num 2, pp 238-249, issn 0734-2101Article

A versatile spectrometer system for quantitative surface and in-depth analysis with secondary ion and secondary neutral mass spectroscopy, Auger electron and x-ray photoelectrom spectroscopySANDER, P; ALTEBOCKWINKEL, M; STORM, W et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1989, Vol 7, Num 6, pp 3305-3311, issn 0734-2101Article

Oxidation of cobalt at room temperature, studied by combined static SIMS, static AES, XPS and work function investigations = Détermination des conditions d'oxydation du cobalt à température ambiante en combinant les méthodes SIMS, Auger, XPS = Ermittlung der Oxidationsverhaeltnisse von Kobalt bei Raumtemperatur durch Anwendung kombinierter SIMS, AES-, XPS- und Arbeitsfunktions-MethodenWANG, N.L; KAISER, U; GANSCHOW, O et al.Surface science. 1983, Vol 124, Num 1, pp 51-67, issn 0039-6028Article

The influence of bombardment energy on preferential sputtering and depth profile analysis of mercury cadmium telluride (MCT) with SNMS, AES and XPSSTORM, W; ALTEBOCKWINKEL, M; WIEDMANN, L et al.Vacuum. 1990, Vol 41, Num 7-9, pp 1785-1787, issn 0042-207X, 3 p.Conference Paper

Depth profile analysis of Pt, Cu, and Au overlayers on p-Hg_1-xCd_xTeSTORM, W; ALTEBOCKWINKEL, M; WIEDMANN, L et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1991, Vol 9, Num 1, pp 14-20, issn 0734-2101, 7 p.Article

A combined instrument for the investigation of catalytic reactions by means of gas chromatography, secondary ion and gas phase mass spectrometry: Auger and photoelectron spectroscopy, and ion scattering spectroscopyGANSCHOW, O; JEDE, R; AN, L. D et al.Journal of vacuum science and technology. A, vacuum, surfaces, and films. 1983, Vol 1, Num 3, pp 1491-1506Article

Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimideWOLANY, D; FLADUNG, T; DUDA, L et al.Surface and interface analysis. 1999, Vol 27, Num 7, pp 609-617, issn 0142-2421Article

Combined depth profile analysis with SNMS, SIMS and XPS : preferential sputtering and oxygen transport in binary metal oxide multilayer systemsALBERS, T; NEUMANN, M; LIPINSKY, D et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 9-13, issn 0142-2421Conference Paper

Analysis of passivating oxide and surface contaminants on GaAs (100) by temperature-dependent and angle resolved x-ray photoelectron spectroscopy, and time-of-flight secondary ion mass spectrometrySCHRÖDER, F; STORM, W; ALTEBOCKWINKEL, M et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1992, Vol 10, Num 4, pp 1291-1296, issn 0734-211XConference Paper

Clinical evaluation of a DNA probe assay for the philadelphia (Ph¹) translocation in chronic myelogenous leukemiaBLENNERHASSETT, G. T; FURTH, M. E; GREAVES, M. F et al.Leukemia. 1988, Vol 2, Num 10, pp 648-657, issn 0887-6924Article