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ORIGIN OF APOLLO 17 ROCKS AND SOILS.PHILPOTTS JA; SCHUHMANN S; KOUNS CW et al.sdGEOCHIM. COSMOCHIM. ACTA; G.B.; (PROC. 5. LUNAR SCI. CONF.; HOUSTON; 1974),1974, P. 1255 A 1267Miscellaneous

Designing cofired multilayer electrostrictive actuators for reliabilityWINZER, S. R; SHANKAR, N; RITTER, A. P et al.Journal of the American Ceramic Society. 1989, Vol 72, Num 12, pp 2246-2257, issn 0002-7820Conference Paper

Diffuseness as a useful parameter for relaxor ceramicsPILGRIM, S. M; SUTHERLAND, A. E; WINZER, S. R et al.Journal of the American Ceramic Society. 1990, Vol 73, Num 10, pp 3122-3125, issn 0002-7820Article

Simulating electrostrictive deformable mirrors : I. Nonlinear static analysisHOM, C. L; DEAN, P. D; WINZER, S. R et al.Smart materials and structures. 1999, Vol 8, Num 5, pp 691-699, issn 0964-1726Article

Liquid-phase sintering of aluminium nitride by europium oxide additivesVANDAMME, N. S; RICHARD, S. M; WINZER, S. R et al.Journal of the American Ceramic Society. 1989, Vol 72, Num 8, pp 1409-1414, issn 0002-7820Article

High-strain-rate behavior of hydrated cement pastesJAWED, I; CHILDS, G; RITTER, A et al.Cement and concrete research. 1987, Vol 17, Num 3, pp 433-440, issn 0008-8846Article

Fabrication of optically transparent and electrooptic strontium barium niobate ceramicsVANDAMME, N. S; SUTHERLAND, A. E; JONES, L et al.Journal of the American Ceramic Society. 1991, Vol 74, Num 8, pp 1785-1792, issn 0002-7820Article

Calculation of quasi-static electomechanical coupling coefficients for electrostrictive ceramic materialsHOM, C. L; PILGRIM, S. M; NATARAJAN SHANKAR et al.IEEE transactions on ultrasonics, ferroelectrics, and frequency control. 1994, Vol 41, Num 4, pp 542-551, issn 0885-3010Article

Electrochemical testing and modeling of a Pb(Mg1/3Nb2/3)O3-PbTiO3-BaTiO3 relaxor ferroelectricBROWN, S. A; HOM, C. L; MASSUDA, M et al.Journal of the American Ceramic Society. 1996, Vol 79, Num 9, pp 2271-2282, issn 0002-7820Article

Science-based MEMS reliability methodologyTANNER, D. M; PARSON, T. B; CORWIN, A. D et al.Microelectronics and reliability. 2007, Vol 47, Num 9-11, pp 1806-1811, issn 0026-2714, 6 p.Conference Paper

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