UNGEBUNGSBELASTUNG DURCH KERNKRAFTWERKE = ACTION DES CENTRALES NUCLEAIRES SUR LEUR ENVIRONNEMENTWOBRAUSCHEK P.1974; ELEKTROTECH. U. MASCH.-BAU; OSTERR.; DA. 1974; VOL. 91; NO 6; PP. 324-328; BIBL. 11 REF.Article

Total reflection x-ray fluorescence analysis : a reviewWOBRAUSCHEK, P.X-ray spectrometry. 2007, Vol 36, Num 5, pp 289-300, issn 0049-8246, 12 p.Article

X-RAY FLUORESCENCE ANALYSIS WITH A LINEAR POLARIZED BEAM AFTER BRAGG REFLECTION FROM A FLAT OR A CURVED SINGLE CRYSTALWOBRAUSCHEK P; AIGINGER H.1983; X-RAY SPECTROMETRY; ISSN 0049-8246; GBR; DA. 1983; VOL. 12; NO 2; PP. 72-78; BIBL. 12 REF.Article

TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTSWOBRAUSCHEK P; AIGINGER H.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 6; PP. 852-855; BIBL. 8 REF.Article

X-RAY FLUORESCENCE ANALYSIS IN THE NANOGRAM REGION WITH A TOTAL REFLECTED AND A BRAGG POLARIZED PRIMARY BEAMAIGINGER H; WOBRAUSCHEK P.1981; J. RADIOANAL. CHEM.; ISSN 0022-4081; CHE; DA. 1981; VOL. 61; NO 1-2; PP. 281-293; BIBL. 9 REF.Article

X-RAY FLUORESCENCE ANALYSIS USING INTENSIVE LINEAR POLARIZED MONOCHROMATIC X-RAYS AFTER BRAGG REFLECTIONWOBRAUSCHEK P; AIGINGER H.1980; X-RAY SPECTROM.; GBR; DA. 1980; VOL. 9; NO 2; PP. 57-59; BIBL. 3 REF.Article

TOTAL REFLEXIONS-ROENTGENFLUORESZENZANALYSE = ANALYSE PAR FLUORESCENCE RX AVEC REFLEXION TOTALEWOBRAUSCHEK P; AIGINGER H.1979; X-RAY SPECTROM.; GBR; DA. 1979; VOL. 8; NO 2; PP. 57-62; ABS. ENG; BIBL. 7 REF.Article

ENERGY-DISPERSIVE FLUORESCENCE ANALYSIS USING BRAGG-REFLECTED POLARIZED X-RAYSAIGINGER H; WOBRAUSCHEK P; BRAUNER C et al.1974; NUCL. INSTRUM. METHODS; NETHERL.; DA. 1974; VOL. 120; NO 3; PP. 541-542; BIBL. 2 REF.Article

Total reflection X-ray fluorescence analysis with polarized radiationWOBRAUSCHEK, P.Journal of trace and microprobe techniques. 1995, Vol 13, Num 2, pp 83-96, issn 0733-4680Article

Quantitative X-ray fluorescence analysis of Fe-Al and Cu-Fe binary alloys using selective excitationLADISICH, W; WOBRAUSCHEK, P.X-ray spectrometry. 1993, Vol 22, Num 3, pp 151-155, issn 0049-8246Article

Total reflection X-ray fluorescence analysis of the rare earth elements by K-shell excitationKREGSAMER, P; WOBRAUSCHEK, P.Spectrochimica acta. Part B : Atomic spectroscopy. 1991, Vol 46, Num 10, pp 1361-1367, issn 0584-8547Conference Paper

Principles and development of total reflection X-ray fluorescence analysisAIGINGER, H; WOBRAUSCHEK, P; STRELI, C et al.Analytical sciences. 1995, Vol 11, Num 3, pp 471-476, issn 0910-6340Conference Paper

Light element analysis with a new spectrometer for total-reflection X-ray fluorescenceSTRELI, C; AIGINGER, H; WOBRAUSCHEK, P et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1993, Vol 48, Num 2, pp 163-170, issn 0584-8547Conference Paper

Measurement of the spectral distribution of a diffraction X-ray tube with a solid-state detectorGÖRGL, R; WOBRAUSCHEK, P; KREGSAMER, P et al.X-ray spectrometry. 1992, Vol 21, Num 1, pp 37-42, issn 0049-8246Article

Instrumental developments in total reflection X-ray fluorescence analysis for K-lines from oxygen to the rare earth elementsWOBRAUSCHEK, P; KREGSAMER, P; STRELI, C et al.X-ray spectrometry. 1991, Vol 20, Num 1, pp 23-28, issn 0049-8246, 6 p.Conference Paper

Progress in X-ray fluorescence analysisWOBRAUSCHEK, P; AIGINGER, H; OWESNY, G et al.Journal of trace and microprobe techniques. 1988, Vol 6, Num 3, pp 295-336, issn 0733-4680Article

A new X-ray tube for efficient excitation of low-Z-elements with total reflection X-ray fluorescence analysisSTRELI, C; WOBRAUSCHEK, P; AIGINGER, H et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1991, Vol 46, Num 10, pp 1351-1359, issn 0584-8547Conference Paper

Novel methods of TXRF analysis for silicon wafer surface inspectionFABRY, L; PAHLKE, S; KOTZ, L et al.Fresenius' journal of analytical chemistry. 1999, Vol 363, Num 1, pp 98-102, issn 0937-0633Article

Experimental X-ray tube spectra : Special issue on micro- and ultratrace X-ray fluorescence analysisGÖRGL, R; WOBRAUSCHEK, P; STRELI, C et al.Journal of trace and microprobe techniques. 1996, Vol 14, Num 3, pp 589-604, issn 0733-4680Article

Synchrotron radiation-induced TXRF of reactor steel samplesPEPPONI, G; WOBRAUSCHEK, P; STRELI, C et al.X-ray spectrometry. 2001, Vol 30, Num 4, pp 267-272, issn 0049-8246Article

Energy-dispersive measurement and comparison of different spectra from diffraction X-ray tubesGÖRGEL, R; WOBRAUSCHEK, P; STRELI, C et al.X-ray spectrometry. 1995, Vol 24, Num 4, pp 157-162, issn 0049-8246Article

Direct determination of lead in whole human blood by total reflection X-ray fluorescence spectrometryAYALA, R. E; ALVAREZ, E. M; WOBRAUSCHEK, P et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1991, Vol 46, Num 10, pp 1429-1432, issn 0584-8547Conference Paper

Theoretical considerations about total reflection X-Ray fluorescence for light element analysis at various excitation energies and experimental resultsSTRELI, C; WOBRAUSCHEK, P; RANDOLF, G et al.Analytical sciences. 1995, Vol 11, Num 3, pp 477-481, issn 0910-6340Conference Paper

A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline LSTRELI, C; PEPPONI, G; WOBRAUSCHEK, P et al.X-ray spectrometry. 2005, Vol 34, Num 5, pp 451-455, issn 0049-8246, 5 p.Conference Paper

Total-reflection X-ray fluorescence analysis using special X-ray sourcesWOBRAUSCHEK, P; KREGSAMER, P; LADISICH, W et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1993, Vol 48, Num 2, pp 143-151, issn 0584-8547Conference Paper