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Ellipsometric characterization of thin porous GaAs layers formed in HF solutionsZANGOOIE, S; WOOLLAM, J. A.Journal of materials science letters. 2000, Vol 19, Num 24, pp 2171-2173, issn 0261-8028Article

Study of temperature-dependent ultrathin oxide growth on Si(111) using variable-angle spectroscopic ellipsometryDE, B. N; WOOLLAM, J. A.Thin solid films. 1990, Vol 193-194, Num 1-2, pp 312-317, issn 0040-6090, 6 p., . 1Conference Paper

Ellipsometric study of Al2O3/Ag/Si and SiO2/Ag/quartz ashed in an oxygen plasmaDE, B. N; WOOLLAM, J. A.Journal of applied physics. 1989, Vol 66, Num 11, pp 5602-5607, issn 0021-8979Article

Optimized ellipsometric analysis of computer disk structuresPING HE; WOOLLAM, J. A.Applied physics communications. 1990, Vol 10, Num 3, pp 207-220, issn 0277-9374Article

Spectroscopic ellipsometry studies of HF treated Si (100) surfacesHUADE YAO; WOOLLAM, J. A; ALTEROVITZ, S. A et al.Applied physics letters. 1993, Vol 62, Num 25, pp 3324-3326, issn 0003-6951Article

Anticorrelation of Shubnikov-de Haas amplitudes and negative magnetoresistance magnitudes in intercalated pitch based graphite fibersWOOLLAM, J. A; NATARAJAN, V; BRANDT, B et al.Applied physics communications. 1986, Vol 6, Num 2-3, pp 121-129, issn 0277-9374Article

Diamondlike carbon: a bibliography of published papers and reportsWOOLLAM, J. A; HAO CHANG; NATARAJAN, V et al.Applied physics communications. 1985, Vol 5, Num 4, pp 263-283, issn 0277-9374Article

Dielectric properties of diamondlikë carbon prepared by rf plasma depositionLAMB, J. D; WOOLLAM, J. A.Journal of applied physics. 1985, Vol 57, Num 12, pp 5420-5422, issn 0021-8979Article

Interfacial effects due to tunneling to insulator gap states in amorphous carbon on silicon metal-insulator-semiconductor structuresAZIM KHAN, A; WOOLLAM, J. A; CHUNG, Y et al.Journal of applied physics. 1984, Vol 55, Num 12, pp 4299-4303, issn 0021-8979Article

Prospects for IR emissivity control using electrochromic structuresHALE, J. S; WOOLLAM, J. A.Thin solid films. 1999, Vol 339, Num 1-2, pp 174-180, issn 0040-6090Article

Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatingsMEMARZADEH, K; WOOLLAM, J. A; BELKIND, A et al.Journal of applied physics. 1988, Vol 64, Num 7, pp 3407-3410, issn 0021-8979Article

High frequency capacitance-voltage and conductance-voltage characteristics of d.c. sputter deposited a carbon/silicon MIS structuresAZIM KHAN, A; WOOLLAM, J. A; CHUNG, Y et al.Solid-state electronics. 1984, Vol 27, Num 4, pp 385-391, issn 0038-1101Article

Thermal diffusivity measurements by photothermal laser beam deflection (PTD) : data analysis using the Levenberg-Marquardt algorithmMACHLAB, H; MCGAHAN, W. A; WOOLLAM, J. A et al.Thin solid films. 1992, Vol 215, Num 1, pp 103-107, issn 0040-6090Article

Optical properties of thin films of methalene-blue, and crystal-violet organic dyes using variable angle spectroscopic ellisometryBEHFROOZ, M. R; WOOLLAM, J. A.Applied physics communications. 1992, Vol 11, Num 2-3, pp 117-126, issn 0277-9374Article

Optical-absorption edge and disorder effects in hydrogenated amorphous diamondlike carbon filmsDATTA, T; WOOLLAM, J. A; NOTOHAMIPRODJO, W et al.Physical review. B, Condensed matter. 1989, Vol 40, Num 9, pp 5956-5960, issn 0163-1829, 5 p.Article

Amorphous diamondlike carbon (a-C:H): a possible Cohen-Fritzsche-Ovshinsky systemDATTA, T; WOOLLAM, J. A; NOTOHAMIPRODIO, W et al.Applied physics communications. 1988, Vol 8, Num 2-3, pp 139-147, issn 0277-9374Article

Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon filmsDILLON, R. O; WOOLLAM, J. A; KATKANANT, V et al.Physical review. B, Condensed matter. 1984, Vol 29, Num 6, pp 3482-3489, issn 0163-1829Article

Magnetooptics of multilayer systemsMCGAHAN, W. A; WOOLLAM, J. A.Applied physics communications. 1989, Vol 9, Num 1-2, pp 1-25, issn 0277-9374Article

Analysis of variable angle spectroscopic ellipsometric measurements on uncoated magneto-optic materials = Analyse des mesures par ellipsométrie spectroscopique à angle variable des matériaux magnéto-optiques non revêtusMCGAHAN, W. A; SHAN, Z. S; WOOLLAM, J. A et al.Applied physics communications. 1988, Vol 8, Num 4, pp 209-216, issn 0277-9374Article

Variable wavelength, variable angle ellipsometry including a sensitivities correlation testBU-ABBUD, G. H; BASHARA, N. M; WOOLLAM, J. A et al.Thin solid films. 1986, Vol 138, Num 1, pp 27-41, issn 0040-6090Article

Annealing time dependence of optical and magneto-optical properties of Bi-subsituted garnet filmsMCGAHAN, W. A; LIANG-YAO CHEN; WOOLLAM, J. A et al.Applied physics communications. 1992, Vol 11, Num 4, pp 549-556, issn 0277-9374Article

Ellipsometric and magneto-optic properties of sputtered dysprosium-iron multilayers = Propriétés ellipsométriques et magnétooptiques de multicouches dysprosium-fer pulvériséesTIWALD, T. E; WOOLLAM, J. A; SELLMYER, D. J et al.Journal of applied physics. 1988, Vol 63, Num 8, pp 3215-3217, issn 0021-8979, 2AConference Paper

Interactions of amorphous TaxCu1-x (x=0.93 and 0.80) alloy films with Au overlayers and GaAs substrates = Interactions des couches d'alliages amorphes TaxCux (x=0,93 et 0,80) avec des surcouches d'Au et des substrats de GaAsOH, J. E; WOOLLAM, J. A; POUCH, J. J et al.Applied physics letters. 1987, Vol 50, Num 24, pp 1722-1724, issn 0003-6951Article

Analytic solutions for optimized ellipsometric measurementsALTEROVITZ, S. A; BU-ABBUD, G. H; WOOLLAM, J. A et al.Thin solid films. 1985, Vol 123, Num 3, pp 183-195, issn 0040-6090Article

Optical properties of diamondlike carbon films: an ellipsometric studyAZIM KHAN, A; MATHINE, D; WOOLLAM, J. A et al.Physical review. B, Condensed matter. 1983, Vol 28, Num 12, pp 7229-7235, issn 0163-1829Article

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