FEHLERQUELLEN IN OPTOELEKTRONISCHEN WANDLERN ZUR LAENGENMESSUNG = SOURCES D'ERREUR DANS LES CONVERTISSEURS OPTOELECTRIQUES POUR LA MESURE DES LONGUEURSWRONKOWSKI L.1980; FEINGERAETETECHNIK; ISSN 0014-9683; DDR; DA. 1980; VOL. 29; NO 9; PP. 417-419; BIBL. 4 REF.Article

AN ANALYSIS OF THE EFFECT OF DIAPHRAGM SHAPE ON THE CONTRAST OF FILTERED MOIRE FRINGESWRONKOWSKI L.1983; OPTICA ACTA; ISSN 0030-3909; GBR; DA. 1983; VOL. 30; NO 1; PP. 85-95; ABS. FRE/GER; BIBL. 15 REF.Article

CINECAMERA AS A MATHEMATIC OPERATOR OF DIFFERENTIAL EQUATIONS OF DYNAMIC SYSTEMS OF MECHANICAL MEASURING DEVICESWRONKOWSKI L.1972; FILM. DE RECH.; ALLEM.; DA. 1972; VOL. 7; NO 6; PP. 555-561; ABS. FR. ALLEMSerial Issue

Diffraction model of an optoelectronic displacement measuring transducerWRONKOWSKI, L.Optics and laser technology. 1995, Vol 27, Num 2, pp 81-88, issn 0030-3992Article

Fresnel images of binary diffraction gratings with open ratio greater than 0.5WRONKOWSKI, L.Journal of modern optics (Print). 1993, Vol 40, Num 3, pp 537-542, issn 0950-0340Article

Fresnel images of a binary diffraction grating with open ratio less than 0.5WRONKOWSKI, L.Journal of modern optics (Print). 1987, Vol 34, Num 8, pp 1057-1065, issn 0950-0340Article

Signal transducing in optoelectronic measurement systems based on the moiré phenomenonWRONKOWSKI, L.Optical engineering (Bellingham. Print). 1992, Vol 31, Num 3, pp 505-515, issn 0091-3286Article

Fresnel images of a binary diffraction grating with open ratio 0.5WRONKOWSKI, L.Journal of modern optics (Print). 1988, Vol 35, Num 8, pp 1417-1422, issn 0950-0340Article

SONAE PROPERTIES OF FRESNEL IMAGES OF A SQUARE WAVE AMPLITUDE GRATINGPATORSKI K; WRONKOWSKI L; DOBOSZ M et al.1982; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1982; VOL. 29; NO 5; PP. 565-567; BIBL. 11 REF.Article

Opto-electronic displacement gauge based on speckle interferometerWRONKOWSKI, L; TKACZYK, T; OLSZAK, A et al.Optics and lasers in engineering. 1999, Vol 32, Num 1, pp 65-77, issn 0143-8166Article