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Optical measurement systems for industrial inspection VI (15-18 June 2009, Munich, Germany)Lehmann, Peter H.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 2 vol, 2, isbn 978-0-8194-7672-2 0-8194-7672-2Conference Proceedings

Development of 3D Control of a Tiny Dew Droplet by Scattered Laser LightMATSUMOTO, Shigeaki.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892W.1-73892W.10, 2Conference Paper

Makyoh-topography studies of the morphology of periodic and quasi-periodic surfacesRIESZ, Ferenc.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892M.1-73892M.8, 2Conference Paper

O3A (optics for arts, architecture, and archaeology II)Salimbeni, Renzo; Pezzati, Luca.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7391, issn 0277-786X, isbn 978-0-8194-7674-6 0-8194-7674-9, 1Vol, various pagings, isbn 978-0-8194-7674-6 0-8194-7674-9Conference Proceedings

New metrology approach for the production of aspheric lensesBEUTLER, Andreas.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 738918.1-738918.6, 2Conference Paper

Optical measurement systems for industrial inspection (Munich, 16-17 June 1999)Kujawińska, Małgorzata; Osten, Wolfgang.SPIE proceedings series. 1999, isbn 0-8194-3310-1, IX, 394 p, isbn 0-8194-3310-1Conference Proceedings

Calibration method for accurate optical measurement of thickness profile for paper industryGRAEFFE, Jussi.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 738920.1-738920.9, 2Conference Paper

Comparison of carved panels from two Irish high crosses using laser scansDAUBOS, Thierry; CROININ, Dáibhí O.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7391, issn 0277-786X, isbn 978-0-8194-7674-6 0-8194-7674-9, 1Vol, 73910N.1-73910N.9Conference Paper

Multiple object image segmentation algorithm based on wavelet theoryWANG, W; WANG, Z.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892R.1-73892R.9, 2Conference Paper

Photo-Thermal Measurement of Absorptance Losses, Temperature induced Wavefront Deformation and Compaction in DUV-OpticsSCHÄFER, Bernd; FLÖTER, Bernhard; MANN, Klaus et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73891D.1-73891D.10, 2Conference Paper

Polarized optical scattering measurements of metallic nanoparticles upon a silicon waferLIU, Cheng-Yang; FU, Wei-En.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892C.1-73892C.8, 2Conference Paper

Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs and performancesGALEANO ZEA, July A; SANDOZ, Patrick.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73891N.1-73891N.8, 2Conference Paper

Real-time defect detection in transparent multi-layer polymer films using structured illumination and 1D filteringMICHAELI, Walter; BERDEL, Klaus; OSTERBRINK, Oliver et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73891T.1-73891T.9, 2Conference Paper

Optical 3-D shape measurement for dynamic object using color fringe pattern projection and empirical mode decompositionXIANG ZHOU; HONG ZHAO; PENGFEI ZHANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73890D.1-73890D.9, 2Conference Paper

Profilometry of semiconductor components by two-colour holography with Bi12TiO20 crystalsPRETO, André Oliveira; ACEDO BARBOSA, Eduardo.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73890R.1-73890R.7, 2Conference Paper

Small lens testing method using phase shift shearing interferometerHANAYAMA, Ryohei; ISHII, Katsuhiro; MATSUDA, Kiyofumi et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73890Y.1-73890Y.8, 2Conference Paper

Study on Laser Vision Measurement Technology of Large-size Workpiece StraightnessZHOU, Xinglin; YE, Shenghua; QU XINGHUA et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892B.1-73892B.6, 2Conference Paper

Combined Stereovision and Phase Shifting Method: Use of a Visibility-Modulated Fringe PatternXU HAN; PEISEN HUANG.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73893H.1-73893H.10, 2Conference Paper

Fabrication and optical characteristics of silicon-based two-dimensional photonic crystal wavelength division multiplexing splitterLIU, Cheng-Yang.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892D.1-73892D.8, 2Conference Paper

High precision alignment technique through quality image analysisARASA, J; OTEO, E; BLANCO, P et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892L.1-73892L.5, 2Conference Paper

Industrial Inspections by Speckle Interferometry: General Requirements and a Case StudyVIOTTI, Matias R; ALBERTAZZI G., Armando.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73890G.1-73890G.15, 2Conference Paper

Measurement of temperature, refractive index, density distribution and convective heat Transfer coefficient around a vertical wire by Michelson InterferometerMADANIPOUR, K; FATEHI, S; PARVIN, P et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892X.1-73892X.8, 2Conference Paper

Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithmARAI, Y; TSUTSUMI, Y; YOKOZEKI, S et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73890I.1-73890I.9, 2Conference Paper

Parameter determination of biconvex lenses using confocal imagingCHHANIWAL, Vani K; ANAND, Arun.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 738911.1-738911.8, 2Conference Paper

Prospects and Limits of the Rayleigh Fourier Approach for Diffraction Modelling in Scatterometry and LithographyBISCHOFF, Joerg.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7390, issn 0277-786X, isbn 978-0-8194-7673-9 0-8194-7673-0, 1Vol, 73901E.1-73901E.8Conference Paper

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