Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("X RAY DIFFRACTOMETER")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 444

  • Page / 18

Export

Selection :

  • and

TRIPLE CRYSTAL DIFFRACTOMETER INVESTIGATIONS OF SILICON CRYSTALS WITH DIFFERENT COLLIMATOR-ANALYZER ARRANGEMENTS = DREIKRISTALLDIFFRAKTOMETER-UNTERSUCHUNGEN VON SILIZIUMKRISTALLEN MIT VERSCHIEDENEN KOLLIMATOR-ANALYSATOR-ANORDNUNGEN = EXAMEN DES CRISTAUX DE SILICIUM AU DIFFRACTOMETRE A TROIS CRISTAUX POUR DIFFERENTES POSITIONS DU COLLIMATEUR ET DE L'ANALYSEURZAUMSEIL P; WINTER U.1982; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1982-04; VOL. 70; NO 2; PP. 497-505; BIBL. 12 REF.Article

THE INFLUENCE OF THE DISPERSION AND VERTICAL DIVERGENCE ON THE REFLECTION CURVE OF A DOUBLE-CRYSTAL ARRANGEMENT = DER EINFLUSS DER DISPERSION UND DER VERTIKALDIVERGENZ AUF DIE REFLEXIONSKURVE EINER DOPPELKRISTALLANORDNUNG = INFLUENCE DE LA DISPERSION ET DE LA DIVERGENCE VERTICALE SUR LA COURBE DE REFLEXION D'UNE STRUCTURE BICRISTALLINEBRUEMMER O; EISENSCHMIDT C; NIEBER J et al.1982; CRYST. RES. TECH.; DDR; DA. 1982-04; VOL. 17; NO 4; PP. 509-513; BIBL. 3 REF.Article

A rotating sample mouting device for a Guinier powder diffractometerBRÜDERL, G; BURZLAFF, H; PERDIKATSIS, B et al.Journal of applied crystallography. 1994, Vol 27, pp 127-128, issn 0021-8898, 1Article

A PRINCIPAL DISTINCTION BETWEEN DIFFERENT KINDS OF X-RAY EQUIPMENT FOR RESIDUAL STRESS MEASUREMENTJAENSSON B.1980; MATER. SCI. ENG.; CHE; DA. 1980-04; VOL. 43; NO 2; PP. 169-176; BIBL. 4 REF.Article

STRUCTURAL ANALYSIS OF MOLTEN LICL BY X-RAY DIFFRACTION = ETUDE PAR DIFFRACTOMETRIE X DE LA STRUCTURE DU LICL FONDUIWAMOTO N; UMESAKI N; ASAHINA T et al.1980; WELDING RESEARCH IN THE 1980'S. INTERNATIONAL CONFERENCE. POSTER SESSION/1980/OSAKA; JPN; OSAKA: JWRI; DA. 1980; PP. 43-45; BIBL. 2 REF.; LOC. ISConference Paper

A curved-crystal spectrometer for soft X-ray emission studies of metals and metallic alloys = Ein gekruemmtes Kristallspektrometer fuer die Untersuchung der Emission weicher Roentgenstrahlen von Metallen und LegierungenZSCHECH, E; BLAU, W; WEHNER, B et al.Crystal research and technology (1979). 1984, Vol 19, Num 7, pp 1007-1014, issn 0232-1300Article

A novel Guinier diffractometer with automated adjustment and settingsIHRINGER, J; RÖTTGER, K.Journal of physics. D, Applied physics (Print). 1993, Vol 26, Num 4A, pp A32-A34, issn 0022-3727Article

A theoretical model for the correction of intensity aberrations in Bragg-Brentano X-ray diffractometers - detailed description of the algorithmMATULIS, C. E; TAYLOR, J. C.Journal of applied crystallography. 1993, Vol 26, pp 351-356, issn 0021-8898, 3Article

Resolution investigations of X-ray three-crystal diffractometersBRÜGEMANN, L; BLOCH, R; PRESS, W et al.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 688-692, issn 0108-7673, 5Article

A laue diffractometer with δ geometryLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1992, Vol 25, pp 440-443, issn 0021-8898, 3Article

Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector systemLEIDICH, R; HAMILTON, P; BERNAL, V et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 466, 3Article

A novel monochromator housing with completely shielded beam path from X-ray source to sampleIHRINGER, J; RÖTTGER, K.Journal of applied crystallography. 1994, Vol 27, pp 1063-1065, issn 0021-8898, 6Article

Angle calculations for a five-circle diffractometer used in surface X-ray diffraction experimentsWANG, S.-K; DAI, P; TAUB, H et al.Journal of applied crystallography. 1993, Vol 26, pp 697-705, issn 0021-8898, 5Article

A personal-computer-controlled single-crystal diffractometerSVENSSON, C; STAHL, K.Journal of applied crystallography. 1993, Vol 26, pp 728-729, issn 0021-8898, 5Article

Angle calculations for a six-circle surface X-ray diffractometerLOHMEIER, M; VLIEG, E.Journal of applied crystallography. 1993, Vol 26, pp 706-716, issn 0021-8898, 5Article

Angle calculations for a vertical-axis X-ray diffractometerHSUEH-HSING HUNG.Journal of applied crystallography. 1992, Vol 25, pp 761-765, issn 0021-8898, 6Article

Roentgen-Difraktometer macht Eigenspannungen sichtbar = Residual stresses made visible by X-ray diffractometerAluminium (Düsseldorf). 1984, Vol 60, Num 4, issn 0002-6689, 251Article

Microcomputer-based acquisition system for the Philips PW1050 powder diffractometerGRIGG, M. W; KEATING, A; BROCKWELL, A et al.Journal of applied crystallography. 1992, Vol 25, pp 652-653, issn 0021-8898, 5Article

An open-flow helium cryostat for single-crystal X-ray diffraction experimentsHARDIE, M. J; KIRSCHBAUM, K; MARTIN, A et al.Journal of applied crystallography. 1998, Vol 31, pp 815-817, issn 0021-8898, 5Article

Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plateFUJIWARA, A; ISHII, K; KIKEGAWA, T et al.Journal of applied crystallography. 2000, Vol 33, pp 1241-1245, issn 0021-8898, 5Article

Image plates as one-dimensional detectors in high-resolution X-ray diffractionKINNE, A; THOMS, M; RESS, H. R et al.Journal of applied crystallography. 1998, Vol 31, pp 446-452, issn 0021-8898, 3Article

Construction of a double-radius Guinier diffractometer using Mo Kα1 radiation and a one- or two-dimensional detection systemOTTO, H. H; HOFMANN, W.Journal of applied crystallography. 1996, Vol 29, pp 495-497, issn 0021-8898, 4Article

Surface phases analysis by grazing incidence of X-rays in a Bragg-Brentano diffractometerBATTAGLIA, S.Applied surface science. 1996, Vol 93, Num 4, pp 349-352, issn 0169-4332Article

Apparatus function of a five-crystal X-ray diffractometer with a four-reflection monochromatorMÖLLER, M. O.Journal of applied crystallography. 1994, Vol 27, pp 369-378, issn 0021-8898, 3Article

Using a two-dimensional detector for X-ray powder diffractometrySULYANOV, S. N; POPOV, A. N; KHEIKER, D. M et al.Journal of applied crystallography. 1994, Vol 27, pp 934-942, issn 0021-8898, 6Article

  • Page / 18