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ON THE POSSIBILITY OF UTILIZING HOLOGRAPHIC SCHEMES IN X-RAY MICROSCOPYARISTOV VV; IVANOVA GA.1979; J. APPL. CRYSTALLOGR.; DNK; DA. 1979; VOL. 12; NO 1; PP. 19-24; BIBL. 24 REF.Article

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A NEW SYSTEM FOR ON-LINE X-RAY TOPOGRAPHYKOMYAK NI; LUTSAU VG; EFANOV VP et al.1980; X-RAY SPECTROM.; GBR; DA. 1980; VOL. 9; NO 1; PP. 36-37; BIBL. 5 REF.Article

AN X-RAY SOURCE WITH FOCAL SPOT SCANNINGBELYAEV BF; GUSHCHIN VA; IVANOV SA et al.1980; X. RAY SPECTROM.; GBR; DA. 1980; VOL. 9; NO 3; PP. 150-152; BIBL. 10 REF.Article

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Understanding dynamics of polysulfide dissolution and re-deposition in working lithium―sulfur battery by in-operando transmission X-ray microscopyLIN, Chia-Nan; CHEN, Wen-Chin; YEN-FANG SONG et al.Journal of power sources (Print). 2014, Vol 263, pp 98-103, issn 0378-7753, 6 p.Article

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