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QUANTITATIVE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLESEBEL MF; EBEL H; HIROKAWA K et al.1982; SPECTROCHIM. ACTA, B: AT. SPECTROSC.; ISSN 0584-8547; GBR; DA. 1982; VOL. 37; NO 6; PP. 461-471; BIBL. 33 REF.Article

SELECTED AREA X-RAY PHOTOELECTRON SPECTROSCOPYKEAST DJ; DOWNING KS.1981; SURF. INTERFACE; ISSN 0142-2421; GBR; DA. 1981; VOL. 3; NO 2; PP. 99-101; BIBL. 3 REF.Article

X-RAY PHOTOELECTRON ANALYSIS OF SURFACE LAYERS WITH COMPOSITION GRADIENTSNEFEDOV VI.1981; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1981; VOL. 3; NO 2; PP. 72-75; BIBL. 9 REF.Article

SURFACE ANALYSIS OF INSB BY X-RAY PHOTOELECTRON SPECTROSCOPY (XPS).COPPERTHWAITE RG; KUNZE OA; LLOYD J et al.1978; Z. NATURFORSCH., A; DTSCH.; DA. 1978; VOL. 33; NO 5; PP. 523-527; BIBL. 15 REF.Article

USEFULNESS OF PHOTON MASS ATTENUATION COEFFICIENTS IN ELEMENTAL ANALYSISKOURIS K; SPYROU NM.1978; NUCL. INSTRUM. METHODS; NLD; DA. 1978; VOL. 153; NO 2-3; PP. 477-483; BIBL. 11 REF.Article

A NEW METHOD FOR DETERMINING SULFOXIDES IN PEPTIDE MOLECULES USING X-RAY PHOTOELECTRON SPECTROSCOPYJONES D; DISTEFANO G; TONIOLO C et al.1978; BIOPOLYMERS; USA; DA. 1978; VOL. 17; NO 11; PP. 2703-2713; BIBL. 47 REF.Article

SCANNING ESCA: A NEW DIMENSION FOR ELECTRON SPECTROSCOPY.HOVLAND CT.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 30; NO 6; PP. 274-275; BIBL. 3 REF.Article

A METHOD TO REDUCE THE HYDROCARBON CONTAMINATION OF SAMPLES IN X-RAY PHOTOELECTRON SPECTROSCOPY.CLARK DT; THOMAS HR; DILKS A et al.1977; J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1977; VOL. 10; NO 4; PP. 455-460; BIBL. 7 REF.Article

X-RAY PHOTOIONIZATION CROSS SECTIONS FOR QUANTITATIVE ANALYSIS.BRILLSON LJ; CEASAR GP.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 58; NO 2; PP. 457-468; BIBL. 27 REF.Article

ETUDES FONDAMENTALES SUR L'ANALYSE QUANTITATIVE DES IONS OO, O- ET O2- DANS LES SILICATES PAR SPECTROMETRIE PHOTOELECTRONIQUE RXKANEKO Y; SUGINOHARA Y.1977; J. JAP. INST. METALS; JAP.; DA. 1977; VOL. 41; NO 4; PP. 375-380; ABS. ANGL.; BIBL. 12 REF.Article

LARGE-RAILGUN RESIDUE MATERIAL ANALYZED BY X-RAY PHOTOELECTRON SPECTROSCOPYWESTERDAHL CAL; PINTO J; FERRENTINO GL et al.1983; IEEE TRANSACTIONS ON MAGNETICS; ISSN 0018-9464; USA; DA. 1983; VOL. 19; NO 1; PP. 53-54; BIBL. 6 REF.Article

Transitions radiatives du cœur à la bande de valence dans les cristaux CsCl et CsCaCl2MEL'CHAKOV, E.N; RODNYJ, P.A; RYBAKOV, B.V et al.Fizika tverdogo tela. 1989, Vol 31, Num 5, pp 276-278, issn 0367-3294Article

Surface quantitative analysis of Cr-O systems by XPSBATTISTONI, C; COSSU, G; MATTOGNO, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 173-176, issn 0142-2421Article

Metal overlayers on organic functional groups of self-organized molecular assemblies. II: X-ray photoelectron spectroscopy of interactions of Cu/CN on 12-mercaptododecanenitrileJUNG, D. R; KING, D. E; CZANDERNA, A. W et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 4, pp 2382-2386, issn 0734-2101, 2Conference Paper

X-ray absorption and X-ray photoelectron spectroscopy of a rhodium colloidROTHE, J; POLLMANN, J; FRANKE, R et al.Fresenius' journal of analytical chemistry. 1996, Vol 355, Num 3-4, pp 372-374, issn 0937-0633Conference Paper

Quantitative XPS analysis considering elastic scatteringEBEL, H; EBEL, M. F; WERNISCH, J et al.Surface and interface analysis. 1984, Vol 6, Num 3, pp 140-143, issn 0142-2421Article

The influence of X-ray-induced Auger electrons in quantitative electron-induced Auger spectroscopyCAZAUX, J; MOUTOU, S.Surface and interface analysis. 1984, Vol 6, Num 2, pp 62-67, issn 0142-2421Article

Sensitivity factors from XPS analysis of surface atomsWAGNER, C. D.Journal of electron spectroscopy and related phenomena. 1983, Vol 32, Num 2, pp 99-102, issn 0368-2048Article

XPS: energy calibration of electron spectrometers. II: Results of an interlaboratory comparisonANTHONY, M. T; SEAH, M. P.Surface and interface analysis. 1984, Vol 6, Num 3, pp 107-115, issn 0142-2421Article

QUANTITATIVE COMPARISON OF DIRECT AND DERIVATIVE AES WITH XPS OF METAL SULFIDESGRIFFIS DP; LINTON RW.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 5; PP. 197-203; BIBL. 21 REF.Article

CARBON CONTAMINANT BUILDUP AND SPUTTERING BEHAVIOUR ON ZINC OXIDE DURING XPS EXAMINATIONMINTAS M; FILBY GW.1981; Z. NATURFORSCH., A; ISSN 0340-4811; DEU; DA. 1981; VOL. 36; NO 2; PP. 140-143; BIBL. 16 REF.Article

THE QUANTITATIVE ANALYSIS OF SURFACES BY XPS: A REVIEWSEAH MP.1980; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1980; VOL. 2; NO 6; PP. 222-239; BIBL. 61 REF.Article

PHOTOELECTRON SPECTROSCOPY OF E AND A GLASS FIBERS.BRION D; ESCARD J; WINTER C et al.1978; AMER. CERAM. SOC. BULL.; U.S.A.; DA. 1978; VOL. 57; NO 4; PP. 444-451 (5P.); BIBL. 17 REF.Article

AN ASYMMETRIC MODEL FOR XPS ANALYSISDUNN WL; DUNN TS.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 3; PP. 77-88; BIBL. 13 REF.Article

AN EXPERIMENTAL AND THEORETICAL STUDY OF THE TRANSMISSION FUNCTION OF A COMMERCIAL HEMISPHERICAL ELECTRON ENERGY ANALYSERHUGHES AE; PHILLIPS CC.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 5; PP. 220-226; BIBL. 7 REF.Article

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