CHARACTERIZATION OF DICING PROCESS BY X-RAY SECTION TOPOGRAPHYYASUAMI S.1980; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 6; PP. 1404-1406; BIBL. 5 REF.Article

THEORIE DU CONTRASTE DE BORRMANN DES DISLOCATIONS REVUE)TIKHONOVA EA.1976; UKRAIN. FIZ. ZH.; S.S.S.R.; DA. 1976; VOL. 21; NO 5; PP. 709-735; ABS. ANGL.; BIBL. 52 REF.Article

VISCOELASTIC BEHAVIOUR OF OXIDE FILMS ON SILICON CRYSTALSNISHINO Y; IMURA T.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 74; NO 1; PP. 193-200; ABS. GER; BIBL. 11 REF.Article

ROENTGENTOPOGRAPHIE MIT EXTREMWERTNACHFUEHRUNG. I. PRINZIP DER NACHFUEHRUNG UND BILDVERZEICHNUNG. = TOPOGRAPHIE RX AVEC GUIDAGE A LA VALEUR EXTREME. I. PRINCIPE DU GUIDAGE ET DISTORSION DE L'IMAGEALEX V; HANSCH C; NAUMANN E et al.1978; KRISTALL U. TECH.; DTSCH.; DA. 1978; VOL. 13; NO 1; PP. 87-94; ABS. ANGL.; BIBL. 10 REF.Article

ON THE GEOMETRICAL CONDITIONS FOR RECORDING X-RAY TOPOGRAPHS OF LARGE CRYSTAL SLICESLINDEGAARD ANDERSEN A; CHRISTIANSEN G; ZSOLDOS L et al.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 1; PP. 1-6; BIBL. 3 REF.Article

SOLUTION DU PROBLEME DU CALCUL DES TOPOGRAMMES PROJECTIFS XPETRASHEN PV; CHUKHOVSKIJ FN; SHUL'PINA IL et al.1978; DOKL. AKAD. NAUK S.S.S.R.; S.S.S.R.; DA. 1978; VOL. 240; NO 4; PP. 836-838; H.T. 1; BIBL. 12 REF.Article

UTILISATION DU RELEVE TOPOGRAPHIQUE DANS L'IRRADIATION MONOCHROMATIQUE A PARTIR D'UNE SOURCE PONCTUELLE DE RXZASIMCHUK IK; FOMIN AV.1978; METALLOFIZIKA; UKR; DA. 1978; NO 72; PP. 112-117; BIBL. 7 REF.Article

UNTERSUCHUNGEN DES DEFORMATIONSFELDES PARTIELL BESCHICHTETER EINKRISTALLPLATTEN MIT HILFE DER ROENTGENTOPOGRAPHIE = ETUDE DU CHAMP DE DEFORMATION DE PLAQUES MONOCRISTALLINES PARTIELLEMENT RECOUVERTES D'UN FILM A L'AIDE DE LA TOPOGRAPHIE RXFISCHER G.1978; WISSENSCH. Z. FRIEDRICH-SCHILLER-UNIV. JENA, MATH.-NATURWISSENS CH. REIHE; DDR; DA. 1978; VOL. 27; NO 2-3; PP. 233-244; ABS. RUS/ENG; BIBL. 31 REF.Article

DISLOCATION CONTRAST IN X-RAY SYNCHROTRON TOPOGRAPHS.TANNER BK; MIDGLEY D; SAFA M et al.1977; J. APPL. CRYSTALLOGR.; DENM.; DA. 1977; VOL. 10; NO 4; PP. 281-286; BIBL. 13 REF.Article

EXTERNE KRISTALLJUSTIERUNG FUER DIE LANG-TOPOGRAPHIE. = AJUSTEMENT CRISTALLIN EXTERNE POUR LA TOPOGRAPHIE DE LANGFILSCHER G.1977; KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 12; PP. 1311-1317; ABS. ANGL.Article

UNE NOUVELLE METHODE DE CALCUL DES TOPOGRAPHIES DE RAYONS X EN PROJECTIONPETRASHEN PV; CHUKHOVSKIJ FN.1978; FIZ. TVERD. TELA; S.S.S.R.; DA. 1978; VOL. 20; NO 4; PP. 1104-1108; BIBL. 15 REF.Article

GENERATION OF DISLOCATIONS INTRODUCED BY BENDING STRESS IN A SI WAFERSAWADA R; KARAKI T; WATANABE J et al.1983; APPLIED PHYSICS. A, SOLIDS AND SURFACES; ISSN 0721-7250; DEU; DA. 1983; VOL. 31; NO 2; PP. 109-114; BIBL. 24 REF.Article

DISPOSITIF POUR LA VISUALISATION DES IMAGES TOPOGRAPHIQUES RX DE STRUCTURE PN AU COURS DU PROCEDE DE LEUR PREPARATIONSHABOYAN SA.1977; IZVEST. AKAD. NAUK ARM. S.S.R., FIZ.; S.S.S.R.; DA. 1977; VOL. 12; NO 4; PP. 278-283; ABS. ARM. ANGL.; BIBL. 8 REF.Article

ON THE DISLOCATION IMAGE IN THE BRAGG CASE.BUBAKOVA R; SOUREK Z.1976; CZECHOSL. J. PHYS.; CZECHOSL.; DA. 1976; VOL. 26; NO 8; PP. 863-864; H.T. 1; BIBL. 2 REF.Article

MICRODEFORMATION OF (111) IRON WHISKERS = MICRODEFORMATION DES TRICHITES (111) DE FERSUROWIEC M; CHAMPIER G.1982; JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 5; PP. 558-563; BIBL. 13 REF.Article

DETERMINATION OF THE STRAIN CONCENTRATION FACTORS AROUND HOLES AND INCLUSIONS IN CRYSTALS BY X-RAY TOPOGRAPHYCHAUDHURI J; KALMAN ZH; WENG GJ et al.1982; JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 4; PP. 423-429; BIBL. 19 REF.Article

DOUBLE-CRYSTAL TOPOGRAPHIC INVESTIGATION OF THE SHAPE OF SILICON WAFERS AFTER OXIDATIONZAUMSEIL P.1982; CRYST. RES. TECHNOL. (1979); ISSN 0232-1300; DDR; DA. 1982; VOL. 17; NO 5; PP. 639-642; BIBL. 10 REF.Article

GENERATION PROCESS OF DISLOCATIONS IN PRECIPITATE-CONTAINING SILICON CRYSTALSNISHINO Y; IMURA T.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 73; NO 1; PP. 173-182; ABS. GER; BIBL. 19 REF.Article

ON THE INTERMEDIARY IMAGE IN X-RAY SECTION TOPOGRAPHYKOWALSKI G; GRONKOWSKI J.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 71; NO 2; PP. 611-617; ABS. GER; BIBL. 17 REF.Article

A GENERAL REVIEW OF SYNCHROTRON RADIATION, ITS USES AND SPECIAL TECHNOLOGIESWILLIAMS GP.1982; VACUUM; ISSN 0042-207X; GBR; DA. 1982; VOL. 32; NO 6; PP. 333-345; BIBL. 17 REF.Article

SYNCHROTRON RADIATION TOPOGRAPHY OF (100)CO-8WT% FE BINARY ALLOYSTEPHENSON JD.1981; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1981-02-16; VOL. 63; NO 2; PP. 557-568; BIBL. 13 REF.Article

X-RAY TOPOGRAPHY UNDER CONDITIONS OF MONOCHROMATIC SPHERICAL WAVE DIFFRACTIONARISTOV VV; ISHIKAWA T; KIKUTA S et al.1981; JAPANESE JOURNAL OF APPLIED PHYSICS; ISSN 0021-4922; JPN; DA. 1981; VOL. 20; NO 10; PP. 1947-1953; BIBL. 13 REF.Article

INTERPRETATION OF X-RAY TOPOGRAPHYEPELBOIN Y.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 555-563; BIBL. 2 P.Conference Paper

A HIGH-RESOLUTION SECTION TOPOGRAPH TECHNIQUE APPLICABLE TO SYNCHROTON RADIATION SOURCESMAI ZHEN HONG; MARDIX S; LANG AR et al.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 2; PP. 180-187; BIBL. 21 REF.Article

ETCH PIT PATTERN OF GAAS CRYSTALS MADE BY LIGHT IRRADIATED ELECTROLYTIC ETCHINGTAKAHASHI K.1979; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1979; VOL. 18; NO 9; PP. 1741-1746; BIBL. 7 REF.Article