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Preliminary studies of radiation coupling between remote soft X-ray laser amplifiersCAIRNS, G; LEWIS, C. L. S; ZHANG, J et al.Applied physics. B, Photophysics and laser chemistry. 1994, Vol 58, Num 1, pp 51-56, issn 0721-7269Article

Recent results on development of a table-top soft X-ray laserPARK, C. O; POLONSKY, L; SUCKEWER, S et al.Applied physics. B, Photophysics and laser chemistry. 1994, Vol 58, Num 1, pp 19-22, issn 0721-7269Article

Efficient generation of Xe K-shell x rays by high-contrast interaction with submicrometer clustersHAYASHI, Yukio; PIROZHKOV, Alexander S; BULANOV, Sergei V et al.Optics letters. 2011, Vol 36, Num 9, pp 1614-1616, issn 0146-9592, 3 p.Article

Hard x-ray Zernike microscopy reaches 30 nm resolutionCHEN, Yu-Tung; CHEN, Tsung-Yu; YI, Jaemock et al.Optics letters. 2011, Vol 36, Num 7, pp 1269-1271, issn 0146-9592, 3 p.Article

Laboratory soft-x-ray microscope for cryotomography of biological specimensBERTILSON, Michael; HOFSTEN, Olov Von; VOGT, Ulrich et al.Optics letters. 2011, Vol 36, Num 14, pp 2728-2730, issn 0146-9592, 3 p.Article

Feasibility study of hard-x-ray nanofocusing above 20 keV using compound photon sievesCHANGQING XIE; XIAOLI ZHU; HAILIANG LI et al.Optics letters. 2010, Vol 35, Num 23, pp 4048-4050, issn 0146-9592, 3 p.Article

FLASH—the first soft x-ray free electron laser (FEL) user facilityFELDHAUS, J.Journal of physics. B. Atomic, molecular and optical physics (Print). 2010, Vol 43, Num 19, issn 0953-4075, 194002.1-194002.8Article

Calibration of the SphinX experiment at the XACT facility in PalermoCOLLURA, A; BARBERA, M; PODGORSKI, P et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7011, pp 70112T.1-70112T.8, issn 0277-786X, isbn 978-0-8194-7221-2, 2Vol, 2Conference Paper

Ultrahigh-resolution X-ray tomographyHADDAD, W. S; MCNULTY, I; TREBES, J. E et al.Science (Washington, D.C.). 1994, Vol 266, Num 5188, pp 1213-1215, issn 0036-8075Article

Soft X-ray submicron imaging experiments with nanosecond exposureARTYUKOV, I. A; FEDORENKO, A. I; KONDRATENKO, V. V et al.Optics communications. 1993, Vol 102, Num 5-6, pp 401-406, issn 0030-4018Article

The use of EM-CCDs on high resolution soft X-ray spectrometersTUTT, James H; HOLLAND, Andrew D; MURRAY, Neil J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8145, issn 0277-786X, isbn 978-0-8194-8755-1, 81450L.1-81450L.12Conference Paper

Optimized soft x-ray amplifier by tailoring plasma hydrodynamicsOLIVA, E; ZEITOUN, Ph; FAJARDO, M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7451, issn 0277-786X, isbn 978-0-8194-7741-5 0-8194-7741-9, 1Vol, 74510Y.1-74510Y.8Conference Paper

Elongated high-density gas puff target for experiments on laser-driven X-ray lasersFIEDOROWICZ, Henryk; BARTNIK, Andrzej; JAROCKI, Roman et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 1-591903, issn 0277-786X, isbn 0-8194-5924-0, 1Vol, -591903-4Conference Paper

Soft X-ray silicon photodiodes with 100% quantum efficiencyWENZEL, K. W; LI, C. K; PAPPAS, D. A et al.IEEE transactions on nuclear science. 1994, Vol 41, Num 4, pp 979-983, issn 0018-9499, 1Conference Paper

Thermal shielding of the SIMBOL-X mirror assemblyCOLLURA, A; ATTINA, P; BARBERA, M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 66880E.1-66880E.5, issn 0277-786X, isbn 978-0-8194-6836-9, 1VolConference Paper

Broad-band Soft X-ray PolarimetryMARSHALL, Herman L; HEILMANN, Ralf K; SCHULZ, Norbert S et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7732, issn 0277-786X, isbn 0-8194-8222-6 978-0-8194-8222-8, 77320F.1-77320F.10, 2Conference Paper

Imaging properties of the Schwarzschild soft-X-ray microscopesHORIKAWA, Y.Journal of modern optics (Print). 1993, Vol 40, Num 10, pp 2025-2038, issn 0950-0340Article

Soft X-ray microscope with zone plates at UVSOR. I: PerformanceWATANABE, N; SHIMANUKI, Y; TANIGUCHI, M et al.Japanese journal of applied physics. 1993, Vol 32, Num 10, pp 4791-4798, issn 0021-4922, 1Article

Mesure de l'indice de réfraction par interférométrie en X mous = Soft X-rays inrtferometry: refraction index measurementsSVATOS, J; POLACK, F; JOYEUX, D et al.Annales de physique (Imprimé). 1992, Vol 17, Num 3, pp 195-196, issn 0003-4169, SUPConference Paper

Study of the effect of pyrex and quartz insulators on X-ray intensity in a 4 kJ plasma focus deviceKOOHESTANI, Saeedeh; HABIBI, Morteza; AMROLLAHI, Reza et al.The European physical journal. D, Atomic, molecular and optical physics (Print). 2013, Vol 67, Num 6, issn 1434-6060, 128.1-128.6Article

Efficiency calibrations of cylindrically bent transmission crystals in the 20 to 80 keV x-ray energy rangeSZABO, Csilla I; FELDMAN, Uri; SELTZER, Stephen et al.Optics letters. 2011, Vol 36, Num 8, pp 1335-1337, issn 0146-9592, 3 p.Article

A Hard X-Ray Telescope Science Enhancement Package for the Constellation X-Ray MissionRAMSEY, Brian; GORENSTEIN, Paul.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 66880D.1-66880D.8, issn 0277-786X, isbn 978-0-8194-6836-9, 1VolConference Paper

Far-field x-ray phase contrast imaging has no detailed information on the objectKOHN, V. G; ARGUNOVA, T. S; JE, J. H et al.Journal of physics. D, Applied physics (Print). 2010, Vol 43, Num 44, issn 0022-3727, 442002.1-442002.3Article

Focalisation d'un rayonnement très pénétrant par un milieu diffusant = Focusing high energy radiations using a scattering mediumCanaud, Benoist; Rozet, J.-P.1994, 144 p.Thesis

Fabrication of hard x-ray phase zone plate by x-ray lithographyKRASNOPEROVA, A. A; XIAO, J; CERRINA, F et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1993, Vol 11, Num 6, pp 2588-2591, issn 1071-1023Conference Paper

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