X-ray refraction of paper and pigmentsHENTSCHEL, M. P; HARBICH, K.-W; LANGE, A et al.Materialprüfung. 1995, Vol 37, Num 3, pp 60-62, issn 0025-5300Article

Evidence of soft X-ray refraction induced by a laser produced plasmaBENATTAR, R; GODARD, J.Optics communications. 1986, Vol 56, Num 6, pp 418-424, issn 0030-4018Article

Multi-field x-ray microscope based on array of refractive lensesNAZMOV, V; MOHR, J; VOGT, H et al.Journal of micromechanics and microengineering (Print). 2014, Vol 24, Num 7, issn 0960-1317, 075005.1-075005.9Article

Röntgen-Refraktion von Werkstoffen : Zerstörungsfreie Charakterisierung von Mikro-Grenzflächen = X-ray refraction of materials : Nondestructive characterization of micro interfacesHARBICH, K.-W; SCHORS, J. V; LANGE, A et al.Materialprüfung. 1997, Vol 39, Num 7-8, pp 302-307, issn 0025-5300Article

Quantitative Röntgen-Refraktions-Topographie von keramischen Werkstoffen = Quantitative X-ray refraction topography of ceramic materialsHARBICH, K.-W; HENTSCHEL, M. P; LANGE, A et al.Materialprüfung. 1996, Vol 38, Num 5, pp 181-186, issn 0025-5300, 5 p.Article

Extraction of extinction, refraction and absorption properties in diffraction enhanced imagingOLTULU, Oral; ZHONG ZHONG; HASNAH, Moumen et al.Journal of physics. D, Applied physics (Print). 2003, Vol 36, Num 17, pp 2152-2156, issn 0022-3727, 5 p.Article

Applications of dynamical diffraction under locally plane wave conditions : defects in nearly perfect crystals and X-ray refractometryMOCELLA, V; EPELBOIN, Y; GUIGAY, J. P et al.Acta crystallographica. Section A, Foundations of crystallography. 2001, Vol 57, Num 5, pp 526-530, issn 0108-7673Article

Diffraction tomographic reconstruction from intensity dataDEVANEY, A. J.IEEE transactions on image processing. 1992, Vol 1, Num 2, pp 221-228Article

Exploiting the x-ray refraction contrast with an analyser: the state of the artBRAVIN, Alberto.Journal of physics. D, Applied physics (Print). 2003, Vol 36, Num 10A, pp A24-A29, issn 0022-3727Conference Paper

X-ray refraction : A new method for nondestructive characterization of advanced ceramicsHARBICH, K.-W; HENTSCHEL, M. P; SCHORS, J. V et al.Advances in science and technology. 1999, pp D345-D352, isbn 88-86538-14-6, 5VolConference Paper

Refraction phenomena in X-ray scattering experiments performed with a narrow collimator apertureNIKULIN, A. Y; DAVIS, J. R.Optics communications. 1998, Vol 155, Num 4-6, pp 231-235, issn 0030-4018Article

Direct observation of double refraction of X-rays undergoing diffraction by a perfect crystalLANG, A. R; KOWALSKI, G; MAKEPEACE, A. P. W et al.Philosophical magazine. B. Physics of condensed matter. Electronic, optical and magnetic properties. 1986, Vol 53, Num 2, pp L53-L58, issn 0141-8637, 2Article

An application of phase retrieval x-ray diffractometry to refraction/small-angle scattering dataSIU, K; NIKULIN, A. Y; TAMASAKU, K et al.Journal of physics. D, Applied physics (Print). 2001, Vol 34, Num 18, pp 2912-2917, issn 0022-3727Article

Studies in synchrotron x-ray microradiography : observation of biprism-type interferenceLANG, A. R; MAKEPEACE, A. P. W.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 10A, pp A172-A178, issn 0022-3727Article

Effects of refraction of X-rays in double-crystal topographyNIWANO, M; KANAI, A; SUEMITSU, M et al.Japanese journal of applied physics. 1988, Vol 27, Num 5, pp 849-854, issn 0021-4922, 1Article

Examination of surface-roughness of silicon crystals by double-crystal X-ray topographyNIWANO, M; KOBAYASHI, T; MIYAMOTO, N et al.Japanese journal of applied physics. 1988, Vol 27, Num 6, pp 1113-1114, issn 0021-4922, 1Article

Microfabrication of saw-tooth refractive x-ray lenses in low-Z materialsRIBBING, Carolina; CEDERSTRÖM, Björn; LUNDQVIST, Mats et al.Journal of micromechanics and microengineering (Print). 2003, Vol 13, Num 5, pp 714-720, issn 0960-1317, 7 p.Article

Absorption effects in the determination of anomalous scattering factors using X-ray refraction through a prismWARBURTON, W. K; LUDWIG, K. F. JR.Physical review. B, Condensed matter. 1986, Vol 33, Num 12, pp 8424-8432, issn 0163-1829, 1Article

Synchrotron-Based Micro-CT and Refraction-Enhanced Micro-CT for Non-Destructive Materials CharacterisationMÜLLER, Bernd R; LANGE, Axel; HARWARDT, Michael et al.Advanced engineering materials (Print). 2009, Vol 11, Num 6, issn 1438-1656, 429, 435-440 [7 p.]Conference Paper

Röntgenrefraktions-Computertomographie = X-Ray Refraction computer-tomographyHENTSCHEL, M. P; LANGE, A; MÜLLER, B. R et al.Materialprüfung. 2000, Vol 42, Num 6, pp 217-221, issn 0025-5300Article

Charakterisieren von Poren in Sinterglaskeramik = Characterization of pores in sintered glass ceramicsHARBICH, K.-W; RABE, T; MÜCKE, U et al.Materialprüfung. 1994, Vol 36, Num 7-8, pp 303-305, issn 0025-5300Article

Röntgenkleinwinkelbrechung an Metalldrähten, Glasfäden und hartelastischen Polypropylen = Réfraction centrale de rayons X sur des fils métalliques, des fibres de verre et des polypropylène élastiques rigides = Smoll angle RX refraction from metallic wires, glass fibres and hard elastic polypropyleneHENTSCHEL, M. P; HOSEMANN, R; LANGE, A et al.Acta crystallographica. Section A, Foundations of crystallography. 1987, Vol 43, Num 4, pp 506-513, issn 0108-7673Article

Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structures : Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniquesHAYASHI, Kouichi.Journal of physics. Condensed matter (Print). 2010, Vol 22, Num 47, issn 0953-8984, 474006.1-474006.9Article

Synchrotron refraction CT and Synchrotron Bragg magnification CT for NDEMÜLLER, B. R; LANGE, A; HARWARDT, M et al.Insight (Northampton). 2008, Vol 50, Num 6, pp 316-319, issn 1354-2575, 4 p.Article

Determination of pore sizes on sintered ceramic materials using image analysis and X-ray refractionMÜCKE, U; HARBICH, K.-W; RABE, T et al.CFI. Ceramic forum international. 1997, Vol 74, Num 2, pp 95-98, issn 0173-9913Conference Paper