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A computer program generating parameters useful in X-ray diffraction topography studiesROBERTS, K. J.Journal of applied crystallography. 1983, Vol 16, Num 5, pp 577-578, issn 0021-8898Article

Detection of dislocations in strongly absorbing crystals by projection x-ray topography in back reflectionSHUL'PINA, I. L; ARGUNOVA, T. S.Journal of physics. D, Applied physics (Print). 1995, Vol 28, Num 4A, pp A47-A49, issn 0022-3727Conference Paper

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