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Results 1 to 25 of 5362

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Mesures précises à l'aide d'un détecteur courbe = Accurate measurements with a curved detectorROUX, J; VOLFINGER, M.Journal de physique. IV. 1996, Vol 6, Num 4, pp C4.127-C4.134, issn 1155-4339Conference Paper

Polychromaticity in the combined propagation-based/analyser-based phase-contrast imagingNESTERETS, Ya. I; GUREYEV, T. E; WILKINS, S. W et al.Journal of physics. D, Applied physics (Print). 2005, Vol 38, Num 24, pp 4259-4271, issn 0022-3727, 13 p.Article

X-ray interferometer using wavefront divisionYAMAZAKI, Hiroshi; LSHIKAWA, Tetsuya.Journal of applied crystallography. 2003, Vol 36, pp 213-219, issn 0021-8898, 7 p., 2Article

A novel digital x-ray topography systemBOWEN, D. K; WORMINGTON, M; FEICHTINGER, P et al.Journal of physics. D, Applied physics (Print). 2003, Vol 36, Num 10A, pp A17-A23, issn 0022-3727Conference Paper

Two-dimensional camera for millisecond range time-resolved small-and wide-angle X-ray scatteringURBAN, Volker; PANINE, Pierre; PONCHUT, Cyril et al.Journal of applied crystallography. 2003, Vol 36, pp 809-811, issn 0021-8898, 3 p., 3Conference Paper

Feasibility of X-ray fluorescence imaging in a SEM using pinhole relay opticsERRE, D; JIBAOUI, H; RONDOT, S et al.EPJ. Applied physics (Print). 2001, Vol 14, Num 2, pp 143-146, issn 1286-0042Article

Tunable X-ray polarization reflector with perfect crystalsHASEGAWA, Y; UEJI, Y; OKITSU, K et al.Acta crystallographica. Section A, Foundations of crystallography. 1999, Vol 55, Num 5, pp 955-962, issn 0108-7673Article

Imagerie X à Haute Résolution Spatiale de Plasma dans la Région 1.5 keV à l'aide de Lentilles de Bragg-Fresnel Gravées sur Miroirs Interférentiels Multicouches = High Spatial Resolution X-Ray Imaging of Plamsa in the 1.5 keV Domain Using Bragg-Fresnel lenses Etched on Multilayer Interferential MirorsCauchon, Gilles; Dhez, Pierre.1998, 182 p.Thesis

α-parameter method in X-ray spectral microanalysis : Binary systemsLAVRENT'EV, YU. G; USOVA, L. V.Journal of analytical chemistry (New York, NY). 1997, Vol 52, Num 3, pp 212-216, issn 1061-9348Article

Transmission of X-rays from an extended X-ray source through parallel-bore glass capillary waveguides : Implications for the design of a laboratory X-ray microprobeCHARNLEY, N. R; POTTS, P. J.Journal of analytical atomic spectrometry (Print). 1997, Vol 12, Num 7, pp 761-767, issn 0267-9477Article

Monolithic crystal bender for dynamical sagittal focusing with compensation for anticlastic curvature and twist distortionsMÜLLENDER, S; GOULON, J; LOEFFEN, P. W et al.Journal de physique. IV. 1997, Vol 7, Num 2, pp C2.317-C2.318, issn 1155-4339, 1Conference Paper

Surface characterisation of electroformed mirrors for an X-ray telescopeCITTERIO, O; MAZZOLENI, F; MONTICONE, E et al.Surface science. 1997, Vol 377-79, pp 98-102, issn 0039-6028Conference Paper

25 years of x-ray spectrometry 1971-1996X-ray spectrometry. 1996, Vol 25, Num 3, pp 101-139, issn 0049-8246Serial Issue

Microscopie X par réflexion totale et diffraction de Kossel à incidence rasante : Premiers résultats = X-ray total reflection microscopy and grazing incidence Kossel diffraction : First resultsERRE, D; JIBAOUI, H; CAZAUX, J et al.Journal de physique. IV. 1996, Vol 6, Num 4, pp C4.393-C4.398, issn 1155-4339Conference Paper

A new concept of X-ray microscopes with a coded aperture imaging maskMATSUOKA, M; KOHMURA, Y.Japanese journal of applied physics. 1995, Vol 34, Num 1, pp 372-373, issn 0021-4922, 1Article

The measurement of enhanced L and M X-ray yields from charge-induced studies with protons and 1H2+ ion beamsPILLAY, A. E; PEISACH, M.Journal of radioanalytical and nuclear chemistry. 1995, Vol 189, Num 2, pp 283-288, issn 0236-5731Article

High-resolution x-ray microfluorescence imaging with a laboratory-based instrumentCARPENTER, D. A; TAYLOR, M. A; LAWSON, R. L et al.Journal of trace and microprobe techniques. 1995, Vol 13, Num 2, pp 141-161, issn 0733-4680Article

Radionuclide mapping using a position sensitive photomultiplier tube and a germanium detectorDEWARAJA, Y. K; ZHONG HE; FLEMING, R. F et al.IEEE transactions on nuclear science. 1995, Vol 42, Num 4, pp 649-652, issn 0018-9499, 1Conference Paper

A scanned source x-ray microscopeMICHETTE, A. G; FEDOSEJEVS, R; PFAUNTSCH, S. J et al.Measurement science & technology (Print). 1994, Vol 5, Num 5, pp 555-559, issn 0957-0233Article

Application of high-resolution film for lithography to synchrotron X-ray topographyMIZUNO, K; IWAMI, M; HASHIMOTO, E et al.Japanese journal of applied physics. 1994, Vol 33, Num 8, pp 4793-4794, issn 0021-4922, 1Article

Calibration of silicon PIN photodiode for measuring intensity of 7∼40 KeV photonsBAN, S; HIRAYAMA, H; NAMITO, Y et al.Journal of Nuclear Science and Technology. 1994, Vol 31, Num 2, pp 163-168, issn 0022-3131Article

Electron-beam-deposited Mo/Si and MoxSiy/Si multilayer x-ray mirrors and gratingsSCHMIEDESKAMP, B; KLOIDT, A; HEINZMANN, U et al.Optical engineering (Bellingham. Print). 1994, Vol 33, Num 4, pp 1314-1321, issn 0091-3286Article

X-ray diffraction tomography at the Australian National Beamline FacilityGRANT, J. A; DAVIS, J. R; WELLS, P et al.Optical engineering (Bellingham. Print). 1994, Vol 33, Num 8, pp 2803-2807, issn 0091-3286Article

Gamma-ray detectors from thermally annealed Bridgmann-growtn CdTeALEXIEV, D; BUTCHER, K. S. A; WILLIAMS, A. A et al.Journal of crystal growth. 1994, Vol 142, Num 3-4, pp 303-309, issn 0022-0248Article

High-resolution X-ray scattering topography using synchrotron radiation microbeamCHIKAURA, Y; SUZUKI, Y; KII, H et al.Japanese journal of applied physics. 1994, Vol 33, Num 2A, pp L204-L206, issn 0021-4922, 2Article

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