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THE USE OF LOW TEMPERATURE X-RAY DIFFRACTION TO EVALUATE FREEZING METHODS USED IN FREEZE-FRACTURE ELECTRON MICROSCOPY.GULIK KRZYWICKI T; COSTELLO MJ.1978; J. MICR.; G.B.; DA. 1978; VOL. 112; NO 1; PP. 103-113; BIBL. 9 REF.Article

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THE IDENTIFICATION, FORMATION AND INFLUENCE OF A STRONGLY EPITAXIAL OXIDE PHASE DURING SELECTIVE OXIDATION OF AN FE-CR ALLOYCROUCH IG; SCULLY JC.1978; CORROS. SCI.; GBR; DA. 1978; VOL. 18; NO 4; PP. 401-405; BIBL. 6 REF.Article

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A DEVICE WHICH IMPROVES THE COOLING OF PROTEIN CRYSTALS DURING X-RAY DATA COLLECTIONHOVMOELLER S.1981; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1981; VOL. 14; NO 1; PP. 75Article

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