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Results 1 to 25 of 1932

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X-ray diffraction contrast and ray-paths in the case of a dislocation in a particular positionKOWALSKI, G.Physica status solidi. A. Applied research. 1984, Vol 84, Num 1, pp 119-132, issn 0031-8965Article

Effets de la diffraction et métrique des réflexions sur les diagrammes à symétrie dans la topographie de transmission des rayons XBELOTSKAYA, A. A; TIKHONOV, L. V; KHAR'KOVA, G. V et al.Metallofizika (Kiev). 1983, Vol 5, Num 2, pp 87-94, issn 0204-3580Article

Small angle grain boundaries as lattice dislocation sources near the melting point of aluminiumGRANGE, G; GASTALDI, J; JOURDAN, C et al.Journal of crystal growth. 1990, Vol 104, Num 4, pp 851-856, issn 0022-0248Article

A computer program generating parameters useful in X-ray diffraction topography studiesROBERTS, K. J.Journal of applied crystallography. 1983, Vol 16, Num 5, pp 577-578, issn 0021-8898Article

Detection of dislocations in strongly absorbing crystals by projection x-ray topography in back reflectionSHUL'PINA, I. L; ARGUNOVA, T. S.Journal of physics. D, Applied physics (Print). 1995, Vol 28, Num 4A, pp A47-A49, issn 0022-3727Conference Paper

Topography with synchrotron radiationGRAEFF, W.Zeitschrift für Physik. B, Condensed matter. 1985, Vol 61, Num 4, pp 469-471, issn 0722-3277Article

The correct rules for determining the sign of fault vectors in X-ray topographyLANG, A. R.Physica status solidi. A. Applied research. 1983, Vol 76, Num 2, pp 595-599, issn 0031-8965Article

Versatile double-crystal topography cameraKUO, C. L; EMAMIAN, M; BILELLO, J. C et al.Review of scientific instruments. 1984, Vol 55, Num 1, pp 107-109, issn 0034-6748Article

Topographic EXAFSBOWEN, D. K; STOCK, S. R; DAVIES, S. T et al.Nature (London). 1984, Vol 309, Num 5966, pp 336-338, issn 0028-0836Article

Freezing of interstitial-type dislocation loops grown as vacancy sources in nearly perfect aluminum crystalsMIZUNO, K; ONO, K; ITO, K et al.Journal of the Physical Society of Japan. 1995, Vol 64, Num 3, pp 699-701, issn 0031-9015Article

High-resolution x-ray optics for third-generation synchroton radiationISHIKAWA, T.Journal of physics. D, Applied physics (Print). 1995, Vol 28, Num 4A, pp A256-A261, issn 0022-3727Conference Paper

Propagation of {110} cleavage cracks in siliconMICHOT, G.Surface science. 1987, Vol 186, Num 3, pp L561-L567, issn 0039-6028Article

New possibilities of diffraction topography at third generation synchrotron radiation facilitiesZONTONE, F; BARUCHEL, J; HARTWIG, J et al.Journal de physique. IV. 1994, Vol 4, Num 9, pp 423-430, issn 1155-4339Conference Paper

Théorie du contraste radiotopographique des microdéfautsPETRASHEN, P. V.Metallofizika (Kiev). 1988, Vol 10, Num 1, pp 18-25, issn 0204-3580Article

Studies on the α-β transition of quartz by means of in situ X-ray topographyGOUHARA, K; LI, Y. H; KATO, N et al.Journal of the Physical Society of Japan. 1983, Vol 52, Num 11, pp 3821-3828, issn 0031-9015Article

Elimination of ghost reflections in X-ray diffraction topography using soller slitsBORN, E; METZGER, T; WILLIBALD-RIHA, E et al.Journal of applied crystallography. 1997, Vol 30, pp 320-323, issn 0021-8898, 3Article

«Ondes planes» en topographie de rayons X et images de défauts données par des ondes planesKAGANER, V. M; INDENBOM, V. L.Kristallografiâ. 1986, Vol 31, Num 1, pp 29-34, issn 0023-4761Article

In situ alignment procedure for X-ray topographyFORMAN, R. A; MAYO, S.Journal of applied crystallography. 1985, Vol 18, Num 2, pp 106-109, issn 0021-8898Article

Détermination des courbures des plans cristallographiques des monocristaux par la méthode de Berg-BarretKSHEVETSKIJ, S. A; KAMINSKIJ, V. M; KOVALYUK, Z. D et al.Metallofizika (Kiev). 1985, Vol 7, Num 1, pp 85-88, issn 0204-3580Article

X-ray topography of thin subsurface layersAFANASEV, A. M; ALEKSANDROV, P. A; IMAMOV, R. M et al.Physica status solidi. A. Applied research. 1985, Vol 90, Num 2, pp 419-423, issn 0031-8965Article

Observation of satellite reflections in the intermediate phase of quartzGOUHARA, K; LI, Y. H; KATO, N et al.Journal of the Physical Society of Japan. 1983, Vol 52, Num 11, pp 3697-3699, issn 0031-9015Article

Precision interplanar spacing measurements of boron-doped siliconSOARES, D. A. W; PIMENTEL, C. A.Journal of applied crystallography. 1983, Vol 16, Num 5, pp 486-492, issn 0021-8898Article

Simulation of decorated dislocation images in X-ray section topographsHOLLAND, A. J; TANNER, B. K.Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 1996, Vol 73, Num 5, pp 1451-1474, issn 1364-2804Article

Angle-sensitive X-ray topographs obtained with kossel linesWITTRY, D. B; SONGQUAN SUN; CHANG, W. Z et al.Journal of applied crystallography. 1991, Vol 24, pp 999-1004, issn 0021-8898, 6Article

Plane wave topography on crystals with step-like impurity distributionsALTER, U; HÄRTWIG, J; KUBĚNA, J et al.Czechoslovak journal of physics. 1985, Vol 35, Num 2, pp 158-167, issn 0011-4626Article

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