XIV International Materials Research Congress: Symposium 7, Cancun, MexicoRALPH, B; VELUMANI, S; PEREZ CAMPOS, Ramiro et al.Materials characterization. 2007, Vol 58, Num 8-9, issn 1044-5803, 179 p.Conference Proceedings

Characterization of vacuum-evaporated ZnSe thin filmsVENKATACHALAM, S; JEYACHANDRAN, Y. L; SURESHKUMAR, P et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 794-799, issn 1044-5803, 6 p.Conference Paper

Thermal oxidation of single crystalline aluminum nitrideCHAUDHURI, J; NYAKITI, L; LEE, R. G et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 672-679, issn 1044-5803, 8 p.Conference Paper

Electrical conduction in zinc phosphide thin filmsSATHYAMOORTHY, R; SHARMILA, C; SUDHAGAR, P et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 730-734, issn 1044-5803, 5 p.Conference Paper

Electrodeposition and characterization of HgSe thin filmsMAHALINGAM, T; KATHALINGAM, A; SANJEEVIRAJA, C et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 735-739, issn 1044-5803, 5 p.Conference Paper

Conduction processes in tin-and silicon-phthalocyanine thin filmsFLORES GRACIA, F; SOSA SANCHEZ, A; SOSA SANCHEZ, J. Luis et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 829-833, issn 1044-5803, 5 p.Conference Paper

TiO₂ thin film gas sensor for monitoring ammoniaKAMNAGARAN, B; UTHIRAKUMAR, Periyayya; CHUNG, S. J et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 680-684, issn 1044-5803, 5 p.Conference Paper

High conductivity a-C:N thin films prepared by electron gun evaporationREBOLLO-PLATA, B; LOZADA-MORALES, R; PALOMINO-MERINO, R et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 809-816, issn 1044-5803, 8 p.Conference Paper

Electrochemical deposition and characterization of Ni-P alloy thin filmsMAHALINGAM, T; RAJA, M; THANIKAIKARASAN, S et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 800-804, issn 1044-5803, 5 p.Conference Paper

Morphological characteristics of the rapidly and conventionally solidified alloys of the AlCuFe systemROSAS, G; REYES-GASGA, J; PEREZ, R et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 765-770, issn 1044-5803, 6 p.Conference Paper

Characterization of Bismuth Telluride thin films - : Flash evaporation methodDHEEPA, J; SATHYAMOORTHY, R; VELUMANI, S et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 782-785, issn 1044-5803, 4 p.Conference Paper

Structural, morphological and interfacial characterization of Al-Mg/TiC compositesCONTRERAS, A; ANGELES-CHAVEZ, C; FLORES, O et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 685-693, issn 1044-5803, 9 p.Conference Paper

The effect of annealing on vacuum-evaporated copper selenide and indium telluride thin filmsPERANANTHAM, P; JEYACHANDRAN, Y. L; VISWANATHAN, C et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 756-764, issn 1044-5803, 9 p.Conference Paper

Effect of artificial aging on the microstructure of weldment on API 5L X-52 steel pipeVARGAS-ARISTA, B; HALLEN, J. M; ALBITER, A et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 721-729, issn 1044-5803, 9 p.Conference Paper

Characterization of sodium phenytoin co-gelled with titania for a controlled drug-release systemLOPEZ, T; QUINTANA, P; ORTIZ-ISLAS, E et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 823-828, issn 1044-5803, 6 p.Conference Paper

Space charge limited current conduction in Bi₂Te₃ thin filmsSATHYAMOORTHY, R; DHEEPA, J; VELUMANI, S et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 842-846, issn 1044-5803, 5 p.Conference Paper

Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin filmsVENKATACHALAM, S; SOUNDARARAJAN, D; PERANANTHAM, P et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 715-720, issn 1044-5803, 6 p.Conference Paper

Gas-sensing characteristics of undoped-SnO₂ thin films and Ag/SnO₂ and SnO₂/Ag structures in a propane atmosphereAGUILAR-LEYVA, J; MALDONADO, A; OLVERA, M. De La L et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 740-744, issn 1044-5803, 5 p.Conference Paper

Structural and photoelectrical characterization of hot wall deposited CuInSe₂ thin films and the fabrication of CuInSe₂ based solar cellsAGILAN, S; VENKATACHALAM, S; MANGALARAJ, D et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 701-707, issn 1044-5803, 7 p.Conference Paper

Prediction and identification of calcium-rich phases in Al-Si alloys by electron backscatter diffraction EBSD/SEMZALDIVAR-CADENA, A. A; FLORES-VALDES, A.Materials characterization. 2007, Vol 58, Num 8-9, pp 834-841, issn 1044-5803, 8 p.Conference Paper

Structural and magnetic properties of mechanically milled Y_1-xPr_xCo₅ compounds [x=0, 0.1, 0.3, 0.5]ELIZALDE GALINDO, J. T; DAVIES, H. A; MATUTES-AQUINO, J. A et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 805-808, issn 1044-5803, 4 p.Conference Paper