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Geometrical limits and improvement of the diffraction optics in Gandolfi camerasGREGORKIEWITZ, M.Journal of applied crystallography. 1994, Vol 27, pp 855-859, issn 0021-8898, 5Article

The discovery of the diffraction of X-rays in crystals : a historical reviewHILDEBRANDT, G.Crystal research and technology (1979). 1993, Vol 28, Num 6, pp 747-766, issn 0232-1300Article

A Hewlett-Packard ScanJet scanner with transparencies adaptor at X-ray fibre diffraction photograph densitometerIANNELLI, P.Journal of applied crystallography. 1996, Vol 29, pp 491-492, issn 0021-8898, 4Article

Crystal structure of triaquadihydrogen triaquatris(oxydiacetato)dieuropate(II)STARYNOWICZ, P.Journal of alloys and compounds. 1995, Vol 224, Num 2, pp 217-219, issn 0925-8388Article

An inexpensive technique for handling solvent-dependent crystalsDRAKE, S. R.Journal of applied crystallography. 1994, Vol 27, pp 198-199, issn 0021-8898, 2Article

Angle calculations for a six-circle surface X-ray diffractometerLOHMEIER, M; VLIEG, E.Journal of applied crystallography. 1993, Vol 26, pp 706-716, issn 0021-8898, 5Article

Strong luminescence emission enhancement by wet oxidation of pyrolytic silicon nanopowdersD'AMATO, R; FALCONIERI, M; CARPANESE, M et al.Applied surface science. 2007, Vol 253, Num 19, pp 7879-7883, issn 0169-4332, 5 p.Conference Paper

Studies on peroxomolybdates. XVIII: Crystal structure of ammonium μ-fluoro-μ-oxo-bis[oxodiperoxomolybdate(VI)]-water(2/1), (NH₄)₃[FO{MoO(O₂)₂}₂].1/2H₂O, a dibridged peroxodimolybdateSTOMBERG, R.Journal of alloys and compounds. 1995, Vol 229, Num 2, pp 227-232, issn 0925-8388Article

Electron holography and holographic diffraction for surface studiesCOWLEY, J. M.Surface science. 1993, Vol 298, Num 2-3, pp 336-344, issn 0039-6028Conference Paper

Texture and deformation mechanism in yttriumADAMESKU, R. A; GREBENKIN, S. V; STEPANENKO, A. V et al.Physics of metals and metallography. 1992, Vol 74, Num 5, pp 535-537, issn 0031-918XArticle

On the use of the merging R factor as a quality indicator for X-ray dataWEISS, M. S; HILGENFELD, R.Journal of applied crystallography. 1997, Vol 30, pp 203-205, issn 0021-8898, 2Article

A simple and convenient system for an optical method for crystal orientationZHOU, X; XU, X.Crystal research and technology (1979). 1996, Vol 31, Num 1, pp K9-K10, issn 0232-1300Article

Umweg peak intensity dependence on the incident X-ray beam polarization modeALEXANDROPOULOS, N. G; KOTSIS, K. T.Solid state communications. 1994, Vol 89, Num 1, pp 73-75, issn 0038-1098Article

Preparation, characterization and crystal structure of 4,4'-bipyridinium nitrate trinitratodioxo-uranium(VI) and 4,4'-dipyridinium diaque hexanitrato-thorate(IV)RAMMO, N. N; HAMID, K. R; IBRAHIM, T. K et al.Journal of alloys and compounds. 1994, Vol 210, pp 319-324, issn 0925-8388Article

Microstructure and giant magnetoresistance in Co/Ag filmsTSOUKATOS, A; WAN, H; HADJIPANAYIS, G. C et al.IEEE transactions on magnetics. 1993, Vol 29, Num 6, pp 2726-2728, issn 0018-9464, 1Conference Paper

X-ray diffraction in crystals in the presence of laser-induced dynamic gratingsPOLIKARPOV, I.Journal of physics. D, Applied physics (Print). 1996, Vol 29, Num 8, pp 2148-2155, issn 0022-3727Article

XRD studies of H-T phase diagrams of Er and HoBULATOV, A. S; DOLZHENKO, V. F; KORNIETS, A. V et al.Journal of magnetism and magnetic materials. 1995, Vol 147, Num 3, pp 403-405, issn 0304-8853Article

A rapid method to assess X-ray area detectors by oriented protein crystal diffractionPHILLIPS, J. C.Journal of applied crystallography. 1994, Vol 27, pp 853-854, issn 0021-8898, 5Article

Angle calculations for a five-circle diffractometer used in surface X-ray diffraction experimentsWANG, S.-K; DAI, P; TAUB, H et al.Journal of applied crystallography. 1993, Vol 26, pp 697-705, issn 0021-8898, 5Article

Carbon distribution over states in tempered steelBELOUS, M. V; NOVOZHILOV, V. B; SHATALOVA, L. A et al.Physics of metals and metallography. 1995, Vol 79, Num 4, pp 444-449, issn 0031-918XArticle

Electronic memory switching in a new charge transfer-complex thin filmWANG, K. Z; XUE, Z. Q; OUYANG, M et al.Solid state communications. 1995, Vol 96, Num 7, pp 481-484, issn 0038-1098Article

The effect of a superimposed strain field on frictional texture measurementsHYATT, S. O; BIELER, T. R.Wear. 1995, Vol 184, Num 2, pp 245-247, issn 0043-1648Article

High-resolution x-ray optics for third-generation synchroton radiationISHIKAWA, T.Journal of physics. D, Applied physics (Print). 1995, Vol 28, Num 4A, pp A256-A261, issn 0022-3727Conference Paper

X-ray diffraction tomography at the Australian National Beamline FacilityGRANT, J. A; DAVIS, J. R; WELLS, P et al.Optical engineering (Bellingham. Print). 1994, Vol 33, Num 8, pp 2803-2807, issn 0091-3286Article