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au.\*:("YIQUN XIE")

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Phase modulations due to collisions of beam pairs in nonlocal nonlinear mediaYIQUN XIE; QI GUO.Optical and quantum electronics. 2004, Vol 36, Num 15, pp 1335-1351, issn 0306-8919, 17 p.Article

Reliable lateral manipulation of a single Ag adatom on a Ag(1 1 1) surface with a trimer-apex tipYIQUN XIE; WANGZHOU SHI; GUOPING DU et al.Applied surface science. 2010, Vol 256, Num 5, pp 1502-1506, issn 0169-4332, 5 p.Article

Size and orientation dependent melting properties and behavior of wurtzite CdSe nanowiresBING FU; NA CHEN; YIQUN XIE et al.Computational materials science. 2014, Vol 84, pp 293-300, issn 0927-0256, 8 p.Article

A study of the size-dependent elastic properties of CdSe nanowiresNA CHEN; YIQUN XIE; FENG LIU et al.Computational materials science. 2013, Vol 77, pp 245-249, issn 0927-0256, 5 p.Article

Theoretical studies of the lithium atom on the silicon carbide nanotubesGUOLONG YU; NA CHEN; FEIFEI WANG et al.Journal of nanoparticle research. 2014, Vol 16, Num 12, issn 1388-0764, 2749.1-2749.12Article

Pressure-induced structural transition of ZnO nanocrystals studied with molecular dynamicsXINWEI DONG; FENG LIU; YIQUN XIE et al.Computational materials science. 2012, Vol 65, pp 450-455, issn 0927-0256, 6 p.Article

Diffusions of small clusters on Pt(1 1 1) and Cu(1 1 1) surfacesJIANXING JIANG; PENG ZHANG; YIQUN XIE et al.Applied surface science. 2008, Vol 254, Num 18, pp 5822-5826, issn 0169-4332, 5 p.Article

First-principles study of Ni/Ni3Al interface strengthening by alloying elementsGONG, Xiu-Fang; GONG XIANYANG; YOUHENGFU et al.Computational materials science. 2009, Vol 47, Num 2, pp 320-325, issn 0927-0256, 6 p.Article

Solute diffusion in the γ' phase of Ni based alloysGONG, Xiu-Fang; GONG XIAN YANG; YOU HENG FU et al.Computational materials science. 2009, Vol 47, Num 1, pp 232-236, issn 0927-0256, 5 p.Article

A 6.25-Gb/s binary transceiver in 0.13-μm CMOS for serial data transmission across high loss legacy backplane channelsPAYNE, Robert; LANDMAN, Paul; YIQUN XIE et al.IEEE journal of solid-state circuits. 2005, Vol 40, Num 12, pp 2646-2657, issn 0018-9200, 12 p.Article

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