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Two- and three-dimensional methods for inspection and metrology VI (10-11 August 2008, San Diego, California, USA)Huang, Peisen S; Yoshizawa, Tōru; Harding, Kevin G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1Vol, various pagings, isbn 978-0-8194-7286-1 0-8194-7286-7Conference Proceedings

Optical inspection and metrology for non-optics industries (3-4 August 2009, San Diego, California, United States)Huang, Peisen S; Yoshizawa, Tōru; Harding, Kevin G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 1 vol, isbn 978-0-8194-7722-4 0-8194-7722-2Conference Proceedings

Optomechatronic systems III (Stuttgart, 12-14 November 2002)Yoshizawa, Toru.SPIE proceedings series. 2002, isbn 0-8194-4689-0, XI, 748 p, isbn 0-8194-4689-0Conference Proceedings

Spectroscopic topological Stokes polarimeterWAKAYAMA, Toshitaka; OTANI, Yukitoshi; YOSHIZAWA, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785504.1-785504.7Conference Paper

Three-dimensional profilometry system incorporating a MEMS scannerYOSHIZAWA, Toru; WAKAYAMA, Toshitaka.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 74320P.1-74320P.8Conference Paper

Color pattern projection method for three-dimensional measurementWAKAYAMA, Toshitaka; YOSHIZAWA, Toru.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330A.1-81330A.6Conference Paper

Stokes parameters of reflected and scattered light by a rough surfaceJIN, Lianhua; TAKIZAWA, Kuniharu.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 74320B.1-74320B.9Conference Paper

Camera-based 10KHz distance gageABRAMOVICH, Gil; HARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660G.1-70660G.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Digital Multiple Wavelength Phase Shifting AlgorithmSONG ZHANG.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 74320N.1-74320N.11Conference Paper

Challenges and opportunities for 3D optical metrology : what is needed today from an industry perspectiveHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660F.1-70660F.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

3-D shape measurement by use of a modified Fourier transform methodHONG GUO; HUANG, Peisen S.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660E.1-70660E.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Geometric errors in 3D optical metrology systemsHARDING, Kevin; NAFIS, Chris.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 706603.1-706603.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Merging of range images for inspection or safety applicationsMURE-DUBOIS, James; HÜGLI, Heinz.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660K.1-70660K.12, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

New Calibration Technique for a Novel Stereo CameraXUE TU; SUBBARAO, Murali.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 743205.1-743205.8Conference Paper

Simultaneous measurement-of internal and external profiles using a ring beam deviceWAKAYAMA, Toshitaka; YOSHIZAWA, Tom.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660D.1-70660D.6, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Comparison of projection means for structured light systemsHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 74320S.1-74320S.10Conference Paper

Measure of roughness of paper using specklePINO, Abdiel; PLADELLORENS, Josep.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 74320E.1-74320E.9Conference Paper

High Dynamic Range Scanning TechniqueSONG ZHANG; YAU, Shing-Tung.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660A.1-70660A.9, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Phase shifting shadow moiré using the Carré algorithmHUANG, Peisen S; HONG GUO.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660B.1-70660B.7, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Optical metrology and inspection for industrial applications (18-20 October 2010, Beijing, China)Harding, Kevin; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 1 vol, isbn 978-0-8194-8385-0Conference Proceedings

Three-dimensional profilometry based on focus method by projecting LC grating patternOTANI, Yukitoshi; KOBAYASHI, Fumio; MIZUTANI, Yasuhiro et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 743210.1-743210.6Conference Paper

Development of a probe for inner profile measurement and flaw detectionYOSHIZAWA, Toru; WAKAYAMA, Toshitaka; KAMAKURA, Yoshihisa et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330D.1-81330D.6Conference Paper

Liquid crystal grating for profilometry using structured lightYOSHIZAWA, Toru; FUJITA, Hiroo.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000H.1-60000H.10, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

PEM-Based Polarimeters For Industrial ApplicationsBAOLIANG WANG.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785502.1-785502.14Conference Paper

Surface profile measurement by grating projection method with dual-projection opticsYAMAMOTO, Masayuki; YOSHIZAWA, Toru.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000I.1-60000I.8, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

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