Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("Yoshizawa, Toru")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 428

  • Page / 18
Export

Selection :

  • and

Optomechatronic systems III (Stuttgart, 12-14 November 2002)Yoshizawa, Toru.SPIE proceedings series. 2002, isbn 0-8194-4689-0, XI, 748 p, isbn 0-8194-4689-0Conference Proceedings

Spectroscopic topological Stokes polarimeterWAKAYAMA, Toshitaka; OTANI, Yukitoshi; YOSHIZAWA, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785504.1-785504.7Conference Paper

Optical metrology and inspection for industrial applications (18-20 October 2010, Beijing, China)Harding, Kevin; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 1 vol, isbn 978-0-8194-8385-0Conference Proceedings

Three-dimensional profilometry system incorporating a MEMS scannerYOSHIZAWA, Toru; WAKAYAMA, Toshitaka.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 74320P.1-74320P.8Conference Paper

Color pattern projection method for three-dimensional measurementWAKAYAMA, Toshitaka; YOSHIZAWA, Toru.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330A.1-81330A.6Conference Paper

Dimensional optical metrology and inspection for practical applications (222-23 August 2011, San Diego, California, United States)Harding, Kevin G; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 1 vol, isbn 978-0-8194-8743-8Conference Proceedings

Optical FMCW Interference -a New Technology for Optical MetrologyGANG ZHENG.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78550Q.1-78550Q.7Conference Paper

PEM-Based Polarimeters For Industrial ApplicationsBAOLIANG WANG.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785502.1-785502.14Conference Paper

Optoelectronic imaging and multimedia technology (18-20 October 2010, Beijing, China)Yoshizawa, Toru; Ping Wei; Zheng, Jesse et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7850, issn 0277-786X, isbn 978-0-8194-8380-5, 1 vol, isbn 978-0-8194-8380-5Conference Proceedings

3D profilometry: Next requests from the industrial view pointHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785513.1-785513.11Conference Paper

The Research of On-line Inspection Method of Printed Matter Based on Optical Information ProcessingWANG JIA.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78551T.1-78551T.6Conference Paper

Three-dimensional profilometry based on focus method by projecting LC grating patternOTANI, Yukitoshi; KOBAYASHI, Fumio; MIZUTANI, Yasuhiro et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 743210.1-743210.6Conference Paper

Development of a probe for inner profile measurement and flaw detectionYOSHIZAWA, Toru; WAKAYAMA, Toshitaka; KAMAKURA, Yoshihisa et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330D.1-81330D.6Conference Paper

Liquid crystal grating for profilometry using structured lightYOSHIZAWA, Toru; FUJITA, Hiroo.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000H.1-60000H.10, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

Optical inspection and metrology for non-optics industries (3-4 August 2009, San Diego, California, United States)Huang, Peisen S; Yoshizawa, Tōru; Harding, Kevin G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 1 vol, isbn 978-0-8194-7722-4 0-8194-7722-2Conference Proceedings

Surface profile measurement by grating projection method with dual-projection opticsYAMAMOTO, Masayuki; YOSHIZAWA, Toru.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000I.1-60000I.8, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

Two- and three-dimensional methods for inspection and metrology VI (10-11 August 2008, San Diego, California, USA)Huang, Peisen S; Yoshizawa, Tōru; Harding, Kevin G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1Vol, various pagings, isbn 978-0-8194-7286-1 0-8194-7286-7Conference Proceedings

Applications of a MEMS scanner to profile measurementYOSHIZAWA, Toru; WAKAYAMA, Toshitaka; TAKANO, Hiroshi et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620B.1-67620B.5, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Generation of vortex spectra based on geometric phase for optical tweezersWAKAYAMA, Toshitaka; OTANI, Yukitoshi; YOSHIZAWA, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7266, pp 72660A.1-72660A.6, issn 0277-786X, isbn 978-0-8194-7518-3 0-8194-7518-1, 1VolConference Paper

Study on three-dimensional shape measurement of partially diffuse and specular reflective surfaces with fringe projection technique and fringe reflection techniqueLEI HUANG; ASUNDI, Anand.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 813304.1-813304.7Conference Paper

3-D Profile Measurement by Using Projection Speckle Pattern Correlation MethodERYI HU; LIXIA ZHU.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78551F.1-78551F.6Conference Paper

A palm-top camera for 3D profilometry incorporating a MEMS scannerYOSHIZAWA, T; WAKAYAMA, T.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78550D.1-78550D.8Conference Paper

Application of photoelectric autocollimator in detecting position precision of NC motorized stageYAN, Bixi; TAN, Qimeng; LV, Naiguang et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78551K.1-78551K.7Conference Paper

Measurement of the Elastic Modulus of Solid Material with Objective Speckles FieldRAN, Ping; FAN, Zebin; XIA, Haiting et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785507.1-785507.6Conference Paper

Pose estimation from four corresponding points with a single cameraPENG WANG; YONGJUN ZHOU; QIUZI ZHANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78551I.1-78551I.9Conference Paper

  • Page / 18