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au.\*:("ZAGHLOUL ARM")

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MODIFIED O'BRYAN ELLIPSOMETER (MOE) FOR FILM-SUBSTRATE SYSTEMSZAGHLOUL ARM.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 27; NO 1; PP. 1-3; BIBL. 5 REF.Article

CONSTANT-PSI CONSTANT-DELTA CONTOUR MAPS: APPLICATIONS TO ELLIPSOMETRY AND TO REFLECTION TYPE OPTICAL DEVICESZAGHLOUL ARM; AZZAM RMA.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 4; PP. 739-743; BIBL. 6 REF.Article

SIO2-SI FILM-SUBSTRATE REFLECTION POLARIZERS FOR DIFFERENT MERCURY SPECTRAL LINES.ZAGHLOUL ARM; AZZAM RMA.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 6; PP. 1488-1489; BIBL. 2 REF.Article

POLARIZATION-INDEPENDENT RELFECTANCE MATCHING (PIRM) A TECHNIQUE FOR THE DETERMINATION OF THE REFRACTIVE INDEX AND THICKNESS OF TRANSPARENT FILMS.AZZAM RMA; ZAGHLOUL ARM.1977; J. OPT.; FR.; DA. 1977; VOL. 8; NO 3; PP. 201-205; ABS. FR.; BIBL. 11 REF.Article

SINGLE ELEMENT ROTATING POLARIZER ELLIPSOMETER FOR FILM-SUBSTRATE SYSTEMS.ZAGHLOUL ARM; AZZAM RMA.1977; J. OPT. SOC. AMER.; U.S.A.; DA. 1977; VOL. 67; NO 9; PP. 1286-1287; BIBL. 5 REF.Article

DETERMINATION OF THE REFRACTAIRE INDEX AND THICKNESS OF A TRANSPARENT FILM ON A TRANSPARENT SUBSTRATE FROM THE ANGLES OF INCIDENCE OF ZERO REFLECTION-INDUCED ELLIPTICITY.AZZAM RMA; ZAGHLOUL ARM.1978; OPT. COMMUNIC.; NETHERL.; DA. 1978; VOL. 24; NO 3; PP. 351-354; BIBL. 3 REF.Article

PRINCIPAL ANGLE, PRINCIPLE AZIMUTH, AND PRINCIPAL-ANGLE ELLIPSOMETRY OF FILM-SUBSTRATE SYSTEMS.AZZAM RMA; ZAGHLOUL ARM.1977; J. OPT. SOC. AMER.; U.S.A.; DA. 1977; VOL. 67; NO 8; PP. 1058-1065; BIBL. 21 REF.Article

AN ANGLE-OF-INCIDENCE TUNABLE, SIO2-SI (FILM-SUBSTRATE) REFLECTION RETARDER FOR THE UV NERCURY LINE LAMBDA =2537 A.ZAGHLOUL ARM; AZZAM RMA; BASHARA NM et al.1975; OPT. COMMUNIC.; NETHERL.; DA. 1975; VOL. 14; NO 2; PP. 260-262; BIBL. 3 REF.Article

POLARIZER-SURFACE-ANALYZER NULL ELLIPSOMETRY FOR FILM-SUBSTRATE SYSTEMS.AZZAM RMA; ZAGHLOUL ARM; BASHARA NM et al.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 12; PP. 1464-1471; BIBL. 17 REF.Article

SIO2-SI-SUBSTRATE SINGLE-REFLECTION RETARDERS FOR DIFFERENT MERCURY SPECTRAL LINES.ZAGHLOUL ARM; AZZAM RMA; BASHARA NM et al.1978; OPT. ENGNG; U.S.A.; DA. 1978; VOL. 17; NO 2; PP. 180-184; BIBL. 4 REF.Article

CHARACTERISTIC TIME OF OXYGEN: CALCULATIONS AND THEORETICAL STUDY.ZAGHLOUL ARM; RADWAN RM; ABOU SEADA MS et al.1976; I.E.E.E. TRANS. ELECTR. INSULAT.; U.S.A.; DA. 1976; VOL. 11; NO 1; PP. 28-32; BIBL. 6 REF.Article

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