THE ELECTRONIC AND NUCLEAR STOPPING OF ENERGETIC IONS.ZIEGLER JF.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 8; PP. 544-546; BIBL. 34 REF.Article

MATERIAL ANALYSIS WITH ION BEAMS.ZIEGLER JF.1976; PHYS. TODAY; U.S.A.; DA. 1976; VOL. 29; NO 11; PP. 52-59; BIBL. 14 REF.Article

LOW-VELOCITY STOPPING OF HEAVY IONS.NESBET RK; ZIEGLER JF.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 12; PP. 810-812; BIBL. 20 REF.Article

THE EFFECT OF SEA LEVEL COSMIC RAYS ON ELECTRONIC DEVICESZIEGLER JF; LANFORD WA.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 6; PP. 4305-4312; BIBL. 15 REF.Article

AN ANALYTIC SOLUTION TO ELASTIC BACKSCATTERING.CHU WK; ZIEGLER JF.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 6; PP. 2768-2770; BIBL. 12 REF.Article

SPECIFIC ENERGY LOSS OF ⁴HE IONS IN SILICON (AMORPHOUS, POLYCRYSTALLINE, AND SINGLE CRYSTAL)ZIEGLER JF; BRODSKY MH.1973; J. APPL. PHYS.; U.S.A.; DA. 1973; VOL. 44; NO 1; PP. 188-196; BIBL. 19 REF.Serial Issue

RANGES OF ENERGETIC IONS IN MATTER = PORTEES DES IONS ENERGETIQUES DANS LA MATIERELITTMARK U; ZIEGLER JF.1981; PHYS. REV. A; ISSN 0556-2791; USA; DA. 1981; VOL. 23; NO 1; PP. 64-72; BIBL. 36 REF.Article

THERMAL STABILITY OF A PROPOSED MAGNETIC BUBBLE METALLURGY.ZIEGLER JF; BAGLIN JEE; GANGULEE A et al.1974; APPL. PHYS. LETTERS; U.S.A.; DA. 1974; VOL. 24; NO 1; PP. 36-39; BIBL. 13 REF.Article

PROPERTIES OF SIO₂ GROWN IN THE PRESENCE OF HCL OR CL₂.VAN DER MEULEN YL; OSBURN CM; ZIEGLER JF et al.1975; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1975; VOL. 122; NO 2; PP. 284-290; BIBL. 33 REF.Article

CHARACTERISTIC AND NONCHARACTERISTIC X RAYS PRODUCED DURING 1-MEV ARGON BOMBARDMENT OF SILICON.LURIO AL; CAIRNS JA; ZIEGLER JF et al.1975; PHYS. REV., A; U.S.A.; DA. 1975; VOL. 12; NO 2; PP. 498-501; BIBL. 17 REF.Article

DENSITIES OF AMORPHOUS SI FILMS BY NUCLEAR BACKSCATTERINGBRODSKY MH; KAPLAN D; ZIEGLER JF et al.1972; APPL. PHYS. LETTERS; U.S.A.; DA. 1972; VOL. 21; NO 7; PP. 305-307; BIBL. 29 REF.Serial Issue

DETERMINATION OF THE NEAR-SURFACE ELEMENTAL COMPOSITION OF CATALYSTS BY THE TECHNIQUE OF PROTON-INDUCED X-RAY ANALYSIS.CAIRNS JA; LURIO A; ZIEGLER JF et al.1976; J. CATALYS.; U.S.A.; DA. 1976; VOL. 45; NO 1; PP. 6-14; BIBL. 8 REF.Article

QUANTITATIVE ANALYSIS OF COMPLEX TARGETS BY PROTON-INDUCED X RAYSREUTER W; LURIO A; CARDONE F et al.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 7; PP. 3194-3202; BIBL. 25 REF.Article

ANALYSIS OF FORMATION OF HAFNIUM SILICIDE ON SILICONKIRCHER CJ; MAYER JW; TU KN et al.1973; APPL. PHYS. LETTERS; U.S.A.; DA. 1973; VOL. 22; NO 2; PP. 81-83; BIBL. 12 REF.Serial Issue