EFFECT OF A TEMPERATURE VARIATION ON THE OPTICAL PROPERTIES OF FABRY-PEROT INTERFERENCE FILTERSPERSIN M; PERSIN A; ZORC H et al.1978; THIN SOLID FILMS; NLD; DA. 1978; VOL. 51; NO 1; PP. L1-L4; BIBL. 5 REF.Article

Refractive index profiling of CeO₂ thin films using reverse engineering methodsJANICKI, V; ZORC, H.Thin solid films. 2002, Vol 413, Num 1-2, pp 198-202, issn 0040-6090Article

Critical intensity decrease in bistable thin film optical multilayers : a new approachZORC, H; PERSIN, A.Vacuum. 1992, Vol 43, Num 5-7, pp 467-469, issn 0042-207XConference Paper

Modified box coaters can improve oxide coatingsZORC, H; JOHNSON, R. JR; SNOWDON, K et al.Laser focus world. 1999, Vol 35, Num 10, pp 141-142, issn 1043-8092Article

Formation of Ge islands from a Ge layer on Si substrate during post-growth annealingKOVACEVIC, I; PIVAC, B; DUBCEK, P et al.Applied surface science. 2007, Vol 253, Num 6, pp 3034-3040, issn 0169-4332, 7 p.Article

Multilayer based interferential-plasmonic structure: metal cluster 3D grating combined with dielectric mirrorJANICKI, V; SANCHO-PARRAMON, J; ZORC, H et al.Applied physics. A, Materials science & processing (Print). 2011, Vol 103, Num 3, pp 517-519, issn 0947-8396, 3 p.Article

Silicon nanoparticles formation in annealed SiO/SiO₂ multilayersKOVACEVIC, I; DUBCEK, P; DUGUAY, S et al.Physica. E, low-dimentional systems and nanostructures. 2007, Vol 38, Num 1-2, pp 50-53, issn 1386-9477, 4 p.Conference Paper

Modification of optical properties of metal island films by electric field assisted dissolution of clustersSANCHO-PARRAMON, J; JANICKI, V; ZORC, H et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7101, pp 71011X.1-71011X.7, issn 0277-786X, isbn 978-0-8194-7331-8 0-8194-7331-6, 1VolConference Paper

Medium range ordering of amorphous silicon-carbon alloys studied by GISAXS, optical spectroscopy and IBAGRACIN, D; DUBCEK, P; ZORC, H et al.Thin solid films. 2004, Vol 459, Num 1-2, pp 216-219, issn 0040-6090, 4 p.Conference Paper

Structural analysis of annealed amorphous SiO/SiO₂ superlatticePIVAC, B; DUBCEK, P; CAPAN, I et al.Thin solid films. 2008, Vol 516, Num 20, pp 6796-6799, issn 0040-6090, 4 p.Conference Paper