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Some Semiconductor Device Physics Considerations and ClarificationsXUAN YANG; SCHRODER, Dieter K; FELLOW, Life et al.I.E.E.E. transactions on electron devices. 2012, Vol 59, Num 7, pp 1993-1996, issn 0018-9383, 4 p.Article

Physical Foundation of a Recently Proposed Schottky-Contact ModelSCHROEDER, Dietmar.I.E.E.E. transactions on electron devices. 2011, Vol 58, Num 3, pp 874-875, issn 0018-9383, 2 p.Article

Simple Analytical Bulk Current Model for Long-Channel Double-Gate Junctionless TransistorsDUARTE, Juan P; CHOI, Sung-Jin; MOON, Dong-Ii et al.IEEE electron device letters. 2011, Vol 32, Num 6, pp 704-706, issn 0741-3106, 3 p.Article

A Full-Range Drain Current Model for Double-Gate Junctionless TransistorsJUAN PABLO DUARTE; CHOI, Sung-Jin; CHOI, Yang-Kyu et al.I.E.E.E. transactions on electron devices. 2011, Vol 58, Num 12, pp 4219-4225, issn 0018-9383, 7 p.Article

Random Telegraph Noise Effect on the Programmed Threshold-Voltage Distribution of Flash MemoriesMONZIO COMPAGNONI, Christian; GHIDOTTI, Michele; LACAITA, Andrea L et al.IEEE electron device letters. 2009, Vol 30, Num 9, pp 984-986, issn 0741-3106, 3 p.Article

Modeling of tunneling P/E for nanocrystal memoriesMONZIO COMPAGNONI, Christian; IELMINI, Daniele; SPINELLI, Alessandro S et al.I.E.E.E. transactions on electron devices. 2005, Vol 52, Num 4, pp 569-576, issn 0018-9383, 8 p.Article

Analytical Model of Trapping Effects in Organic Thin-Film TransistorsERLEN, Christoph; LUGLI, Paolo.I.E.E.E. transactions on electron devices. 2009, Vol 56, Num 4, pp 546-552, issn 0018-9383, 7 p.Article

Charging Dynamics in Electrically Pumped Quantum WellsBÄUMNER, Ada; KIRA, Mackillo; KOCH, Stephan W et al.IEEE journal of quantum electronics. 2009, Vol 45, Num 7-8, pp 1024-1032, issn 0018-9197, 9 p.Article

Coherent kinks in high-power ridge waveguide laser diodesACHTENHAGEN, Martin; HARDY, Amos A; HARDER, Chnstoph S et al.Journal of lightwave technology. 2006, Vol 24, Num 5, pp 2225-2232, issn 0733-8724, 8 p.Article

Understanding quasi-ballistic transport in nano-MOSFETs: Part I-Scattering in the channel and in the drainPALESTRI, Pierpaolo; ESSENI, David; EMINENTE, Simone et al.I.E.E.E. transactions on electron devices. 2005, Vol 52, Num 12, pp 2727-2735, issn 0018-9383, 9 p.Article

A Memristor SPICE Implementation and a New Approach for Magnetic Flux-Controlled Memristor ModelingBATAS, Daniel; FIEDLER, Horst.IEEE transactions on nanotechnology. 2011, Vol 10, Num 2, pp 250-255, issn 1536-125X, 6 p.Article

Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Methodology : CHARACTERIZATION OF NANO CMOS VARIABIALITY BY SIMULATION AND MEASUREMENTSLORENZ, Jürgen K; BAR, Eberhard; CLEES, Tanja et al.I.E.E.E. transactions on electron devices. 2011, Vol 58, Num 8, pp 2218-2226, issn 0018-9383, 9 p.Article

Improved Calculation of Charge Collection Probability From Within the Junction WellONG, Vincent K. S; TAN, Chee Chin; KUMIAWAN, Oka et al.I.E.E.E. transactions on electron devices. 2011, Vol 58, Num 12, pp 4434-4437, issn 0018-9383, 4 p.Article

The Charge Plasma P-N DiodeHUETING, Raymond J. E; RAJASEKHARAN, Bijoy; SALM, Cora et al.IEEE electron device letters. 2008, Vol 29, Num 12, pp 1367-1369, issn 0741-3106, 3 p.Article

Accurate boundary integral calculation in semiconductor device simulationGUSMEROLI, Riccardo; SPINELLI, Alessandro S.I.E.E.E. transactions on electron devices. 2006, Vol 53, Num 7, pp 1730-1733, issn 0018-9383, 4 p.Article

Two-dimensional modeling of front contact silicon solar cellsLUQUE, A; TOBIAS, I; GIDON, P et al.Progress in photovoltaics. 2004, Vol 12, Num 7, pp 503-516, issn 1062-7995, 14 p.Article

Study of hot-carrier-induced photon emission from 90 nm Si MOSFETsGURFINKEL, M; BORENSHTEIN, M; MARGULIS, A et al.Applied surface science. 2005, Vol 248, Num 1-4, pp 62-65, issn 0169-4332, 4 p.Conference Paper

Analysis and optimum design of distributed feedback lasers using coupled-power theoryWANG, J.-Y; CADA, M.IEEE journal of quantum electronics. 2000, Vol 36, Num 1, pp 52-58, issn 0018-9197Article

Monte Carlo calculation of velocity-field characteristics in II-VI compound semiconductorsDUTTA, A; MALLICK, P. S; MUKHOPADHYAY, D et al.International journal of electronics. 1998, Vol 84, Num 3, pp 203-214, issn 0020-7217Article

On the validity of quantum hydrodynamics for describing antidot array devicesBARKER, J. R; FERRY, D. K.Semiconductor science and technology. 1998, Vol 13, Num 8A, pp A135-A139, issn 0268-1242Conference Paper

Dynamic Analysis of Current-Voltage Characteristics of Nanoscale Gated-ThyristorsPAOLUCCI, Giovanni M; MONZIO COMPAGNONI, Christian; CASTELLANI, Niccolò et al.IEEE electron device letters. 2013, Vol 34, Num 5, pp 629-631, issn 0741-3106, 3 p.Article

A Unified Carrier-Transport Model for the Nanoscale Surrounding-Gate MOSFET Comprising Quantum-Mechanical EffectsGUANGXI HU; JINGLUN GU; SHUYAN HU et al.I.E.E.E. transactions on electron devices. 2011, Vol 58, Num 7, pp 1830-1836, issn 0018-9383, 7 p.Article

An Analytical I-V Model for Surrounding-Gate Transistors That Includes Quantum and Velocity Overshoot EffectsROLDAN, J. B; GAMIZ, Francisco; JIMENEZ-MOLINOS, F et al.I.E.E.E. transactions on electron devices. 2010, Vol 57, Num 11, pp 2925-2933, issn 0018-9383, 9 p.Article

Physics of Carrier Backscattering in One-and Two-Dimensional NanotransistorsKIM, Raseong; LUNDSTROM, Mark S.I.E.E.E. transactions on electron devices. 2009, Vol 56, Num 1, pp 132-139, issn 0018-9383, 8 p.Article

Hydrodynamic Simulations of Unitraveling-Carrier PhotodiodesMAHMUDUR RAHMAN, S. M; HJELMGREN, Hans; VUKUSIC, Josip et al.IEEE journal of quantum electronics. 2007, Vol 43, Num 11-12, pp 1088-1094, issn 0018-9197, 7 p.Article

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