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Development of a ToF version of the desktop MiniSIMS : instrument design and applicationsCLIFF, B; ECCLES, A. J; JONES, C et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 699-702, issn 0142-2421, 4 p.Conference Paper

Development of a ToF version of the desktop MiniSIMS utilising a continuous primary ion beamECCLES, A. J; VOHRALIK, P; CLIFF, B et al.Applied surface science. 2006, Vol 252, Num 19, pp 7308-7311, issn 0169-4332, 4 p.Conference Paper

New approach to plasma diagnosticRYABCHIKOV, A. I; RYABCHIKOV, I. A; STEPANOV, I. B et al.Surface & coatings technology. 2007, Vol 201, Num 15, pp 6635-6637, issn 0257-8972, 3 p.Conference Paper

Experimental demonstration of mass-filtered, time-dilated, time-of-flight mass spectrometryDEMORANVILLE, L. T; GRABOWSKI, K. S; KNIES, D. L et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 525-528, issn 0142-2421, 4 p.Conference Paper

18O/16O isotopic separation in anodic tantala films by glow discharge time-of-flight mass spectrometryTEMPEZ, A; CANULESCU, S; SKELDON, P et al.Surface and interface analysis. 2009, Vol 41, Num 12-13, pp 966-973, issn 0142-2421, 8 p.Article

MERLIN, a new high count rate spectrometer at ISISBEWLEY, R. I; ECCLESTON, R. S; MCEWEN, K. A et al.Physica. B, Condensed matter. 2006, Vol 385-86, pp 1029-1031, issn 0921-4526, 3 p., 2Conference Paper

Preliminary characterization of Palaeogene European ambers using ToF-SIMSSODHI, Rana N. S; MIMS, Charles A; GOACHER, Robyn E et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 557-560, issn 0142-2421, 4 p.Conference Paper

Why don't biologists use SIMS? A critical evaluation of imaging MSHEEREN, R. M. A; MCDONNELL, L. A; AMSTALDEN, E et al.Applied surface science. 2006, Vol 252, Num 19, pp 6827-6835, issn 0169-4332, 9 p.Conference Paper

Time-of-flight distributions of HD molecules abstracted at a Si(100) surfaceSATO, S; NARITA, Y; KHAN, A. R et al.Surface science. 2009, Vol 603, Num 16, pp 2607-2611, issn 0039-6028, 5 p.Article

3D-TOFSIMS characterization of black spots in polymer light emitting diodesBULLE-LIEUWMA, C. W. T; VAN DE WEIJER, P.Applied surface science. 2006, Vol 252, Num 19, pp 6597-6600, issn 0169-4332, 4 p.Conference Paper

Time of flight spectra in chemisorptionGORTEL, Z. W; KREUZER, H. J; WEDLER, G et al.Surface science. 1984, Vol 143, Num 1, pp 287-302, issn 0039-6028Article

A fast-atom beam spectrometerFITCH, R. K; ALI, K. S; INMAN, M et al.Journal of physics. E. Scientific instruments. 1984, Vol 17, Num 11, pp 939-941, issn 0022-3735Article

Proteomic analysis of the wing imaginal discs of Drosophila melanogasterALONSO, Jana; SANTAREN, Juan F.Proteomics (Weinheim. Print). 2005, Vol 5, Num 2, pp 474-489, issn 1615-9853, 16 p.Article

The Gated Electrostatic Mass Spectrometer (GEMS) : Definition and Preliminary ResultsHERRERO, Federico A; JONES, Hollis H; LEE, Jeffrey G et al.Journal of the American Society for Mass Spectrometry. 2008, Vol 19, Num 10, pp 1384-1394, issn 1044-0305, 11 p.Conference Paper

A simple device for detecting impact time in impact-echo testing of concreteYICHING LIN; CHIAFENG CHANG; KUO, Shih-Fang et al.NDT & E international. 2004, Vol 37, Num 1, pp 1-8, issn 0963-8695, 8 p.Article

Estimating time and time-lag in time-of-flight velocimetryLADING, L.Applied optics. 1983, Vol 22, Num 22, pp 3637-3643, issn 0003-6935Article

Reduction of matrix effects in TOF-SIMS analysis by metal-assisted SIMS (MetA-SIMS)INOUE, M; MURASE, A.Surface and interface analysis. 2005, Vol 37, Num 12, pp 1111-1114, issn 0142-2421, 4 p.Article

First results with the upgraded IN5 disk chopper cold time-of-flight spectrometerOLLIVIER, J; PLAZANET, M; SCHOBER, H et al.Physica. B, Condensed matter. 2004, Vol 350, Num 1-3, pp 173-177, issn 0921-4526, 5 p.Conference Paper

Two fruit counting techniques for citrus mechanical harvesting machineryEHSANI, M. R; GRIFT, T. E; MAJA, J. M et al.Computers and electronics in agriculture. 2009, Vol 65, Num 2, pp 186-191, issn 0168-1699, 6 p.Article

Adsorption of BTSE and γ-GPS organosilanes on different microstructural regions of 7075-T6 aluminum alloyKIM, J; WONG, P. C; WONG, K. C et al.Applied surface science. 2007, Vol 253, Num 6, pp 3133-3143, issn 0169-4332, 11 p.Article

Nano-crater formation on a Si(1 11)-(7 x 7) surface by slow highly charged ion-impactTONA, Masahide; WATANABE, Hirofumi; TAKAHASHI, Satoshi et al.Surface science. 2007, Vol 601, Num 3, pp 723-727, issn 0039-6028, 5 p.Article

Pulsed r.f.-glow-discharge time-of-flight mass spectrometry for fast surface and interface analysis of conductive and non-conductive materialsHOHL, M; KANZARI, A; MICHLER, J et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 292-295, issn 0142-2421, 4 p.Conference Paper

On the resolution and intensity of a time-of-flight neutron reflectometerVAN WELL, A. A; FREDRIKZE, H.Physica. B, Condensed matter. 2005, Vol 357, Num 1-2, pp 204-207, issn 0921-4526, 4 p.Conference Paper

New findings on the sputtering of neutral metal clustersCOON, S. R; CALAWAY, W. F; PELLIN, M. J et al.Surface science. 1993, Vol 298, Num 1, pp 161-172, issn 0039-6028Article

Direct comparison of performances of TOF atom-probe FIM in the linear and energy-compensated modeMURAKAMI, K; ADACHI, T; KURODA, T et al.Review of scientific instruments. 1984, Vol 55, Num 4, pp 635-637, issn 0034-6748Article

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