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Results 1 to 25 of 125326

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STUDIES OF THE THEORY OF SINGLE AND DOUBLE INJECTIONS IN SOLIDS WITH A GAUSSIAN TRAP DISTRIBUTION.HWANG W; KAO KC.1976; SOLID-STATE ELECTRON.; G.B.; DA. 1976; VOL. 19; NO 12; PP. 1045-1047; BIBL. 7 REF.Article

HOT CARRIER INJECTION AT SEMICONDUCTOR-ELECTROLYTE JUNCTIONSBOUDREAUX DS; WILLIAMS F; NOZIK AJ et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 4; PP. 2158-2163; BIBL. 17 REF.Article

THE MINORITY-CARRIER INJECTION IN THE COMPLETELY DEPLETED MSM STRUCTUREMALACHOWSKI MJ; STEPNIEWSKI J.1981; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1981; VOL. 24; NO 5; PP. 381-385; BIBL. 9 REF.Article

THEORY OF MINORITY-CARRIER INJECTIONMANIFACIER JC; HENISCH HK; GASIOT J et al.1979; PHYS. REV. LETT.; USA; DA. 1979; VOL. 43; NO 10; PP. 708-711; BIBL. 8 REF.Article

DISCONTINUITIES IN DRIFT SOLUTIONS DUE TO REVERSAL IN AMBIPOLAR DRIFT. INJECTION ANS ACCUMULATION OF HOT CARRIERS.DMITRIEV AP; STEFANOVICH AF; TSENDIN LD et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 46; NO 1; PP. 45-53; ABS. RUSSE; BIBL. 12 REF.Article

EFFET DES CONTACTS SUR LES CARACTERISTIQUES COURANT-TENSION DE STRUCTURES A DOUBLE INJECTION DE PORTEURSZYUGANOV AN; ROMANENKO VF.1979; POLUPROVODN. TEKH. MIKROELEKTRON.; UKR; DA. 1979; NO 29; PP. 37-48; BIBL. 12 REF.Article

ELECTRICAL CONDUCTION OF HOT CARRIERS IN SINGLE-INJECTION SOLID-STATE DIODES WITH EXPONENTIAL TRAP DISTRIBUTIONSHARMA YK.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 8; PP. 5381-5386; BIBL. 17 REF.Article

F.E.M. DANS LES SEMICONDUCTEURS, DUE A L'INJECTION THERMIQUEABROSIMOV VM; EGOROV BN; LIDORENKO NS et al.1977; IZVEST. AKAD. NAUK S.S.S.R., ENERGET.; S.S.S.R.; DA. 1977; NO 5; PP. 168-169; BIBL. 4 REF.Article

INFLUENCE DES CHAMPS LOCAUX DES PORTEURS DE CHARGE INJECTES SUR L'EFFET DE FAIBLE CHAMP MAGNETIQUE DANS LE TETRATHIOTETRACENEKAULACH IS.1977; LATV. P.S.R. ZINAT. AKAD. VEST., FIZ. TEH. ZINAT. SER.; S.S.S.R.; DA. 1977; NO 2; PP. 42-46; ABS. ANGL.; BIBL. 4 REF.Article

ON THE MINORITY CHARGE STORAGE FOR AN EPITAXIAL SCHOTTKY-BARRIER DIODECHUANG CT.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 6; PP. 700-705; BIBL. 15 REF.Article

TEMPERATURE DEPENDENT BARRIER INJECTION IN TRANSIT TIME DEVICES: STEADY STATEMUSTAFA M; AHMAD S.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 9; PP. 6236-6239; BIBL. 15 REF.Article

DETECTION OF INJECTED CARRIERS IN OPERATING JUNCTION DEVICESWHITE JC; SMITH JG.1979; INFRARED PHYS.; GBR; DA. 1979; VOL. 19; NO 1; PP. 35-41; BIBL. 8 REF.Article

A MODEL OF CHARGE INJECTION AT METAL-INSULATOR CONTACTS.CHEN I.1978; SOLID STATE COMMUNIC.; GBR; DA. 1978; VOL. 26; NO 6; PP. 359-363; BIBL. 9 REF.Article

THEORY OF TRAP-CONTROLLED TRANSIENT CURRENT INJECTION.RUDENKO AI.1976; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1976; VOL. 22; NO 1; PP. 215-218; BIBL. 7 REF.Article

PHENOMENES D'INJECTION ET D'EXTRACTION ANORMAUX DANS LES STRUCTURES M.I.S.PANANAKAKIS G; VIKTOROVITCH P; KAMARINOS G et al.1977; C.R. ACAD. SCI., B; FR.; DA. 1977; VOL. 284; NO 21; PP. 471-474; ABS. ANGL.; BIBL. 9 REF.Article

TRANSFERT DE COURANT NON STATIONNAIRE DANS LES SOLIDES LORS DE L'INJECTION DE PORTEURS PAR UNE IMPULSION LUMINEUSEKEL'NER SR; RUDENKO AI.1976; IZVEST. VYSSH. UCHEBN. ZAVED. RADIOFIZ.; S.S.S.R.; DA. 1976; VOL. 19; NO 10; PP. 1541-1553; ABS. ANGL.; BIBL. 5 REF.Article

MODULATION ACOUSTIQUE DE LA CONSTANTE DIELECTRIQUE D'UN CRISTAL SEMICONDUCTEUR PIEZOELECTRIQUE SOUS DES NIVEAUX ELEVES D'INJECTION MONOPOLAIRE DES PORTEURS DE COURANTEVSEEV BS; BELOV MM.1980; VESCI AKAD. NAVUK BSSR, SER. FIZ.-MAT. NAVUK; ISSN 0002-3574; BYS; DA. 1980; NO 1; PP. 120-124; ABS. ENG; BIBL. 5 REF.Article

ANALYSE NUMERIQUE DES PROCESSUS NON STATIONNAIRES DANS LES TRANSITIONS ELECTRON TROU UNIDIMENSIONNELLESPETRUSHENKO JE YI; ERKENOV N KH.1978; DOP. AKAD. NAUK UKRAIJIN. R.S.R., A; S.S.S.R.; DA. 1978; NO 4; PP. 354-358; ABS. ANGL.; BIBL. 12 REF.Article

MINORITY-CARRIER INJECTION INTO POLYSILICON EMITTERSELTOUKHY AA; ROULSTON DJ.1982; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 6; PP. 961-964; BIBL. 15 REF.Article

MINORITY-CARRIER INJECTION AND EXTRACTION IN N-TYPE GERMANIUMRIEDER G; HENISCH HK; RAHIMI S et al.1980; PHYS. REV. B; ISSN 0163-1829; USA; DA. 1980; VOL. 21; NO 2; PP. 723-729; BIBL. 12 REF.Article

INJECTION MAGNETIQUE DES PORTEURS MINORITAIRES DANS LES SEMICONDUCTEURSKUMEKOV SE.1980; FIZ. TEKH. POLUPROVODN.; SUN; DA. 1980; VOL. 14; NO 3; PP. 521-525; BIBL. 4 REF.Article

EFFECT OF SURFACE RECOMBINATION ON THE TRANSIENT DECAY OF EXCESS CARRIERS PRODUCED BY SHORT WAVELENGTH LASER PULSESTYAGI MS; NIJS JF; VAN OVERSTRAETEN RJ et al.1982; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1982; VOL. 25; NO 5; PP. 411-415; BIBL. 12 REF.Article

EVIDENCE OF MINORITY-CARRIER INJECTION IN (N-N) SNO2-GE HETEROJUNCTION DIODESLEGGE RN; WANG EY.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 11; PP. 6035-6036; BIBL. 10 REF.Article

HIGH INJECTION EFFECTS ON CONDUCTIVITY AND CARRIER LIFETIME IN P-TYPE SILICON MATERIALBIELLE DASPET D; ESPIOUSSAS F; JOHAN A et al.1980; REV. PHYS. APPL.; ISSN 0035-1687; FRA; DA. 1980; VOL. 15; NO 5; PP. 945-959; ABS. FRE; BIBL. 13 REF.Article

THE TIME DEPENDENCE OF THE FLATBAND VOLTAGE SHIFT OF MOS CAPACITORS CAUSED BY THE INJECTION OF MINORITY CARRIERS FROM SI INTO SIO2JOSEPH B.1979; PHYS. STATUS SOLIDI, A; DDR; DA. 1979; VOL. 51; NO 1; PP. K9-K11; BIBL. 10 REF.Article

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